{"id":"https://openalex.org/W4412381930","doi":"https://doi.org/10.1007/s00034-025-03232-4","title":"A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning","display_name":"A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning","publication_year":2025,"publication_date":"2025-07-14","ids":{"openalex":"https://openalex.org/W4412381930","doi":"https://doi.org/10.1007/s00034-025-03232-4"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-025-03232-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-025-03232-4","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043329526","display_name":"Kunping Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kunping Wu","raw_affiliation_strings":["School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100451313","display_name":"Bing Long","orcid":"https://orcid.org/0000-0003-1876-9013"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Long","raw_affiliation_strings":["School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113197115","display_name":"Zhiyuan Bu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Bu","raw_affiliation_strings":["School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100613279","display_name":"Jingyuan Wang","orcid":"https://orcid.org/0000-0002-4267-4922"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyuan Wang","raw_affiliation_strings":["School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100412093","display_name":"Zhen Liu","orcid":"https://orcid.org/0000-0003-3406-0039"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Liu","raw_affiliation_strings":["School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"School of Automation and Engineering, University of Electronic Science and Technology of China, No.2006, Xiyuan Ave, West Hi-Tech Zone, Chengdu, 611731, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5043329526"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":1.3121,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.81990275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"44","issue":"12","first_page":"8877","last_page":"8900"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9613000154495239,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/genetic-programming","display_name":"Genetic programming","score":0.7464116811752319},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5538601875305176},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5097576975822449},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5039803385734558},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4956568479537964},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3994904160499573},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35232168436050415},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3447684645652771},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3410017490386963},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3218085467815399},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.1943213939666748}],"concepts":[{"id":"https://openalex.org/C110332635","wikidata":"https://www.wikidata.org/wiki/Q629498","display_name":"Genetic programming","level":2,"score":0.7464116811752319},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5538601875305176},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5097576975822449},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5039803385734558},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4956568479537964},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3994904160499573},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35232168436050415},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3447684645652771},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3410017490386963},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3218085467815399},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.1943213939666748},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-025-03232-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-025-03232-4","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7166533679","display_name":null,"funder_award_id":"2020JDTD0008","funder_id":"https://openalex.org/F4320313622","funder_display_name":"Sichuan Youth Science and Technology Foundation"}],"funders":[{"id":"https://openalex.org/F4320313622","display_name":"Sichuan Youth Science and Technology Foundation","ror":"https://ror.org/00xs3qr03"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1968047608","https://openalex.org/W1987552279","https://openalex.org/W1993058006","https://openalex.org/W2036572072","https://openalex.org/W2064675550","https://openalex.org/W2121157687","https://openalex.org/W2122111042","https://openalex.org/W2131388069","https://openalex.org/W2135733427","https://openalex.org/W2141278204","https://openalex.org/W2564938190","https://openalex.org/W2568645856","https://openalex.org/W2944258394","https://openalex.org/W2982344404","https://openalex.org/W3013522702","https://openalex.org/W3034167140","https://openalex.org/W3097553233","https://openalex.org/W3167928047","https://openalex.org/W4210592214","https://openalex.org/W4239510810","https://openalex.org/W4283331523","https://openalex.org/W4323929052","https://openalex.org/W4328098874","https://openalex.org/W4376874767","https://openalex.org/W4382361901","https://openalex.org/W4386575449","https://openalex.org/W4386881141","https://openalex.org/W4387496142","https://openalex.org/W4387500301","https://openalex.org/W4387555760","https://openalex.org/W4387682000","https://openalex.org/W4388235155","https://openalex.org/W4388281404","https://openalex.org/W4391582475","https://openalex.org/W4391641391","https://openalex.org/W4396620772","https://openalex.org/W4400083322","https://openalex.org/W4400427598","https://openalex.org/W4401218121","https://openalex.org/W4402446555","https://openalex.org/W4402762899","https://openalex.org/W6940688465"],"related_works":["https://openalex.org/W2968285896","https://openalex.org/W206299888","https://openalex.org/W2102997898","https://openalex.org/W2549153708","https://openalex.org/W2140816515","https://openalex.org/W2381504162","https://openalex.org/W4285805598","https://openalex.org/W4318240128","https://openalex.org/W1964607451","https://openalex.org/W2381116869"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2025-12-01T21:03:38.442747","created_date":"2025-10-10T00:00:00"}