{"id":"https://openalex.org/W2472906559","doi":"https://doi.org/10.1007/s10836-016-5606-0","title":"Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks","display_name":"Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks","publication_year":2016,"publication_date":"2016-07-09","ids":{"openalex":"https://openalex.org/W2472906559","doi":"https://doi.org/10.1007/s10836-016-5606-0","mag":"2472906559"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-016-5606-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5606-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103000372","display_name":"Qian Lin","orcid":"https://orcid.org/0000-0002-7466-7313"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]},{"id":"https://openalex.org/I290007724","display_name":"Qinghai University for Nationalities","ror":"https://ror.org/01e7csr82","country_code":"CN","type":"education","lineage":["https://openalex.org/I290007724"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qian Lin","raw_affiliation_strings":["College of Physics and Electronic Information Engineer, Qinghai University for Nationalities, Qinghai, 810007, China","School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China"],"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Information Engineer, Qinghai University for Nationalities, Qinghai, 810007, China","institution_ids":["https://openalex.org/I290007724"]},{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087906386","display_name":"Haipeng Fu","orcid":"https://orcid.org/0000-0002-9809-1830"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haipeng Fu","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101626793","display_name":"Feifei He","orcid":"https://orcid.org/0009-0000-9127-6472"},"institutions":[{"id":"https://openalex.org/I4210136567","display_name":"GlobalFoundries (Singapore)","ror":"https://ror.org/03whnfd14","country_code":"SG","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210136567"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Feifei He","raw_affiliation_strings":["Global Foundries, Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Global Foundries, Singapore, Singapore","institution_ids":["https://openalex.org/I4210136567"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049480621","display_name":"Qian\u2010Fu Cheng","orcid":"https://orcid.org/0000-0001-5080-5753"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qianfu Cheng","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103000372"],"corresponding_institution_ids":["https://openalex.org/I162868743","https://openalex.org/I290007724"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7498,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.71325782,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"32","issue":"4","first_page":"481","last_page":"489"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9624999761581421,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7839881181716919},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7459471225738525},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6891971230506897},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5844770669937134},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5494028925895691},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5426190495491028},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.49892187118530273},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4636384844779968},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4544116258621216},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43103307485580444},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2577897310256958},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.21789690852165222},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.15918242931365967}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7839881181716919},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7459471225738525},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6891971230506897},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5844770669937134},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5494028925895691},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5426190495491028},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.49892187118530273},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4636384844779968},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4544116258621216},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43103307485580444},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2577897310256958},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.21789690852165222},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.15918242931365967},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-016-5606-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5606-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1604185664","https://openalex.org/W1974054490","https://openalex.org/W1979927257","https://openalex.org/W1982780928","https://openalex.org/W1988631834","https://openalex.org/W1990653037","https://openalex.org/W1997805845","https://openalex.org/W2014920543","https://openalex.org/W2025051431","https://openalex.org/W2040489385","https://openalex.org/W2056097905","https://openalex.org/W2062280923","https://openalex.org/W2100796383","https://openalex.org/W2101377736","https://openalex.org/W2104839093","https://openalex.org/W2136743980","https://openalex.org/W2139802970","https://openalex.org/W2148142672","https://openalex.org/W2155711667","https://openalex.org/W2155880552","https://openalex.org/W2164125942","https://openalex.org/W2532559269","https://openalex.org/W4211184061","https://openalex.org/W4241663206"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W1607054433","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}