{"id":"https://openalex.org/W2011240232","doi":"https://doi.org/10.1016/0141-9331(86)90049-9","title":"Design for testability \u2014 a review of advanced methods","display_name":"Design for testability \u2014 a review of advanced methods","publication_year":1986,"publication_date":"1986-12-01","ids":{"openalex":"https://openalex.org/W2011240232","doi":"https://doi.org/10.1016/0141-9331(86)90049-9","mag":"2011240232"},"language":"en","primary_location":{"id":"doi:10.1016/0141-9331(86)90049-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0141-9331(86)90049-9","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessors and Microsystems","raw_type":"journal-article"},"type":"review","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083385963","display_name":"G. Russell","orcid":"https://orcid.org/0000-0002-7989-8989"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"G Russell","raw_affiliation_strings":["Department of Electr\u00edcal and Electronic Engineering, The Merz Laboratories, University of Newcastle upon Tyne NE1 7RU, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electr\u00edcal and Electronic Engineering, The Merz Laboratories, University of Newcastle upon Tyne NE1 7RU, UK","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110015701","display_name":"I.L. Sayers","orcid":null},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"IL Sayers","raw_affiliation_strings":["Department of Electr\u00edcal and Electronic Engineering, The Merz Laboratories, University of Newcastle upon Tyne NE1 7RU, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electr\u00edcal and Electronic Engineering, The Merz Laboratories, University of Newcastle upon Tyne NE1 7RU, UK","institution_ids":["https://openalex.org/I84884186"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5083385963"],"corresponding_institution_ids":["https://openalex.org/I84884186"],"apc_list":{"value":2200,"currency":"USD","value_usd":2200},"apc_paid":null,"fwci":2.3564,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.88491855,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"10","issue":"10","first_page":"531","last_page":"539"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8671362996101379},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6930385828018188},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6318281888961792},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5445166230201721},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5135179162025452},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4876343309879303},{"id":"https://openalex.org/keywords/compiler","display_name":"Compiler","score":0.43325936794281006},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3449167013168335}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8671362996101379},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6930385828018188},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6318281888961792},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5445166230201721},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5135179162025452},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4876343309879303},{"id":"https://openalex.org/C169590947","wikidata":"https://www.wikidata.org/wiki/Q47506","display_name":"Compiler","level":2,"score":0.43325936794281006},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3449167013168335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0141-9331(86)90049-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0141-9331(86)90049-9","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessors and Microsystems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W327215","https://openalex.org/W198417586","https://openalex.org/W1967664042","https://openalex.org/W1970112123","https://openalex.org/W2003663574","https://openalex.org/W2004437077","https://openalex.org/W2024736083","https://openalex.org/W2032174753","https://openalex.org/W2045122863","https://openalex.org/W2055575506","https://openalex.org/W2078888330","https://openalex.org/W2111334369","https://openalex.org/W2111994103","https://openalex.org/W2131903474","https://openalex.org/W2141373479","https://openalex.org/W2157999631","https://openalex.org/W2172184773","https://openalex.org/W4236980170","https://openalex.org/W6607914997","https://openalex.org/W6651185047","https://openalex.org/W6651354974","https://openalex.org/W6658639573","https://openalex.org/W6664318521","https://openalex.org/W6679672896","https://openalex.org/W6832614888"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W4249526199","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2142405811","https://openalex.org/W2373135325"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}