{"id":"https://openalex.org/W1963651322","doi":"https://doi.org/10.1016/0165-6074(91)90350-3","title":"The clock, test and maintenance control chip of the IBM ES/9221","display_name":"The clock, test and maintenance control chip of the IBM ES/9221","publication_year":1991,"publication_date":"1991-08-01","ids":{"openalex":"https://openalex.org/W1963651322","doi":"https://doi.org/10.1016/0165-6074(91)90350-3","mag":"1963651322"},"language":"en","primary_location":{"id":"doi:10.1016/0165-6074(91)90350-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(91)90350-3","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessing and Microprogramming","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015662717","display_name":"Dietmar Schmunkamp","orcid":null},"institutions":[{"id":"https://openalex.org/I4210095996","display_name":"IBM (Germany)","ror":"https://ror.org/00pm7rm97","country_code":"DE","type":"company","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210095996"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Dietmar Schmunkamp","raw_affiliation_strings":["Cordt. W. Starke IBM Lab B\u00f6blingen Sch\u00f6naicherstr. 220 D-7030 B\u00f6blingen, Germany"],"affiliations":[{"raw_affiliation_string":"Cordt. W. Starke IBM Lab B\u00f6blingen Sch\u00f6naicherstr. 220 D-7030 B\u00f6blingen, Germany","institution_ids":["https://openalex.org/I4210095996"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5015662717"],"corresponding_institution_ids":["https://openalex.org/I4210095996"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09722222,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"32","issue":"1-5","first_page":"221","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.7719599008560181},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7642487287521362},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.7514996528625488},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6835110783576965},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6687366366386414},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.559666097164154},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.5058307647705078},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.4772748351097107},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.4306217432022095},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.24625623226165771},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.22927913069725037},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08051353693008423}],"concepts":[{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.7719599008560181},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7642487287521362},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.7514996528625488},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6835110783576965},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6687366366386414},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.559666097164154},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.5058307647705078},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.4772748351097107},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.4306217432022095},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.24625623226165771},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.22927913069725037},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08051353693008423},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0165-6074(91)90350-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(91)90350-3","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessing and Microprogramming","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2047255051","https://openalex.org/W2911293636"],"related_works":["https://openalex.org/W2379280877","https://openalex.org/W3126131865","https://openalex.org/W2001654810","https://openalex.org/W2538042735","https://openalex.org/W1484535011","https://openalex.org/W2044344400","https://openalex.org/W4253186488","https://openalex.org/W1996938127","https://openalex.org/W2018755015","https://openalex.org/W4242291917"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}