{"id":"https://openalex.org/W4367843477","doi":"https://doi.org/10.1007/s13198-023-01905-4","title":"Reliability and cost optimization of series\u2013parallel system with metaheuristic algorithm","display_name":"Reliability and cost optimization of series\u2013parallel system with metaheuristic algorithm","publication_year":2023,"publication_date":"2023-05-03","ids":{"openalex":"https://openalex.org/W4367843477","doi":"https://doi.org/10.1007/s13198-023-01905-4"},"language":"en","primary_location":{"id":"doi:10.1007/s13198-023-01905-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-023-01905-4","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014666282","display_name":"Shivani Choudhary","orcid":null},"institutions":[{"id":"https://openalex.org/I60054993","display_name":"Graphic Era University","ror":"https://ror.org/03wqgqd89","country_code":"IN","type":"education","lineage":["https://openalex.org/I60054993"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Shivani Choudhary","raw_affiliation_strings":["Department of Mathematics, Graphic Era Deemed to be University, Dehradun, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, Graphic Era Deemed to be University, Dehradun, India","institution_ids":["https://openalex.org/I60054993"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004324716","display_name":"Mangey Ram","orcid":"https://orcid.org/0000-0002-8221-092X"},"institutions":[{"id":"https://openalex.org/I60054993","display_name":"Graphic Era University","ror":"https://ror.org/03wqgqd89","country_code":"IN","type":"education","lineage":["https://openalex.org/I60054993"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mangey Ram","raw_affiliation_strings":["Department of Mathematics, Computer Science and Engineering, Graphic Era Deemed to be University, Dehradun, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, Computer Science and Engineering, Graphic Era Deemed to be University, Dehradun, India","institution_ids":["https://openalex.org/I60054993"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065089010","display_name":"Nupur Goyal","orcid":"https://orcid.org/0000-0002-7468-3508"},"institutions":[{"id":"https://openalex.org/I60054993","display_name":"Graphic Era University","ror":"https://ror.org/03wqgqd89","country_code":"IN","type":"education","lineage":["https://openalex.org/I60054993"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nupur Goyal","raw_affiliation_strings":["Department of Mathematics, Graphic Era Deemed to be University, Dehradun, India"],"raw_orcid":"https://orcid.org/0000-0002-7468-3508","affiliations":[{"raw_affiliation_string":"Department of Mathematics, Graphic Era Deemed to be University, Dehradun, India","institution_ids":["https://openalex.org/I60054993"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021741489","display_name":"Seema Saini","orcid":"https://orcid.org/0000-0002-1597-1032"},"institutions":[{"id":"https://openalex.org/I60054993","display_name":"Graphic Era University","ror":"https://ror.org/03wqgqd89","country_code":"IN","type":"education","lineage":["https://openalex.org/I60054993"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Seema Saini","raw_affiliation_strings":["Department of Mathematics, Graphic Era Deemed to be University, Dehradun, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, Graphic Era Deemed to be University, Dehradun, India","institution_ids":["https://openalex.org/I60054993"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5014666282"],"corresponding_institution_ids":["https://openalex.org/I60054993"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.3821,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.78364154,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"15","issue":"4","first_page":"1456","last_page":"1466"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.7170501947402954},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7167631387710571},{"id":"https://openalex.org/keywords/metaheuristic","display_name":"Metaheuristic","score":0.6693609952926636},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.6656599640846252},{"id":"https://openalex.org/keywords/laplace-transform","display_name":"Laplace transform","score":0.5901784300804138},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.5500227808952332},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.5268886089324951},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5129985213279724},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.4985034465789795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48146238923072815},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.4651896059513092},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.43278712034225464},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4292926788330078},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.4134017825126648},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2800253629684448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23421931266784668},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0732106864452362}],"concepts":[{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.7170501947402954},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7167631387710571},{"id":"https://openalex.org/C109718341","wikidata":"https://www.wikidata.org/wiki/Q1385229","display_name":"Metaheuristic","level":2,"score":0.6693609952926636},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.6656599640846252},{"id":"https://openalex.org/C97937538","wikidata":"https://www.wikidata.org/wiki/Q199691","display_name":"Laplace transform","level":2,"score":0.5901784300804138},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.5500227808952332},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5268886089324951},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5129985213279724},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.4985034465789795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48146238923072815},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.4651896059513092},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.43278712034225464},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4292926788330078},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.4134017825126648},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2800253629684448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23421931266784668},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0732106864452362},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s13198-023-01905-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-023-01905-4","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:ijsaem:v:15:y:2024:i:4:d:10.1007_s13198-023-01905-4","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s13198-023-01905-4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W208206822","https://openalex.org/W1971945294","https://openalex.org/W2024501662","https://openalex.org/W2025777619","https://openalex.org/W2053986364","https://openalex.org/W2133858020","https://openalex.org/W2152195021","https://openalex.org/W2334713007","https://openalex.org/W2558161136","https://openalex.org/W2606269090","https://openalex.org/W2769013873","https://openalex.org/W2782515334","https://openalex.org/W2903133439","https://openalex.org/W2910014115","https://openalex.org/W2941117628","https://openalex.org/W2945896883","https://openalex.org/W2989693334","https://openalex.org/W3022650414","https://openalex.org/W3194847392","https://openalex.org/W3217233301"],"related_works":["https://openalex.org/W2789681586","https://openalex.org/W2794361564","https://openalex.org/W4243392960","https://openalex.org/W3156820950","https://openalex.org/W4232791346","https://openalex.org/W2971069100","https://openalex.org/W2504553392","https://openalex.org/W2331509522","https://openalex.org/W2937748796","https://openalex.org/W2135210976"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}