{"id":"https://openalex.org/W2082125094","doi":"https://doi.org/10.1016/0031-3203(69)90006-5","title":"Line extraction and pattern detection in a photograph","display_name":"Line extraction and pattern detection in a photograph","publication_year":1969,"publication_date":"1969-03-01","ids":{"openalex":"https://openalex.org/W2082125094","doi":"https://doi.org/10.1016/0031-3203(69)90006-5","mag":"2082125094"},"language":"en","primary_location":{"id":"doi:10.1016/0031-3203(69)90006-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0031-3203(69)90006-5","pdf_url":null,"source":{"id":"https://openalex.org/S414566","display_name":"Pattern Recognition","issn_l":"0031-3203","issn":["0031-3203","1873-5142"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013263645","display_name":"Toshiyuki Sakai","orcid":"https://orcid.org/0000-0002-7865-2258"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Sakai","raw_affiliation_strings":["Kyoto University, Department of Electrical Engineering, Kyoto, Japan","[Kyoto University Department of Electrical Engineering, Kyoto, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University, Department of Electrical Engineering, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"[Kyoto University Department of Electrical Engineering, Kyoto, Japan]","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007444192","display_name":"Makoto Nagao","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Nagao","raw_affiliation_strings":["Kyoto University, Department of Electrical Engineering, Kyoto, Japan","[Kyoto University Department of Electrical Engineering, Kyoto, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University, Department of Electrical Engineering, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"[Kyoto University Department of Electrical Engineering, Kyoto, Japan]","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015645132","display_name":"Shunsuke Fujibayashi","orcid":"https://orcid.org/0000-0003-0662-4298"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Fujibayashi","raw_affiliation_strings":["Kyoto University, Department of Electrical Engineering, Kyoto, Japan","[Kyoto University Department of Electrical Engineering, Kyoto, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyoto University, Department of Electrical Engineering, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"[Kyoto University Department of Electrical Engineering, Kyoto, Japan]","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2710,"currency":"USD","value_usd":2710},"apc_paid":null,"fwci":10.5889,"has_fulltext":false,"cited_by_count":95,"citation_normalized_percentile":{"value":0.97634409,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"1","issue":"3","first_page":"233","last_page":"248"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9632999897003174,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9632999897003174,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9498999714851379,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7416272163391113},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6583170890808105},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6095166802406311},{"id":"https://openalex.org/keywords/face","display_name":"Face (sociological concept)","score":0.593885064125061},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5793318152427673},{"id":"https://openalex.org/keywords/face-detection","display_name":"Face detection","score":0.5343683362007141},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.45258885622024536},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4453064501285553},{"id":"https://openalex.org/keywords/facial-recognition-system","display_name":"Facial recognition system","score":0.3960084021091461},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.38116782903671265},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.14017686247825623}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7416272163391113},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6583170890808105},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6095166802406311},{"id":"https://openalex.org/C2779304628","wikidata":"https://www.wikidata.org/wiki/Q3503480","display_name":"Face (sociological concept)","level":2,"score":0.593885064125061},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5793318152427673},{"id":"https://openalex.org/C4641261","wikidata":"https://www.wikidata.org/wiki/Q11681085","display_name":"Face detection","level":4,"score":0.5343683362007141},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.45258885622024536},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4453064501285553},{"id":"https://openalex.org/C31510193","wikidata":"https://www.wikidata.org/wiki/Q1192553","display_name":"Facial recognition system","level":3,"score":0.3960084021091461},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.38116782903671265},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.14017686247825623},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0031-3203(69)90006-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0031-3203(69)90006-5","pdf_url":null,"source":{"id":"https://openalex.org/S414566","display_name":"Pattern Recognition","issn_l":"0031-3203","issn":["0031-3203","1873-5142"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.7200000286102295,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2053859272","https://openalex.org/W2317581969","https://openalex.org/W6663741861"],"related_works":["https://openalex.org/W1967587236","https://openalex.org/W2098693229","https://openalex.org/W2356676145","https://openalex.org/W2384651879","https://openalex.org/W2336272890","https://openalex.org/W4308999381","https://openalex.org/W3183843611","https://openalex.org/W4312238398","https://openalex.org/W2151699605","https://openalex.org/W3211418293"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}