{"id":"https://openalex.org/W4408542805","doi":"https://doi.org/10.1016/j.aei.2026.104772","title":"Task-Guided Dynamic Feature Selection and Loss Optimization for Multi-Scale Defect Detection","display_name":"Task-Guided Dynamic Feature Selection and Loss Optimization for Multi-Scale Defect Detection","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408542805","doi":"https://doi.org/10.1016/j.aei.2026.104772"},"language":"en","primary_location":{"id":"doi:10.1016/j.aei.2026.104772","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.aei.2026.104772","pdf_url":null,"source":{"id":"https://openalex.org/S112141509","display_name":"Advanced Engineering Informatics","issn_l":"1474-0346","issn":["1474-0346","1873-5320"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Engineering Informatics","raw_type":"journal-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.2139/ssrn.5184370","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090057266","display_name":"Pengfei Liu","orcid":"https://orcid.org/0000-0003-2158-5442"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Liu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109798590","display_name":"Guangming Xia","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Guangming Xia","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101907359","display_name":"Li Fang","orcid":"https://orcid.org/0000-0002-4876-6975"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fang Li","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105538788","display_name":"Yuhan Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhan Guo","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113426493","display_name":"Shuxian Shang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shuxian Shang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111359728","display_name":"Yuetong Chang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuetong Chang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015948426","display_name":"Feng Han","orcid":"https://orcid.org/0000-0003-0707-8575"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Han Feng","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113426494","display_name":"Biwei Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Biwei Wu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":null,"display_name":"Weibo Wang","orcid":"https://orcid.org/0000-0002-4420-385X"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weibo Wang","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-4420-385X","affiliations":[]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3570,"currency":"USD","value_usd":3570},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05450316,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"104772","last_page":"104772"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9000999927520752,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6776607036590576},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.6284270286560059},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.609687328338623},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6017562747001648},{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.5739939212799072},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5445544719696045},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42281997203826904},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.384243369102478},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.358987033367157},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15544745326042175},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.07891947031021118},{"id":"https://openalex.org/keywords/geography","display_name":"Geography","score":0.07456895709037781},{"id":"https://openalex.org/keywords/cartography","display_name":"Cartography","score":0.07008421421051025}],"concepts":[{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6776607036590576},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.6284270286560059},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.609687328338623},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6017562747001648},{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.5739939212799072},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5445544719696045},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42281997203826904},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.384243369102478},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.358987033367157},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15544745326042175},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.07891947031021118},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.07456895709037781},{"id":"https://openalex.org/C58640448","wikidata":"https://www.wikidata.org/wiki/Q42515","display_name":"Cartography","level":1,"score":0.07008421421051025},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.aei.2026.104772","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.aei.2026.104772","pdf_url":null,"source":{"id":"https://openalex.org/S112141509","display_name":"Advanced Engineering Informatics","issn_l":"1474-0346","issn":["1474-0346","1873-5320"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Engineering Informatics","raw_type":"journal-article"},{"id":"doi:10.2139/ssrn.5184370","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.5184370","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"}],"best_oa_location":{"id":"doi:10.2139/ssrn.5184370","is_oa":true,"landing_page_url":"https://doi.org/10.2139/ssrn.5184370","pdf_url":null,"source":{"id":"https://openalex.org/S4210172589","display_name":"SSRN Electronic Journal","issn_l":"1556-5068","issn":["1556-5068"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1318003438","host_organization_name":"RELX Group (Netherlands)","host_organization_lineage":["https://openalex.org/I1318003438"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"posted-content"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2504335775","https://openalex.org/W2934198733","https://openalex.org/W2944303778","https://openalex.org/W3012374719","https://openalex.org/W3208023024","https://openalex.org/W4310711376","https://openalex.org/W4316039570","https://openalex.org/W4384781089","https://openalex.org/W4384937257","https://openalex.org/W4388807184","https://openalex.org/W4392563567","https://openalex.org/W4393177047","https://openalex.org/W4402519455","https://openalex.org/W4408773636"],"related_works":["https://openalex.org/W4205762803","https://openalex.org/W2535856026","https://openalex.org/W2265065644","https://openalex.org/W3147584709","https://openalex.org/W2134699697","https://openalex.org/W3017188156","https://openalex.org/W2322875716","https://openalex.org/W2389015757","https://openalex.org/W4386564352","https://openalex.org/W2952668426"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-13T07:54:00.901334","created_date":"2025-10-10T00:00:00"}