{"id":"https://openalex.org/W4366816008","doi":"https://doi.org/10.1007/s41635-023-00132-4","title":"A Comprehensive Taxonomy of Visual Printed Circuit Board Defects","display_name":"A Comprehensive Taxonomy of Visual Printed Circuit Board Defects","publication_year":2023,"publication_date":"2023-04-24","ids":{"openalex":"https://openalex.org/W4366816008","doi":"https://doi.org/10.1007/s41635-023-00132-4"},"language":"en","primary_location":{"id":"doi:10.1007/s41635-023-00132-4","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s41635-023-00132-4","pdf_url":null,"source":{"id":"https://openalex.org/S4210175245","display_name":"Journal of Hardware and Systems Security","issn_l":"2509-3428","issn":["2509-3428","2509-3436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Hardware and Systems Security","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073961867","display_name":"David S. Koblah","orcid":"https://orcid.org/0000-0002-5208-9874"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"David Selasi Koblah","raw_affiliation_strings":["University of Florida, Gainesville, FL, 32611, USA"],"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville, FL, 32611, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040726498","display_name":"Olivia P. Dizon-Paradis","orcid":"https://orcid.org/0000-0002-6879-8624"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Olivia P. Dizon-Paradis","raw_affiliation_strings":["University of Florida, Gainesville, FL, 32611, USA"],"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville, FL, 32611, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036715117","display_name":"Justin Schubeck","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Justin Schubeck","raw_affiliation_strings":["University of Florida, Gainesville, FL, 32611, USA"],"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville, FL, 32611, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074276081","display_name":"Ulbert J. Botero","orcid":"https://orcid.org/0000-0001-9848-8611"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ulbert J. Botero","raw_affiliation_strings":["University of Florida, Gainesville, FL, 32611, USA"],"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville, FL, 32611, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055751228","display_name":"Damon L. Woodard","orcid":"https://orcid.org/0000-0002-0471-177X"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Damon L. Woodard","raw_affiliation_strings":["University of Florida, Gainesville, FL, 32611, USA"],"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville, FL, 32611, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009243659","display_name":"Domenic Forte","orcid":"https://orcid.org/0000-0002-2794-7320"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Domenic Forte","raw_affiliation_strings":["University of Florida, Gainesville, FL, 32611, USA"],"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville, FL, 32611, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5073961867"],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":1.2365,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.81806275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"7","issue":"2-3","first_page":"25","last_page":"43"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5559560656547546},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.5426514744758606},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5335479378700256},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5315380692481995},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5080316066741943},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.49945974349975586},{"id":"https://openalex.org/keywords/3d-printed","display_name":"3d printed","score":0.4677334725856781},{"id":"https://openalex.org/keywords/supply-chain","display_name":"Supply chain","score":0.45445820689201355},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.4398171305656433},{"id":"https://openalex.org/keywords/taxonomy","display_name":"Taxonomy (biology)","score":0.4130896031856537},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37351760268211365},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2389368712902069},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.22857680916786194},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.1357613503932953},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11311429738998413}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5559560656547546},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5426514744758606},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5335479378700256},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5315380692481995},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5080316066741943},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.49945974349975586},{"id":"https://openalex.org/C3019308078","wikidata":"https://www.wikidata.org/wiki/Q229367","display_name":"3d printed","level":2,"score":0.4677334725856781},{"id":"https://openalex.org/C108713360","wikidata":"https://www.wikidata.org/wiki/Q1824206","display_name":"Supply chain","level":2,"score":0.45445820689201355},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.4398171305656433},{"id":"https://openalex.org/C58642233","wikidata":"https://www.wikidata.org/wiki/Q8269924","display_name":"Taxonomy (biology)","level":2,"score":0.4130896031856537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37351760268211365},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2389368712902069},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.22857680916786194},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.1357613503932953},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11311429738998413},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s41635-023-00132-4","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s41635-023-00132-4","pdf_url":null,"source":{"id":"https://openalex.org/S4210175245","display_name":"Journal of Hardware and Systems Security","issn_l":"2509-3428","issn":["2509-3428","2509-3436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Hardware and Systems Security","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8014200916","display_name":null,"funder_award_id":"AFRL-2022-4552","funder_id":"https://openalex.org/F4320338294","funder_display_name":"Air Force Research Laboratory"}],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W657599484","https://openalex.org/W1966170241","https://openalex.org/W1986529266","https://openalex.org/W2009338371","https://openalex.org/W2023573031","https://openalex.org/W2045273402","https://openalex.org/W2120062262","https://openalex.org/W2132346196","https://openalex.org/W2134004324","https://openalex.org/W2141832011","https://openalex.org/W2160009471","https://openalex.org/W2747355315","https://openalex.org/W2755523689","https://openalex.org/W2785622324","https://openalex.org/W2787180217","https://openalex.org/W2885496266","https://openalex.org/W2907604791","https://openalex.org/W2941001797","https://openalex.org/W2947574317","https://openalex.org/W2954934694","https://openalex.org/W2956416874","https://openalex.org/W2984761674","https://openalex.org/W3046341154","https://openalex.org/W3081524416","https://openalex.org/W3085018267","https://openalex.org/W3117219596","https://openalex.org/W3117946660","https://openalex.org/W3129420947","https://openalex.org/W3130095193","https://openalex.org/W3160782643","https://openalex.org/W3167486046","https://openalex.org/W3173358655","https://openalex.org/W3186516637","https://openalex.org/W3203234901","https://openalex.org/W3209122164","https://openalex.org/W3209531148","https://openalex.org/W4206290629","https://openalex.org/W4231486519"],"related_works":["https://openalex.org/W2599361292","https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W2098273855","https://openalex.org/W2391741149","https://openalex.org/W1560398276","https://openalex.org/W2004056068","https://openalex.org/W2003501636","https://openalex.org/W1521088445"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-01-23T23:20:30.427331","created_date":"2025-10-10T00:00:00"}