{"id":"https://openalex.org/W2013235131","doi":"https://doi.org/10.1016/0167-8655(91)90044-m","title":"Improving edge measurement on noisy images by hierarchical neural networks","display_name":"Improving edge measurement on noisy images by hierarchical neural networks","publication_year":1991,"publication_date":"1991-03-01","ids":{"openalex":"https://openalex.org/W2013235131","doi":"https://doi.org/10.1016/0167-8655(91)90044-m","mag":"2013235131"},"language":"en","primary_location":{"id":"doi:10.1016/0167-8655(91)90044-m","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0167-8655(91)90044-m","pdf_url":null,"source":{"id":"https://openalex.org/S151820558","display_name":"Pattern Recognition Letters","issn_l":"0167-8655","issn":["0167-8655","1872-7344"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113361003","display_name":"Siwei Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I130438778","display_name":"Memorial University of Newfoundland","ror":"https://ror.org/04haebc03","country_code":"CA","type":"education","lineage":["https://openalex.org/I130438778"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Siwei Lu","raw_affiliation_strings":["Department of Computer Science, Memorial University of Newfoundland, St. John\u2019s, Newfoundland, Canada A1C 5S7"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Memorial University of Newfoundland, St. John\u2019s, Newfoundland, Canada A1C 5S7","institution_ids":["https://openalex.org/I130438778"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017026453","display_name":"Anthony Szeto","orcid":null},"institutions":[{"id":"https://openalex.org/I130438778","display_name":"Memorial University of Newfoundland","ror":"https://ror.org/04haebc03","country_code":"CA","type":"education","lineage":["https://openalex.org/I130438778"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Anthony Szeto","raw_affiliation_strings":["Department of Computer Science, Memorial University of Newfoundland, St. John\u2019s, Newfoundland, Canada A1C 5S7"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Memorial University of Newfoundland, St. John\u2019s, Newfoundland, Canada A1C 5S7","institution_ids":["https://openalex.org/I130438778"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5113361003"],"corresponding_institution_ids":["https://openalex.org/I130438778"],"apc_list":{"value":2500,"currency":"USD","value_usd":2500},"apc_paid":null,"fwci":1.7162,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.84409199,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"12","issue":"3","first_page":"155","last_page":"164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6744838356971741},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6065400838851929},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6006116271018982},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5983289480209351},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5599119067192078},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4652688503265381},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.4298631250858307},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.42227545380592346},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3520440459251404}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6744838356971741},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6065400838851929},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6006116271018982},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5983289480209351},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5599119067192078},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4652688503265381},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.4298631250858307},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.42227545380592346},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3520440459251404}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0167-8655(91)90044-m","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0167-8655(91)90044-m","pdf_url":null,"source":{"id":"https://openalex.org/S151820558","display_name":"Pattern Recognition Letters","issn_l":"0167-8655","issn":["0167-8655","1872-7344"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1541274513","https://openalex.org/W1736170383","https://openalex.org/W1991848143","https://openalex.org/W2010526455","https://openalex.org/W2014197416","https://openalex.org/W2045466646","https://openalex.org/W2068470708","https://openalex.org/W2102479866","https://openalex.org/W2145023731","https://openalex.org/W2468443503","https://openalex.org/W3148499377"],"related_works":["https://openalex.org/W2038862184","https://openalex.org/W2039365229","https://openalex.org/W2028049428","https://openalex.org/W2101902114","https://openalex.org/W2145843506","https://openalex.org/W2379089757","https://openalex.org/W4249592067","https://openalex.org/W2056407677","https://openalex.org/W4293054829","https://openalex.org/W1999737656"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}