{"id":"https://openalex.org/W2083035570","doi":"https://doi.org/10.1016/0167-9260(89)90059-x","title":"A new model for computation of probabilistic testability in combinational circuits","display_name":"A new model for computation of probabilistic testability in combinational circuits","publication_year":1989,"publication_date":"1989-04-01","ids":{"openalex":"https://openalex.org/W2083035570","doi":"https://doi.org/10.1016/0167-9260(89)90059-x","mag":"2083035570"},"language":"en","primary_location":{"id":"doi:10.1016/0167-9260(89)90059-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0167-9260(89)90059-x","pdf_url":null,"source":{"id":"https://openalex.org/S139392130","display_name":"Integration","issn_l":"0167-9260","issn":["0167-9260","1872-7522"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Integration","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113538569","display_name":"Sharad Seth","orcid":null},"institutions":[{"id":"https://openalex.org/I114395901","display_name":"University of Nebraska\u2013Lincoln","ror":"https://ror.org/043mer456","country_code":"US","type":"education","lineage":["https://openalex.org/I114395901"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sharad C. Seth","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Nebraska, Lincoln, NE 68588 U.S.A","Univ. of Nebraska, Lincoln NE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Nebraska, Lincoln, NE 68588 U.S.A","institution_ids":["https://openalex.org/I114395901"]},{"raw_affiliation_string":"Univ. of Nebraska, Lincoln NE","institution_ids":["https://openalex.org/I114395901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I72090969","display_name":"Nokia (United States)","ror":"https://ror.org/038km2573","country_code":"US","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I72090969"]},{"id":"https://openalex.org/I73544541","display_name":"Mathematical Sciences Research Institute","ror":"https://ror.org/05hs5r386","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I73544541"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["AT&T Bell Laboratories, Murray Hill, NJ 07974 U.S.A","AT&T Bell Labs.,Murray Hill, NJ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Bell Laboratories, Murray Hill, NJ 07974 U.S.A","institution_ids":["https://openalex.org/I73544541"]},{"raw_affiliation_string":"AT&T Bell Labs.,Murray Hill, NJ","institution_ids":["https://openalex.org/I72090969"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2150,"currency":"USD","value_usd":2150},"apc_paid":null,"fwci":2.4511,"has_fulltext":false,"cited_by_count":56,"citation_normalized_percentile":{"value":0.88934936,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"7","issue":"1","first_page":"49","last_page":"75"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.7439795732498169},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7414451837539673},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5548129677772522},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5208959579467773},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.47697171568870544},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.4709411859512329},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.444419264793396},{"id":"https://openalex.org/keywords/conditional-probability","display_name":"Conditional probability","score":0.42697805166244507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42360377311706543},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.30342596769332886},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.29303038120269775},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0731038749217987},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0720984935760498}],"concepts":[{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.7439795732498169},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7414451837539673},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5548129677772522},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5208959579467773},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.47697171568870544},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.4709411859512329},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.444419264793396},{"id":"https://openalex.org/C44492722","wikidata":"https://www.wikidata.org/wiki/Q327069","display_name":"Conditional probability","level":2,"score":0.42697805166244507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42360377311706543},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.30342596769332886},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.29303038120269775},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0731038749217987},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0720984935760498},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0167-9260(89)90059-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0167-9260(89)90059-x","pdf_url":null,"source":{"id":"https://openalex.org/S139392130","display_name":"Integration","issn_l":"0167-9260","issn":["0167-9260","1872-7522"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Integration","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W119226466","https://openalex.org/W1664574281","https://openalex.org/W1967664042","https://openalex.org/W1977294468","https://openalex.org/W1978303825","https://openalex.org/W2041753256","https://openalex.org/W2044186139","https://openalex.org/W2062746030","https://openalex.org/W2067409688","https://openalex.org/W2069046389","https://openalex.org/W2074985862","https://openalex.org/W2083177010","https://openalex.org/W2148195612","https://openalex.org/W2154250375","https://openalex.org/W2158102622","https://openalex.org/W2162256736","https://openalex.org/W2164745091","https://openalex.org/W2169849462","https://openalex.org/W2740369419","https://openalex.org/W2799004609","https://openalex.org/W6604900879","https://openalex.org/W6604907742","https://openalex.org/W6637261059","https://openalex.org/W6669258502","https://openalex.org/W6826323716"],"related_works":["https://openalex.org/W2169576796","https://openalex.org/W1494292626","https://openalex.org/W3217430545","https://openalex.org/W2083793411","https://openalex.org/W2427864131","https://openalex.org/W2088006178","https://openalex.org/W1532891187","https://openalex.org/W2069145203","https://openalex.org/W63550369","https://openalex.org/W2108605716"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}