{"id":"https://openalex.org/W2398758830","doi":"https://doi.org/10.1007/978-3-319-27161-3_67","title":"Effect of Bias Temperature Instability on Soft Error Rate","display_name":"Effect of Bias Temperature Instability on Soft Error Rate","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2398758830","doi":"https://doi.org/10.1007/978-3-319-27161-3_67","mag":"2398758830"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-27161-3_67","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-27161-3_67","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100422399","display_name":"Zhen Wang","orcid":"https://orcid.org/0000-0003-0019-8240"},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Wang","raw_affiliation_strings":["School of Computer Science and Technology, Shanghai University of Electric Power, Shanghai, 200090, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Shanghai University of Electric Power, Shanghai, 200090, China","institution_ids":["https://openalex.org/I23632641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088671434","display_name":"Jianhui Jiang","orcid":"https://orcid.org/0000-0002-5829-8423"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianhui Jiang","raw_affiliation_strings":["School of Software Engineering, Tongji University, Shanghai, 201804, China"],"affiliations":[{"raw_affiliation_string":"School of Software Engineering, Tongji University, Shanghai, 201804, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100422399"],"corresponding_institution_ids":["https://openalex.org/I23632641"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18517183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"736","last_page":"745"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.86581951379776},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.8329699635505676},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.8011223673820496},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.7759258151054382},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6979849934577942},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6557499170303345},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5823360681533813},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5588757991790771},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41265636682510376},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39371734857559204},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.3057015538215637},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23509860038757324},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17559120059013367},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1724005937576294},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09002798795700073},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08028703927993774}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.86581951379776},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.8329699635505676},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.8011223673820496},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.7759258151054382},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6979849934577942},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6557499170303345},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5823360681533813},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5588757991790771},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41265636682510376},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39371734857559204},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.3057015538215637},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23509860038757324},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17559120059013367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1724005937576294},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09002798795700073},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08028703927993774},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-27161-3_67","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-27161-3_67","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1904268933","https://openalex.org/W2003588010","https://openalex.org/W2028613759","https://openalex.org/W2029293703","https://openalex.org/W2033346530","https://openalex.org/W2042689564","https://openalex.org/W2066042903","https://openalex.org/W2074831767","https://openalex.org/W2099569658","https://openalex.org/W2102913295","https://openalex.org/W2105619224","https://openalex.org/W2108126303","https://openalex.org/W2112103432","https://openalex.org/W2117984621","https://openalex.org/W2122335215","https://openalex.org/W2134752991","https://openalex.org/W2142358791","https://openalex.org/W2147685203","https://openalex.org/W2150506414","https://openalex.org/W2153409103","https://openalex.org/W2157923286","https://openalex.org/W2160155636","https://openalex.org/W2170039577","https://openalex.org/W3149410719","https://openalex.org/W4245951436"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W2126351224","https://openalex.org/W2710703523","https://openalex.org/W1742453416","https://openalex.org/W2042259532","https://openalex.org/W2339472487","https://openalex.org/W2802977219","https://openalex.org/W2745265705"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}