{"id":"https://openalex.org/W1986480478","doi":"https://doi.org/10.1016/0303-1268(80)90174-1","title":"Reliability and self-diagnosis aspects of micro processor controlled instrumentation systems","display_name":"Reliability and self-diagnosis aspects of micro processor controlled instrumentation systems","publication_year":1980,"publication_date":"1980-09-01","ids":{"openalex":"https://openalex.org/W1986480478","doi":"https://doi.org/10.1016/0303-1268(80)90174-1","mag":"1986480478"},"language":"en","primary_location":{"id":"doi:10.1016/0303-1268(80)90174-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0303-1268(80)90174-1","pdf_url":null,"source":{"id":"https://openalex.org/S199543014","display_name":"Euromicro Newsletter","issn_l":"0303-1268","issn":["0303-1268","1878-3015"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Euromicro Newsletter","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091233851","display_name":"Mariogiovanna Sami","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Mariogiovanna Sami","raw_affiliation_strings":["Istituto di Elettronica ed Elettronica, Politecnico di Milano, Piazza L. da Vinci 32, I-20133 Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Istituto di Elettronica ed Elettronica, Politecnico di Milano, Piazza L. da Vinci 32, I-20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5091233851"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20683611,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"5","first_page":"343","last_page":"345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9516000151634216,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.8048527240753174},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7975002527236938},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7788234949111938},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.7057406902313232},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6938061118125916},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6703164577484131},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4914802312850952},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.4821907579898834},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32122936844825745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22823894023895264},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08158981800079346}],"concepts":[{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.8048527240753174},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7975002527236938},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7788234949111938},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.7057406902313232},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6938061118125916},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6703164577484131},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4914802312850952},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.4821907579898834},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32122936844825745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22823894023895264},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08158981800079346},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0303-1268(80)90174-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0303-1268(80)90174-1","pdf_url":null,"source":{"id":"https://openalex.org/S199543014","display_name":"Euromicro Newsletter","issn_l":"0303-1268","issn":["0303-1268","1878-3015"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Euromicro Newsletter","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W4232767024"],"related_works":["https://openalex.org/W2357657342","https://openalex.org/W2153432761","https://openalex.org/W1580144672","https://openalex.org/W2152623100","https://openalex.org/W1520538828","https://openalex.org/W1559638877","https://openalex.org/W1522293843","https://openalex.org/W2130594209","https://openalex.org/W1950809481","https://openalex.org/W2085988155"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}