{"id":"https://openalex.org/W289624287","doi":"https://doi.org/10.1016/0141-9331(92)90016-m","title":"Testing semiconductor memories, theory and practice","display_name":"Testing semiconductor memories, theory and practice","publication_year":1992,"publication_date":"1992-01-01","ids":{"openalex":"https://openalex.org/W289624287","doi":"https://doi.org/10.1016/0141-9331(92)90016-m","mag":"289624287"},"language":"en","primary_location":{"id":"doi:10.1016/0141-9331(92)90016-m","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0141-9331(92)90016-m","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessors and Microsystems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112077785","display_name":"John Niven","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"John Niven","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5112077785"],"corresponding_institution_ids":[],"apc_list":{"value":2290,"currency":"USD","value_usd":2290},"apc_paid":null,"fwci":5.0293,"has_fulltext":false,"cited_by_count":514,"citation_normalized_percentile":{"value":0.94852047,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"16","issue":"7","first_page":"388","last_page":"389"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8267269730567932},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.5984829664230347},{"id":"https://openalex.org/keywords/neighbourhood","display_name":"Neighbourhood (mathematics)","score":0.5835387706756592},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.5547634959220886},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.41293978691101074},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.39877933263778687},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.21588784456253052},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10732865333557129},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08349534869194031}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8267269730567932},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5984829664230347},{"id":"https://openalex.org/C161677786","wikidata":"https://www.wikidata.org/wiki/Q2478475","display_name":"Neighbourhood (mathematics)","level":2,"score":0.5835387706756592},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.5547634959220886},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.41293978691101074},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.39877933263778687},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.21588784456253052},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10732865333557129},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08349534869194031},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0141-9331(92)90016-m","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0141-9331(92)90016-m","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessors and Microsystems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2075768550","https://openalex.org/W3022218857","https://openalex.org/W4248744973","https://openalex.org/W4383700488","https://openalex.org/W3037015124","https://openalex.org/W3021699323","https://openalex.org/W4287780535","https://openalex.org/W2369178846","https://openalex.org/W1969064169","https://openalex.org/W2370289839"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":16},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":10},{"year":2013,"cited_by_count":14},{"year":2012,"cited_by_count":16}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}