{"id":"https://openalex.org/W2079782559","doi":"https://doi.org/10.1016/0031-3203(72)90035-0","title":"Direct three-dimensional analysis of electron micrograph pictures","display_name":"Direct three-dimensional analysis of electron micrograph pictures","publication_year":1972,"publication_date":"1972-12-01","ids":{"openalex":"https://openalex.org/W2079782559","doi":"https://doi.org/10.1016/0031-3203(72)90035-0","mag":"2079782559"},"language":"en","primary_location":{"id":"doi:10.1016/0031-3203(72)90035-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0031-3203(72)90035-0","pdf_url":null,"source":{"id":"https://openalex.org/S414566","display_name":"Pattern Recognition","issn_l":"0031-3203","issn":["0031-3203","1873-5142"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026172944","display_name":"Sheldon S. Sandler","orcid":null},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sheldon S. Sandler","raw_affiliation_strings":["Northeastern University, Boston, Massachusetts, U.S.A","Northeastern University; Boston Massachusetts U.S.A"],"affiliations":[{"raw_affiliation_string":"Northeastern University, Boston, Massachusetts, U.S.A","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"Northeastern University; Boston Massachusetts U.S.A","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5026172944"],"corresponding_institution_ids":["https://openalex.org/I12912129"],"apc_list":{"value":2710,"currency":"USD","value_usd":2710},"apc_paid":null,"fwci":5.6354,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.95073892,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":"4","first_page":"353","last_page":"359"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-micrographs","display_name":"Electron micrographs","score":0.7957289814949036},{"id":"https://openalex.org/keywords/micrograph","display_name":"Micrograph","score":0.6611289381980896},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.651934802532196},{"id":"https://openalex.org/keywords/rotation","display_name":"Rotation (mathematics)","score":0.6116749048233032},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.5117180347442627},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4954735040664673},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.4936000108718872},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.48795050382614136},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4470151662826538},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.43533623218536377},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4290877878665924},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4268653690814972},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3405289053916931},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3380318880081177},{"id":"https://openalex.org/keywords/electron-microscope","display_name":"Electron microscope","score":0.22686126828193665},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2146020531654358},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.07367384433746338}],"concepts":[{"id":"https://openalex.org/C3018767501","wikidata":"https://www.wikidata.org/wiki/Q130416","display_name":"Electron micrographs","level":3,"score":0.7957289814949036},{"id":"https://openalex.org/C185891055","wikidata":"https://www.wikidata.org/wiki/Q130416","display_name":"Micrograph","level":3,"score":0.6611289381980896},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.651934802532196},{"id":"https://openalex.org/C74050887","wikidata":"https://www.wikidata.org/wiki/Q848368","display_name":"Rotation (mathematics)","level":2,"score":0.6116749048233032},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.5117180347442627},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4954735040664673},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.4936000108718872},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.48795050382614136},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4470151662826538},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.43533623218536377},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4290877878665924},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4268653690814972},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3405289053916931},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3380318880081177},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.22686126828193665},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2146020531654358},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.07367384433746338},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0031-3203(72)90035-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0031-3203(72)90035-0","pdf_url":null,"source":{"id":"https://openalex.org/S414566","display_name":"Pattern Recognition","issn_l":"0031-3203","issn":["0031-3203","1873-5142"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.4000000059604645}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1990919278","https://openalex.org/W2001024934","https://openalex.org/W2029250434","https://openalex.org/W2053038074","https://openalex.org/W2989987021","https://openalex.org/W6657660702","https://openalex.org/W6770452671"],"related_works":["https://openalex.org/W2212465206","https://openalex.org/W2074035620","https://openalex.org/W1986874731","https://openalex.org/W2790690463","https://openalex.org/W2100513382","https://openalex.org/W5590711","https://openalex.org/W2236279750","https://openalex.org/W2005014775","https://openalex.org/W2056753814","https://openalex.org/W2069537043"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}