{"id":"https://openalex.org/W2045620496","doi":"https://doi.org/10.1016/0165-6074(88)90148-2","title":"Transient fault recovery assessment in 8 and 16 bit microprocessor based controllers in embedded systems","display_name":"Transient fault recovery assessment in 8 and 16 bit microprocessor based controllers in embedded systems","publication_year":1988,"publication_date":"1988-08-01","ids":{"openalex":"https://openalex.org/W2045620496","doi":"https://doi.org/10.1016/0165-6074(88)90148-2","mag":"2045620496"},"language":"en","primary_location":{"id":"doi:10.1016/0165-6074(88)90148-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(88)90148-2","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessing and Microprogramming","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000788990","display_name":"Guy Wingate","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"G.A.S Wingate","raw_affiliation_strings":["United Kingdom School of Engineering and Applied Science University of Durham, UK"],"affiliations":[{"raw_affiliation_string":"United Kingdom School of Engineering and Applied Science University of Durham, UK","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076236431","display_name":"C. Preece","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C Preece","raw_affiliation_strings":["United Kingdom School of Engineering and Applied Science University of Durham, UK"],"affiliations":[{"raw_affiliation_string":"United Kingdom School of Engineering and Applied Science University of Durham, UK","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5000788990"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5769,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.82559995,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"24","issue":"1-5","first_page":"775","last_page":"782"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8330466151237488},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7467622756958008},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6680864095687866},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6490991115570068},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.5410571694374084},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5323361158370972},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5304681062698364},{"id":"https://openalex.org/keywords/32-bit","display_name":"32-bit","score":0.5245499610900879},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5111818909645081},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4958418309688568},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.473747581243515},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.45001286268234253},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.44529515504837036},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.440425306558609},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.14394468069076538},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.11024147272109985},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.09464392066001892},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08021941781044006},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07451501488685608},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06123742461204529}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8330466151237488},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7467622756958008},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6680864095687866},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6490991115570068},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.5410571694374084},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5323361158370972},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5304681062698364},{"id":"https://openalex.org/C75695347","wikidata":"https://www.wikidata.org/wiki/Q225147","display_name":"32-bit","level":2,"score":0.5245499610900879},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5111818909645081},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4958418309688568},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.473747581243515},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.45001286268234253},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.44529515504837036},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.440425306558609},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.14394468069076538},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.11024147272109985},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.09464392066001892},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08021941781044006},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07451501488685608},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06123742461204529},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0165-6074(88)90148-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(88)90148-2","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessing and Microprogramming","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W56518143","https://openalex.org/W2046229116","https://openalex.org/W4231404084","https://openalex.org/W6602315385"],"related_works":["https://openalex.org/W2607474334","https://openalex.org/W2130922779","https://openalex.org/W2138861322","https://openalex.org/W2902466307","https://openalex.org/W2082366402","https://openalex.org/W2083209667","https://openalex.org/W2120242933","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W764083103"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}