{"id":"https://openalex.org/W4211038322","doi":"https://doi.org/10.1007/978-981-16-8129-5_141","title":"YOLO Based Deep Learning Network for Metal Surface Inspection System","display_name":"YOLO Based Deep Learning Network for Metal Surface Inspection System","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4211038322","doi":"https://doi.org/10.1007/978-981-16-8129-5_141"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-16-8129-5_141","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-16-8129-5_141","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059845562","display_name":"Shwe Lamin Aein","orcid":null},"institutions":[{"id":"https://openalex.org/I3131622653","display_name":"Yangon Technological University","ror":"https://ror.org/008pxsf13","country_code":"MM","type":"education","lineage":["https://openalex.org/I3131622653"]}],"countries":["MM"],"is_corresponding":true,"raw_author_name":"Shwe Lamin Aein","raw_affiliation_strings":["Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar","institution_ids":["https://openalex.org/I3131622653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012675535","display_name":"Theint Theint Thu","orcid":"https://orcid.org/0009-0006-7339-0769"},"institutions":[{"id":"https://openalex.org/I3131622653","display_name":"Yangon Technological University","ror":"https://ror.org/008pxsf13","country_code":"MM","type":"education","lineage":["https://openalex.org/I3131622653"]}],"countries":["MM"],"is_corresponding":false,"raw_author_name":"Theint Theint Thu","raw_affiliation_strings":["Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar","institution_ids":["https://openalex.org/I3131622653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019938574","display_name":"Phyu Phyu Htun","orcid":"https://orcid.org/0000-0002-6594-7049"},"institutions":[{"id":"https://openalex.org/I3131622653","display_name":"Yangon Technological University","ror":"https://ror.org/008pxsf13","country_code":"MM","type":"education","lineage":["https://openalex.org/I3131622653"]}],"countries":["MM"],"is_corresponding":false,"raw_author_name":"Phyu Phyu Htun","raw_affiliation_strings":["Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar","institution_ids":["https://openalex.org/I3131622653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033812573","display_name":"Aung Paing","orcid":null},"institutions":[{"id":"https://openalex.org/I3131622653","display_name":"Yangon Technological University","ror":"https://ror.org/008pxsf13","country_code":"MM","type":"education","lineage":["https://openalex.org/I3131622653"]}],"countries":["MM"],"is_corresponding":false,"raw_author_name":"Aung Paing","raw_affiliation_strings":["Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar","institution_ids":["https://openalex.org/I3131622653"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058860431","display_name":"Hay Thar Myo Htet","orcid":null},"institutions":[{"id":"https://openalex.org/I3131622653","display_name":"Yangon Technological University","ror":"https://ror.org/008pxsf13","country_code":"MM","type":"education","lineage":["https://openalex.org/I3131622653"]}],"countries":["MM"],"is_corresponding":false,"raw_author_name":"Hay Thar Myo Htet","raw_affiliation_strings":["Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronic Engineering, Yangon Technological University, Yangon, Myanmar","institution_ids":["https://openalex.org/I3131622653"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5059845562"],"corresponding_institution_ids":["https://openalex.org/I3131622653"],"apc_list":null,"apc_paid":null,"fwci":3.0941,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.90696819,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"923","last_page":"929"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6648359298706055},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.659114420413971},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.6557759642601013},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46192046999931335},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4488610327243805},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4477001130580902},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.42541268467903137},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.4201325476169586},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.41314461827278137},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.060660094022750854}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6648359298706055},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.659114420413971},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.6557759642601013},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46192046999931335},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4488610327243805},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4477001130580902},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.42541268467903137},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.4201325476169586},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.41314461827278137},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.060660094022750854},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-16-8129-5_141","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-16-8129-5_141","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5799999833106995,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1914562277","https://openalex.org/W2196029350","https://openalex.org/W2908352501","https://openalex.org/W4256535623"],"related_works":["https://openalex.org/W3216143833","https://openalex.org/W3129181224","https://openalex.org/W1671651577","https://openalex.org/W2086719721","https://openalex.org/W1963914848","https://openalex.org/W2031620013","https://openalex.org/W2383067757","https://openalex.org/W2507763083","https://openalex.org/W2087929024","https://openalex.org/W2225239493"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}