{"id":"https://openalex.org/W2805601089","doi":"https://doi.org/10.1007/978-3-319-93000-8_55","title":"Quantification and Prediction of Damage in SAM Images of Semiconductor Devices","display_name":"Quantification and Prediction of Damage in SAM Images of Semiconductor Devices","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2805601089","doi":"https://doi.org/10.1007/978-3-319-93000-8_55","mag":"2805601089"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-93000-8_55","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-93000-8_55","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043446704","display_name":"D\u017eenana Alagi\u0107","orcid":"https://orcid.org/0000-0002-6567-5223"},"institutions":[{"id":"https://openalex.org/I4210157607","display_name":"\u00d6sterreichisches Forschungsinstitut f\u00fcr Chemie und Technik","ror":"https://ror.org/04zwgxj11","country_code":"AT","type":"facility","lineage":["https://openalex.org/I4210157607"]},{"id":"https://openalex.org/I4210166741","display_name":"University of Klagenfurt","ror":"https://ror.org/05q9m0937","country_code":"AT","type":"education","lineage":["https://openalex.org/I4210166741"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"D\u017eenana Alagi\u0107","raw_affiliation_strings":["Institut f\u00fcr Statistik, Alpen-Adria-Universit\u00e4t, Universit\u00e4tsstra\u00dfe 65-67, 9020, Klagenfurt, Austria","KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Europastra\u00dfe 8, 9524, Villach, Austria"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Statistik, Alpen-Adria-Universit\u00e4t, Universit\u00e4tsstra\u00dfe 65-67, 9020, Klagenfurt, Austria","institution_ids":["https://openalex.org/I4210166741"]},{"raw_affiliation_string":"KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Europastra\u00dfe 8, 9524, Villach, Austria","institution_ids":["https://openalex.org/I4210157607"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112812254","display_name":"Olivia Bluder","orcid":null},"institutions":[{"id":"https://openalex.org/I4210157607","display_name":"\u00d6sterreichisches Forschungsinstitut f\u00fcr Chemie und Technik","ror":"https://ror.org/04zwgxj11","country_code":"AT","type":"facility","lineage":["https://openalex.org/I4210157607"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Olivia Bluder","raw_affiliation_strings":["KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Europastra\u00dfe 8, 9524, Villach, Austria"],"affiliations":[{"raw_affiliation_string":"KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Europastra\u00dfe 8, 9524, Villach, Austria","institution_ids":["https://openalex.org/I4210157607"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086682451","display_name":"J\u00fcrgen Pilz","orcid":"https://orcid.org/0000-0001-9365-4916"},"institutions":[{"id":"https://openalex.org/I4210166741","display_name":"University of Klagenfurt","ror":"https://ror.org/05q9m0937","country_code":"AT","type":"education","lineage":["https://openalex.org/I4210166741"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"J\u00fcrgen Pilz","raw_affiliation_strings":["Institut f\u00fcr Statistik, Alpen-Adria-Universit\u00e4t, Universit\u00e4tsstra\u00dfe 65-67, 9020, Klagenfurt, Austria"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Statistik, Alpen-Adria-Universit\u00e4t, Universit\u00e4tsstra\u00dfe 65-67, 9020, Klagenfurt, Austria","institution_ids":["https://openalex.org/I4210166741"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043446704"],"corresponding_institution_ids":["https://openalex.org/I4210157607","https://openalex.org/I4210166741"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.5857,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.81084547,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"490","last_page":"496"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/categorical-variable","display_name":"Categorical variable","score":0.8114185333251953},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7270517349243164},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6887736916542053},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.49386197328567505},{"id":"https://openalex.org/keywords/intensity","display_name":"Intensity (physics)","score":0.46116843819618225},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4438134729862213},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.420841783285141},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3836077153682709},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.33121058344841003},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.19314143061637878},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.17196667194366455}],"concepts":[{"id":"https://openalex.org/C5274069","wikidata":"https://www.wikidata.org/wiki/Q2285707","display_name":"Categorical variable","level":2,"score":0.8114185333251953},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7270517349243164},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6887736916542053},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.49386197328567505},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.46116843819618225},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4438134729862213},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.420841783285141},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3836077153682709},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.33121058344841003},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.19314143061637878},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.17196667194366455},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-93000-8_55","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-93000-8_55","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1493790738","https://openalex.org/W2131938193","https://openalex.org/W2545948227"],"related_works":["https://openalex.org/W2773208253","https://openalex.org/W3181754520","https://openalex.org/W2560646951","https://openalex.org/W4297454206","https://openalex.org/W1871748041","https://openalex.org/W2362286668","https://openalex.org/W2133382151","https://openalex.org/W2153339597","https://openalex.org/W1528412344","https://openalex.org/W2539623612"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}