{"id":"https://openalex.org/W2517514681","doi":"https://doi.org/10.1007/978-3-319-46418-3_2","title":"Texture Based Quality Assessment of 3D Prints for Different Lighting Conditions","display_name":"Texture Based Quality Assessment of 3D Prints for Different Lighting Conditions","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2517514681","doi":"https://doi.org/10.1007/978-3-319-46418-3_2","mag":"2517514681"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-46418-3_2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-46418-3_2","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006059367","display_name":"Jaros\u0142aw Fastowicz","orcid":"https://orcid.org/0000-0002-3315-1281"},"institutions":[{"id":"https://openalex.org/I155313962","display_name":"West Pomeranian University of Technology","ror":"https://ror.org/0596m7f19","country_code":"PL","type":"education","lineage":["https://openalex.org/I155313962"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Jaros\u0142aw Fastowicz","raw_affiliation_strings":["Department of Signal Processing and Multimedia Engineering, Faculty of Electrical Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Signal Processing and Multimedia Engineering, Faculty of Electrical Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland","institution_ids":["https://openalex.org/I155313962"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075075434","display_name":"Krzysztof Okarma","orcid":"https://orcid.org/0000-0002-6721-3241"},"institutions":[{"id":"https://openalex.org/I155313962","display_name":"West Pomeranian University of Technology","ror":"https://ror.org/0596m7f19","country_code":"PL","type":"education","lineage":["https://openalex.org/I155313962"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Okarma","raw_affiliation_strings":["Department of Signal Processing and Multimedia Engineering, Faculty of Electrical Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Signal Processing and Multimedia Engineering, Faculty of Electrical Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland","institution_ids":["https://openalex.org/I155313962"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5006059367"],"corresponding_institution_ids":["https://openalex.org/I155313962"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":12.6153,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.99139322,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"17","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.809226393699646},{"id":"https://openalex.org/keywords/transparency","display_name":"Transparency (behavior)","score":0.717864453792572},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7144218683242798},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6930748224258423},{"id":"https://openalex.org/keywords/3d-scanning","display_name":"3d scanning","score":0.6058814525604248},{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.5982773303985596},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5870280861854553},{"id":"https://openalex.org/keywords/quality-assessment","display_name":"Quality assessment","score":0.5031890273094177},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.44217658042907715},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.3605888783931732},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3452335596084595},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.21254166960716248},{"id":"https://openalex.org/keywords/evaluation-methods","display_name":"Evaluation methods","score":0.16920587420463562},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07615786790847778},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.05416172742843628}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.809226393699646},{"id":"https://openalex.org/C2780233690","wikidata":"https://www.wikidata.org/wiki/Q535347","display_name":"Transparency (behavior)","level":2,"score":0.717864453792572},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7144218683242798},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6930748224258423},{"id":"https://openalex.org/C3019493240","wikidata":"https://www.wikidata.org/wiki/Q94701573","display_name":"3d scanning","level":2,"score":0.6058814525604248},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.5982773303985596},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5870280861854553},{"id":"https://openalex.org/C3020001037","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assessment","level":3,"score":0.5031890273094177},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.44217658042907715},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.3605888783931732},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3452335596084595},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.21254166960716248},{"id":"https://openalex.org/C3018395757","wikidata":"https://www.wikidata.org/wiki/Q1379672","display_name":"Evaluation methods","level":2,"score":0.16920587420463562},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07615786790847778},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.05416172742843628},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-46418-3_2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-46418-3_2","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1522949081","https://openalex.org/W1966026390","https://openalex.org/W2006776449","https://openalex.org/W2040732657","https://openalex.org/W2044465660","https://openalex.org/W2063680016","https://openalex.org/W2106136696","https://openalex.org/W2114603952","https://openalex.org/W2128977740","https://openalex.org/W2202611433"],"related_works":["https://openalex.org/W4382930947","https://openalex.org/W3081288631","https://openalex.org/W3152382318","https://openalex.org/W3004686567","https://openalex.org/W2738656338","https://openalex.org/W2603787370","https://openalex.org/W2555400967","https://openalex.org/W3214759741","https://openalex.org/W3174876210","https://openalex.org/W4288706063"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}