{"id":"https://openalex.org/W2062345117","doi":"https://doi.org/10.1016/0165-6074(86)90067-0","title":"Test generation for circuits described in procedural hardware description languages (HDLs)","display_name":"Test generation for circuits described in procedural hardware description languages (HDLs)","publication_year":1986,"publication_date":"1986-12-01","ids":{"openalex":"https://openalex.org/W2062345117","doi":"https://doi.org/10.1016/0165-6074(86)90067-0","mag":"2062345117"},"language":"en","primary_location":{"id":"doi:10.1016/0165-6074(86)90067-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(86)90067-0","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessing and Microprogramming","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007077278","display_name":"Krzysztof Sapiecha","orcid":null},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]},{"id":"https://openalex.org/I4210087266","display_name":"Institute of Computer Science","ror":"https://ror.org/003fvp964","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210087266","https://openalex.org/I99542240"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"K. Sapiecha","raw_affiliation_strings":["Institute of Computer Science, Warsaw University of Technology, 00-665 WARSAW, POLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, Warsaw University of Technology, 00-665 WARSAW, POLAND","institution_ids":["https://openalex.org/I108403487","https://openalex.org/I4210087266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077710029","display_name":"T. Czichon","orcid":null},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]},{"id":"https://openalex.org/I4210087266","display_name":"Institute of Computer Science","ror":"https://ror.org/003fvp964","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210087266","https://openalex.org/I99542240"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"T. Czichon","raw_affiliation_strings":["Institute of Computer Science, Warsaw University of Technology, 00-665 WARSAW, POLAND"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, Warsaw University of Technology, 00-665 WARSAW, POLAND","institution_ids":["https://openalex.org/I108403487","https://openalex.org/I4210087266"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.21686747,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"18","issue":"1-5","first_page":"371","last_page":"379"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8819366097450256},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.5664059519767761},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.5424876809120178},{"id":"https://openalex.org/keywords/prolog","display_name":"Prolog","score":0.4985935688018799},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4855937361717224},{"id":"https://openalex.org/keywords/symbolic-execution","display_name":"Symbolic execution","score":0.42538005113601685},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4194723963737488},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4151616394519806},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.411532998085022},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4098074734210968},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3710498511791229},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3342990577220917},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.29064592719078064},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.21919333934783936}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8819366097450256},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.5664059519767761},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.5424876809120178},{"id":"https://openalex.org/C81721847","wikidata":"https://www.wikidata.org/wiki/Q163468","display_name":"Prolog","level":2,"score":0.4985935688018799},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4855937361717224},{"id":"https://openalex.org/C2779639559","wikidata":"https://www.wikidata.org/wiki/Q7661178","display_name":"Symbolic execution","level":3,"score":0.42538005113601685},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4194723963737488},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4151616394519806},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.411532998085022},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4098074734210968},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3710498511791229},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3342990577220917},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.29064592719078064},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.21919333934783936},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0165-6074(86)90067-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0165-6074(86)90067-0","pdf_url":null,"source":{"id":"https://openalex.org/S92214702","display_name":"Microprocessing and Microprogramming","issn_l":"0165-6074","issn":["0165-6074","1878-7061"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessing and Microprogramming","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W34304939","https://openalex.org/W131596992","https://openalex.org/W1524131449","https://openalex.org/W1677852443","https://openalex.org/W2023734963","https://openalex.org/W2045122863","https://openalex.org/W2768936553","https://openalex.org/W6631181266"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W1991935474"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}