{"id":"https://openalex.org/W2954367755","doi":"https://doi.org/10.1007/978-3-030-19738-4_4","title":"Object Detection in Design Diagrams with Machine Learning","display_name":"Object Detection in Design Diagrams with Machine Learning","publication_year":2019,"publication_date":"2019-05-07","ids":{"openalex":"https://openalex.org/W2954367755","doi":"https://doi.org/10.1007/978-3-030-19738-4_4","mag":"2954367755"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-19738-4_4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-19738-4_4","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042260991","display_name":"Jukka K. Nurminen","orcid":"https://orcid.org/0000-0001-5083-1927"},"institutions":[{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Jukka K. Nurminen","raw_affiliation_strings":["VTT Technical Research Centre of Finland, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VTT Technical Research Centre of Finland, Espoo, Finland","institution_ids":["https://openalex.org/I87653560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054291545","display_name":"Kari Rainio","orcid":null},"institutions":[{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"Kari Rainio","raw_affiliation_strings":["VTT Technical Research Centre of Finland, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VTT Technical Research Centre of Finland, Espoo, Finland","institution_ids":["https://openalex.org/I87653560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022057083","display_name":"Jukka-Pekka Numminen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163152","display_name":"AFRY (Finland)","ror":"https://ror.org/05h72ek27","country_code":"FI","type":"company","lineage":["https://openalex.org/I4210139736","https://openalex.org/I4210163152"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Jukka-Pekka Numminen","raw_affiliation_strings":["P\u00f6yry Oy, Vantaa, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"P\u00f6yry Oy, Vantaa, Finland","institution_ids":["https://openalex.org/I4210163152"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003528887","display_name":"Timo Syrj\u00e4nen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163152","display_name":"AFRY (Finland)","ror":"https://ror.org/05h72ek27","country_code":"FI","type":"company","lineage":["https://openalex.org/I4210139736","https://openalex.org/I4210163152"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Timo Syrj\u00e4nen","raw_affiliation_strings":["P\u00f6yry Oy, Vantaa, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"P\u00f6yry Oy, Vantaa, Finland","institution_ids":["https://openalex.org/I4210163152"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019769708","display_name":"Niklas Paganus","orcid":null},"institutions":[{"id":"https://openalex.org/I2801249761","display_name":"Fortum (Finland)","ror":"https://ror.org/03nx8tr59","country_code":"FI","type":"company","lineage":["https://openalex.org/I2801249761"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Niklas Paganus","raw_affiliation_strings":["Fortum Oy, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fortum Oy, Espoo, Finland","institution_ids":["https://openalex.org/I2801249761"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065305081","display_name":"Karri Honkoila","orcid":null},"institutions":[{"id":"https://openalex.org/I2801249761","display_name":"Fortum (Finland)","ror":"https://ror.org/03nx8tr59","country_code":"FI","type":"company","lineage":["https://openalex.org/I2801249761"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Karri Honkoila","raw_affiliation_strings":["Fortum Oy, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fortum Oy, Espoo, Finland","institution_ids":["https://openalex.org/I2801249761"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5054291545"],"corresponding_institution_ids":["https://openalex.org/I87653560"],"apc_list":null,"apc_paid":null,"fwci":4.0855,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.94598109,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"27","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.8586598038673401},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7820504307746887},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5527853965759277},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5470893383026123},{"id":"https://openalex.org/keywords/block-diagram","display_name":"Block diagram","score":0.4629021883010864},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4587538242340088},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.44469407200813293},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.4395742118358612},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.4213830232620239},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.34742534160614014},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.25274139642715454},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2149367332458496},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08700069785118103}],"concepts":[{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.8586598038673401},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7820504307746887},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5527853965759277},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5470893383026123},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.4629021883010864},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4587538242340088},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.44469407200813293},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.4395742118358612},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.4213830232620239},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.34742534160614014},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.25274139642715454},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2149367332458496},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08700069785118103},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-19738-4_4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-19738-4_4","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1481190676","https://openalex.org/W1983000967","https://openalex.org/W2001642682","https://openalex.org/W2043183758","https://openalex.org/W2083727825","https://openalex.org/W2085638554","https://openalex.org/W2088049833","https://openalex.org/W2102545463","https://openalex.org/W2106609624","https://openalex.org/W2108528870","https://openalex.org/W2108789383","https://openalex.org/W2145915260","https://openalex.org/W2165698076","https://openalex.org/W2366113708","https://openalex.org/W2486598957","https://openalex.org/W2557728737","https://openalex.org/W2796347433","https://openalex.org/W2963658551","https://openalex.org/W3144586139","https://openalex.org/W6601258443"],"related_works":["https://openalex.org/W3154683910","https://openalex.org/W1846734616","https://openalex.org/W2361179745","https://openalex.org/W2349454723","https://openalex.org/W2385530759","https://openalex.org/W2354706843","https://openalex.org/W2259564233","https://openalex.org/W1976273126","https://openalex.org/W2385786361","https://openalex.org/W4292830139"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}