{"id":"https://openalex.org/W96008778","doi":"https://doi.org/10.1007/978-3-642-27207-3_35","title":"A Note on Two-Stage Software Testing by Two Teams","display_name":"A Note on Two-Stage Software Testing by Two Teams","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W96008778","doi":"https://doi.org/10.1007/978-3-642-27207-3_35","mag":"96008778"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-27207-3_35","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-27207-3_35","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088171509","display_name":"Mitsuhiro Kimura","orcid":"https://orcid.org/0000-0002-0721-8382"},"institutions":[{"id":"https://openalex.org/I204291657","display_name":"Hosei University","ror":"https://ror.org/00bx6dj65","country_code":"JP","type":"education","lineage":["https://openalex.org/I204291657"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Mitsuhiro Kimura","raw_affiliation_strings":["Department of Industrial & Systems Engineering, Faculty of Science & Engineering, Hosei University, 3-7-2, Kajino-cho, Koganei-shi, Tokyo, 184-8584, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Industrial & Systems Engineering, Faculty of Science & Engineering, Hosei University, 3-7-2, Kajino-cho, Koganei-shi, Tokyo, 184-8584, Japan","institution_ids":["https://openalex.org/I204291657"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031377241","display_name":"Takaji Fujiwara","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takaji Fujiwara","raw_affiliation_strings":["SRATECH Laboratory Inc., 1949-24, Yamakuni, Katoh-shi, Hyogo, 673-1421, Japan"],"affiliations":[{"raw_affiliation_string":"SRATECH Laboratory Inc., 1949-24, Yamakuni, Katoh-shi, Hyogo, 673-1421, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5088171509"],"corresponding_institution_ids":["https://openalex.org/I204291657"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05507474,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"330","last_page":"337"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.7163711190223694},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.6389961242675781},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6350706219673157},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5648677349090576},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5300549864768982},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5265740752220154},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.504764199256897},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.48138073086738586},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42837515473365784},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.42825770378112793},{"id":"https://openalex.org/keywords/risk-based-testing","display_name":"Risk-based testing","score":0.42122119665145874},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.4206521213054657},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.38468366861343384},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1867649257183075},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1565963625907898}],"concepts":[{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.7163711190223694},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.6389961242675781},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6350706219673157},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5648677349090576},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5300549864768982},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5265740752220154},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.504764199256897},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.48138073086738586},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42837515473365784},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.42825770378112793},{"id":"https://openalex.org/C37945671","wikidata":"https://www.wikidata.org/wiki/Q7336207","display_name":"Risk-based testing","level":5,"score":0.42122119665145874},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.4206521213054657},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.38468366861343384},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1867649257183075},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1565963625907898},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-27207-3_35","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-27207-3_35","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2035466656","https://openalex.org/W2914956942","https://openalex.org/W4233554390"],"related_works":["https://openalex.org/W2362944210","https://openalex.org/W3167506726","https://openalex.org/W17857273","https://openalex.org/W1707101138","https://openalex.org/W3133844515","https://openalex.org/W2353261385","https://openalex.org/W2187840912","https://openalex.org/W1553928586","https://openalex.org/W1992311253","https://openalex.org/W2376559135"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}