{"id":"https://openalex.org/W3130616177","doi":"https://doi.org/10.1007/s42979-021-00497-9","title":"Towards Tolerating Soft Errors for Embedded Systems","display_name":"Towards Tolerating Soft Errors for Embedded Systems","publication_year":2021,"publication_date":"2021-02-17","ids":{"openalex":"https://openalex.org/W3130616177","doi":"https://doi.org/10.1007/s42979-021-00497-9","mag":"3130616177"},"language":"en","primary_location":{"id":"doi:10.1007/s42979-021-00497-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s42979-021-00497-9","pdf_url":null,"source":{"id":"https://openalex.org/S4210174798","display_name":"SN Computer Science","issn_l":"2661-8907","issn":["2661-8907","2662-995X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SN Computer Science","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090662317","display_name":"Muhammad Sheikh Sadi","orcid":"https://orcid.org/0000-0003-3390-6450"},"institutions":[{"id":"https://openalex.org/I1307585291","display_name":"Khulna University of Engineering and Technology","ror":"https://ror.org/04y58d606","country_code":"BD","type":"education","lineage":["https://openalex.org/I1307585291"]}],"countries":["BD"],"is_corresponding":true,"raw_author_name":"Muhammad Sheikh Sadi","raw_affiliation_strings":["Khulna University of Engineering & Technology, Khulna, Bangladesh"],"raw_orcid":"https://orcid.org/0000-0003-3390-6450","affiliations":[{"raw_affiliation_string":"Khulna University of Engineering & Technology, Khulna, Bangladesh","institution_ids":["https://openalex.org/I1307585291"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101541796","display_name":"Waseem Ahmed","orcid":"https://orcid.org/0000-0001-5884-2268"},"institutions":[{"id":"https://openalex.org/I185163786","display_name":"King Abdulaziz University","ror":"https://ror.org/02ma4wv74","country_code":"SA","type":"education","lineage":["https://openalex.org/I185163786"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Waseem Ahmed","raw_affiliation_strings":["Faculty of Computing and Information Technology, King Abdulaziz University, Jeddah, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Computing and Information Technology, King Abdulaziz University, Jeddah, Saudi Arabia","institution_ids":["https://openalex.org/I185163786"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029120753","display_name":"Jan J\u00fcrjens","orcid":"https://orcid.org/0000-0002-8938-0470"},"institutions":[{"id":"https://openalex.org/I2802076133","display_name":"University of Koblenz and Landau","ror":"https://ror.org/01j9f6752","country_code":"DE","type":"education","lineage":["https://openalex.org/I2802076133"]},{"id":"https://openalex.org/I4210163630","display_name":"Fraunhofer Institute for Software and Systems Engineering","ror":"https://ror.org/058kjq542","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210163630","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jan J\u00fcrjens","raw_affiliation_strings":["IST/ISST, University of Koblenz-Landau and Fraunhofer Institute for Software and Systems Engineering, Koblenz/Dortmund, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IST/ISST, University of Koblenz-Landau and Fraunhofer Institute for Software and Systems Engineering, Koblenz/Dortmund, Germany","institution_ids":["https://openalex.org/I2802076133","https://openalex.org/I4210163630"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090662317"],"corresponding_institution_ids":["https://openalex.org/I1307585291"],"apc_list":{"value":2890,"currency":"USD","value_usd":2890},"apc_paid":null,"fwci":0.1608,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4253785,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":"2","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7556825876235962},{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.7146986126899719},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6587063074111938},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6234917044639587},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5780516266822815},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5336490273475647},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.470901757478714},{"id":"https://openalex.org/keywords/systems-design","display_name":"Systems design","score":0.4549826979637146},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4196094274520874},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41262632608413696},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.38473743200302124},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22027596831321716},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.19356295466423035},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18407750129699707},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08180832862854004}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7556825876235962},{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.7146986126899719},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6587063074111938},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6234917044639587},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5780516266822815},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5336490273475647},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.470901757478714},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.4549826979637146},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4196094274520874},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41262632608413696},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.38473743200302124},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22027596831321716},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.19356295466423035},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18407750129699707},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08180832862854004},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s42979-021-00497-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s42979-021-00497-9","pdf_url":null,"source":{"id":"https://openalex.org/S4210174798","display_name":"SN Computer Science","issn_l":"2661-8907","issn":["2661-8907","2662-995X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SN Computer Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1555296395","https://openalex.org/W1856724728","https://openalex.org/W1968899499","https://openalex.org/W1992534887","https://openalex.org/W2050431855","https://openalex.org/W2073308468","https://openalex.org/W2099569658","https://openalex.org/W2102863623","https://openalex.org/W2110039387","https://openalex.org/W2111918091","https://openalex.org/W2116059696","https://openalex.org/W2117391934","https://openalex.org/W2118033476","https://openalex.org/W2129333913","https://openalex.org/W2145071552","https://openalex.org/W2145423746","https://openalex.org/W2163131937","https://openalex.org/W2165071510","https://openalex.org/W2168887539","https://openalex.org/W2609040851","https://openalex.org/W2612721600","https://openalex.org/W2624182442","https://openalex.org/W2740228567","https://openalex.org/W2757076939","https://openalex.org/W2793518741","https://openalex.org/W2794374651","https://openalex.org/W2883213126","https://openalex.org/W2886034972","https://openalex.org/W2889272389","https://openalex.org/W2907909599","https://openalex.org/W3145901203","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W2140328632","https://openalex.org/W2541225405","https://openalex.org/W2149184458","https://openalex.org/W4316660008","https://openalex.org/W2373956461","https://openalex.org/W1482101251","https://openalex.org/W1505247109","https://openalex.org/W2898595008","https://openalex.org/W2807479533","https://openalex.org/W2128649319"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}