{"id":"https://openalex.org/W4412632906","doi":"https://doi.org/10.1007/s13198-025-02902-5","title":"Augmented networks component importance measure under common cause failures","display_name":"Augmented networks component importance measure under common cause failures","publication_year":2025,"publication_date":"2025-07-24","ids":{"openalex":"https://openalex.org/W4412632906","doi":"https://doi.org/10.1007/s13198-025-02902-5"},"language":"en","primary_location":{"id":"doi:10.1007/s13198-025-02902-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-025-02902-5","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061894806","display_name":"Kalpana Hazarika","orcid":"https://orcid.org/0000-0001-6950-925X"},"institutions":[{"id":"https://openalex.org/I155125381","display_name":"Galgotias University","ror":"https://ror.org/02w8ba206","country_code":"IN","type":"education","lineage":["https://openalex.org/I155125381"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Kalpana Hazarika","raw_affiliation_strings":["Department of Electrical & Electronics Engineering, Galgotias College of Engineering & Technology, Greater Noida, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronics Engineering, Galgotias College of Engineering & Technology, Greater Noida, India","institution_ids":["https://openalex.org/I155125381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088819978","display_name":"Vikas Singh Bhadoria","orcid":"https://orcid.org/0000-0002-8304-0651"},"institutions":[{"id":"https://openalex.org/I4210137508","display_name":"Shri Vishwakarma Skill University","ror":"https://ror.org/03kbe9m86","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210137508"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vikas Singh Bhadoria","raw_affiliation_strings":["Shri Vishwakarma Skill University, Palwal, Haryana, India"],"affiliations":[{"raw_affiliation_string":"Shri Vishwakarma Skill University, Palwal, Haryana, India","institution_ids":["https://openalex.org/I4210137508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054485150","display_name":"Manish Khemariya","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111553","display_name":"AISECT University","ror":"https://ror.org/020n82m84","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210111553"]},{"id":"https://openalex.org/I464993","display_name":"Barkatullah University","ror":"https://ror.org/02ax13658","country_code":"IN","type":"education","lineage":["https://openalex.org/I464993"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Khemariya","raw_affiliation_strings":["Department of Electrical Engineering, LNCT University, Bhopal, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, LNCT University, Bhopal, India","institution_ids":["https://openalex.org/I464993","https://openalex.org/I4210111553"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080942064","display_name":"Vivek Shrivastava","orcid":"https://orcid.org/0000-0003-4300-4784"},"institutions":[{"id":"https://openalex.org/I44635919","display_name":"National Institute of Technology Delhi","ror":"https://ror.org/032twef21","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210152752","https://openalex.org/I44635919"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vivek Shrivastava","raw_affiliation_strings":["Department of Electrical Engineering, NIT, Bakoli, Delhi, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, NIT, Bakoli, Delhi, India","institution_ids":["https://openalex.org/I44635919"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5061894806"],"corresponding_institution_ids":["https://openalex.org/I155125381"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.2182783,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":"12","first_page":"3948","last_page":"3955"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.7801512479782104},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6745062470436096},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4189406633377075},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37498000264167786},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.2804664373397827},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25056537985801697},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05495506525039673}],"concepts":[{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.7801512479782104},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6745062470436096},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4189406633377075},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37498000264167786},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2804664373397827},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25056537985801697},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05495506525039673},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s13198-025-02902-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-025-02902-5","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1969567850","https://openalex.org/W2018690243","https://openalex.org/W2029352273","https://openalex.org/W2058706155","https://openalex.org/W2075343578","https://openalex.org/W2077045998","https://openalex.org/W2085491510","https://openalex.org/W2087937711","https://openalex.org/W2096404357","https://openalex.org/W2126024524","https://openalex.org/W2126220020","https://openalex.org/W2152803417","https://openalex.org/W2155405999","https://openalex.org/W2162251767","https://openalex.org/W2162375021","https://openalex.org/W2747987714","https://openalex.org/W2942582659"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W4255837520","https://openalex.org/W2376932109","https://openalex.org/W2001405890"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}