{"id":"https://openalex.org/W2008897554","doi":"https://doi.org/10.1016/0167-8655(87)90047-x","title":"Identification of fringe minima in electronic speckle pattern images","display_name":"Identification of fringe minima in electronic speckle pattern images","publication_year":1987,"publication_date":"1987-06-01","ids":{"openalex":"https://openalex.org/W2008897554","doi":"https://doi.org/10.1016/0167-8655(87)90047-x","mag":"2008897554"},"language":"en","primary_location":{"id":"doi:10.1016/0167-8655(87)90047-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0167-8655(87)90047-x","pdf_url":null,"source":{"id":"https://openalex.org/S151820558","display_name":"Pattern Recognition Letters","issn_l":"0167-8655","issn":["0167-8655","1872-7344"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025852138","display_name":"K. Paler","orcid":null},"institutions":[{"id":"https://openalex.org/I1286704778","display_name":"Rutherford Appleton Laboratory","ror":"https://ror.org/03gq8fr08","country_code":"GB","type":"facility","lineage":["https://openalex.org/I1286704778","https://openalex.org/I162524378","https://openalex.org/I4210087105"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"K. Paler","raw_affiliation_strings":["Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, United Kingdom","institution_ids":["https://openalex.org/I1286704778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037478614","display_name":"K.M. Crennell","orcid":null},"institutions":[{"id":"https://openalex.org/I1286704778","display_name":"Rutherford Appleton Laboratory","ror":"https://ror.org/03gq8fr08","country_code":"GB","type":"facility","lineage":["https://openalex.org/I1286704778","https://openalex.org/I162524378","https://openalex.org/I4210087105"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"K.M. Crennell","raw_affiliation_strings":["Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, United Kingdom","institution_ids":["https://openalex.org/I1286704778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028209738","display_name":"Josef Kittler","orcid":"https://orcid.org/0000-0002-8110-9205"},"institutions":[{"id":"https://openalex.org/I1286704778","display_name":"Rutherford Appleton Laboratory","ror":"https://ror.org/03gq8fr08","country_code":"GB","type":"facility","lineage":["https://openalex.org/I1286704778","https://openalex.org/I162524378","https://openalex.org/I4210087105"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. Kittler","raw_affiliation_strings":["Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, United Kingdom","institution_ids":["https://openalex.org/I1286704778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022092543","display_name":"Brian Dobbins","orcid":"https://orcid.org/0000-0002-3156-0460"},"institutions":[{"id":"https://openalex.org/I52590639","display_name":"Nottingham Trent University","ror":"https://ror.org/04xyxjd90","country_code":"GB","type":"education","lineage":["https://openalex.org/I52590639"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"B.N. Dobbins","raw_affiliation_strings":["Trent Polytechnic, Nottingham, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Trent Polytechnic, Nottingham, United Kingdom","institution_ids":["https://openalex.org/I52590639"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113599931","display_name":"B. L. Button","orcid":null},"institutions":[{"id":"https://openalex.org/I52590639","display_name":"Nottingham Trent University","ror":"https://ror.org/04xyxjd90","country_code":"GB","type":"education","lineage":["https://openalex.org/I52590639"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"B.L. Button","raw_affiliation_strings":["Trent Polytechnic, Nottingham, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Trent Polytechnic, Nottingham, United Kingdom","institution_ids":["https://openalex.org/I52590639"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007634138","display_name":"C. Wykes","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127762","display_name":"Coventry (United Kingdom)","ror":"https://ror.org/030nd5313","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210127762"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"C. Wykes","raw_affiliation_strings":["Coventry (Lanchester) Polytechnic, Coventry, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Coventry (Lanchester) Polytechnic, Coventry, United Kingdom","institution_ids":["https://openalex.org/I4210127762"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5025852138"],"corresponding_institution_ids":["https://openalex.org/I1286704778"],"apc_list":{"value":2500,"currency":"USD","value_usd":2500},"apc_paid":null,"fwci":0.6488,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72615152,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"1","first_page":"33","last_page":"44"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.8757314682006836},{"id":"https://openalex.org/keywords/shrinkage","display_name":"Shrinkage","score":0.6191747188568115},{"id":"https://openalex.org/keywords/electronic-speckle-pattern-interferometry","display_name":"Electronic speckle pattern interferometry","score":0.610105037689209},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5988738536834717},{"id":"https://openalex.org/keywords/maxima-and-minima","display_name":"Maxima and minima","score":0.5593097805976868},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.5268707871437073},{"id":"https://openalex.org/keywords/speckle-noise","display_name":"Speckle noise","score":0.4811786115169525},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.4515966773033142},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.446110337972641},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4448598623275757},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.42726415395736694},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35681426525115967},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31997013092041016},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20214927196502686},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.0946044921875},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08640849590301514}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.8757314682006836},{"id":"https://openalex.org/C180145272","wikidata":"https://www.wikidata.org/wiki/Q7504144","display_name":"Shrinkage","level":2,"score":0.6191747188568115},{"id":"https://openalex.org/C172991262","wikidata":"https://www.wikidata.org/wiki/Q5358427","display_name":"Electronic speckle pattern interferometry","level":3,"score":0.610105037689209},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5988738536834717},{"id":"https://openalex.org/C186633575","wikidata":"https://www.wikidata.org/wiki/Q845060","display_name":"Maxima and minima","level":2,"score":0.5593097805976868},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.5268707871437073},{"id":"https://openalex.org/C180940675","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle noise","level":3,"score":0.4811786115169525},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4515966773033142},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.446110337972641},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4448598623275757},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.42726415395736694},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35681426525115967},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31997013092041016},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20214927196502686},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0946044921875},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08640849590301514},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0167-8655(87)90047-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0167-8655(87)90047-x","pdf_url":null,"source":{"id":"https://openalex.org/S151820558","display_name":"Pattern Recognition Letters","issn_l":"0167-8655","issn":["0167-8655","1872-7344"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1580992548","https://openalex.org/W1585413888","https://openalex.org/W1614331351","https://openalex.org/W1655554306","https://openalex.org/W1964964297","https://openalex.org/W1965382680","https://openalex.org/W1975460580","https://openalex.org/W1976057323","https://openalex.org/W1978509107","https://openalex.org/W1981073088","https://openalex.org/W1999406331","https://openalex.org/W2018435018","https://openalex.org/W2022218469","https://openalex.org/W2022788266","https://openalex.org/W2040274136","https://openalex.org/W2052491606","https://openalex.org/W2064054522","https://openalex.org/W2064194299","https://openalex.org/W2080271613","https://openalex.org/W2087969962","https://openalex.org/W2091256221","https://openalex.org/W2096433476","https://openalex.org/W2111342664","https://openalex.org/W2121688719","https://openalex.org/W2165489404","https://openalex.org/W2471097770","https://openalex.org/W2519548058","https://openalex.org/W2896756281","https://openalex.org/W2994098746","https://openalex.org/W3048077782","https://openalex.org/W4236077450","https://openalex.org/W4243529460","https://openalex.org/W6634876549","https://openalex.org/W6636759560","https://openalex.org/W6660500847","https://openalex.org/W6726584649","https://openalex.org/W6755405850","https://openalex.org/W6782266423"],"related_works":["https://openalex.org/W2093785611","https://openalex.org/W2127635065","https://openalex.org/W2017795126","https://openalex.org/W2149054638","https://openalex.org/W4308576158","https://openalex.org/W2055824452","https://openalex.org/W2727313114","https://openalex.org/W2065648684","https://openalex.org/W2126730537","https://openalex.org/W2348475638"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}