{"id":"https://openalex.org/W1974774225","doi":"https://doi.org/10.1016/0921-8890(89)90008-0","title":"A flexible inspection system for gauging precision industrial parts","display_name":"A flexible inspection system for gauging precision industrial parts","publication_year":1989,"publication_date":"1989-07-01","ids":{"openalex":"https://openalex.org/W1974774225","doi":"https://doi.org/10.1016/0921-8890(89)90008-0","mag":"1974774225"},"language":"en","primary_location":{"id":"doi:10.1016/0921-8890(89)90008-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0921-8890(89)90008-0","pdf_url":null,"source":{"id":"https://openalex.org/S133768115","display_name":"Robotics and Autonomous Systems","issn_l":"0921-8890","issn":["0921-8890","1872-793X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Robotics and Autonomous Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057652406","display_name":"D.R. Sollberger","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]},{"id":"https://openalex.org/I4210116723","display_name":"Robotics Research (United States)","ror":"https://ror.org/020w2fr77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210116723"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D.R. Sollberger","raw_affiliation_strings":["Machine Intelligence and Robotics Research, Electrical Engineering Department, Duke University, Durham, NC 27706, USA"],"affiliations":[{"raw_affiliation_string":"Machine Intelligence and Robotics Research, Electrical Engineering Department, Duke University, Durham, NC 27706, USA","institution_ids":["https://openalex.org/I4210116723","https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016581319","display_name":"Marcus Thint","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]},{"id":"https://openalex.org/I4210116723","display_name":"Robotics Research (United States)","ror":"https://ror.org/020w2fr77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210116723"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.P. Thint","raw_affiliation_strings":["Machine Intelligence and Robotics Research, Electrical Engineering Department, Duke University, Durham, NC 27706, USA"],"affiliations":[{"raw_affiliation_string":"Machine Intelligence and Robotics Research, Electrical Engineering Department, Duke University, Durham, NC 27706, USA","institution_ids":["https://openalex.org/I4210116723","https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080394496","display_name":"P.P. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]},{"id":"https://openalex.org/I4210116723","display_name":"Robotics Research (United States)","ror":"https://ror.org/020w2fr77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210116723"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.P. Wang","raw_affiliation_strings":["Machine Intelligence and Robotics Research, Electrical Engineering Department, Duke University, Durham, NC 27706, USA"],"affiliations":[{"raw_affiliation_string":"Machine Intelligence and Robotics Research, Electrical Engineering Department, Duke University, Durham, NC 27706, USA","institution_ids":["https://openalex.org/I4210116723","https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5057652406"],"corresponding_institution_ids":["https://openalex.org/I170897317","https://openalex.org/I4210116723"],"apc_list":{"value":3020,"currency":"USD","value_usd":3020},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11203055,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":"2","first_page":"165","last_page":"171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8287189602851868},{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.6674838662147522},{"id":"https://openalex.org/keywords/robotics","display_name":"Robotics","score":0.6503768563270569},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5410676002502441},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.444386750459671},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4236338138580322},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4061993360519409},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40327122807502747},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3832372725009918},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3502955138683319},{"id":"https://openalex.org/keywords/robot","display_name":"Robot","score":0.33333897590637207},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3297908306121826},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09951412677764893},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08607038855552673},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.08323743939399719}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8287189602851868},{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.6674838662147522},{"id":"https://openalex.org/C34413123","wikidata":"https://www.wikidata.org/wiki/Q170978","display_name":"Robotics","level":3,"score":0.6503768563270569},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5410676002502441},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.444386750459671},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4236338138580322},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4061993360519409},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40327122807502747},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3832372725009918},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3502955138683319},{"id":"https://openalex.org/C90509273","wikidata":"https://www.wikidata.org/wiki/Q11012","display_name":"Robot","level":2,"score":0.33333897590637207},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3297908306121826},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09951412677764893},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08607038855552673},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.08323743939399719},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0921-8890(89)90008-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0921-8890(89)90008-0","pdf_url":null,"source":{"id":"https://openalex.org/S133768115","display_name":"Robotics and Autonomous Systems","issn_l":"0921-8890","issn":["0921-8890","1872-793X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Robotics and Autonomous Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332923","display_name":"U.S. Navy","ror":"https://ror.org/03ar0mv07"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W68838630","https://openalex.org/W168925470","https://openalex.org/W2022449060","https://openalex.org/W2130755868"],"related_works":["https://openalex.org/W2113302376","https://openalex.org/W2044042350","https://openalex.org/W2150537673","https://openalex.org/W1560398276","https://openalex.org/W1979253374","https://openalex.org/W1979172994","https://openalex.org/W2391991527","https://openalex.org/W4362650061","https://openalex.org/W3149631139","https://openalex.org/W2050529169"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}