{"id":"https://openalex.org/W4224091943","doi":"https://doi.org/10.1007/s13198-022-01653-x","title":"Unified framework to assess software reliability and determine optimal release time in presence of fault reduction factor, error generation and fault removal efficiency","display_name":"Unified framework to assess software reliability and determine optimal release time in presence of fault reduction factor, error generation and fault removal efficiency","publication_year":2022,"publication_date":"2022-04-18","ids":{"openalex":"https://openalex.org/W4224091943","doi":"https://doi.org/10.1007/s13198-022-01653-x"},"language":"en","primary_location":{"id":"doi:10.1007/s13198-022-01653-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-022-01653-x","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091200842","display_name":"Vibha Verma","orcid":"https://orcid.org/0000-0002-3544-0087"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vibha Verma","raw_affiliation_strings":["Department of Operational Research, University of Delhi, Delhi, 110007, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Operational Research, University of Delhi, Delhi, 110007, India","institution_ids":["https://openalex.org/I110166357"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020140410","display_name":"Sameer Anand","orcid":"https://orcid.org/0000-0002-9694-5716"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sameer Anand","raw_affiliation_strings":["Shaheed Sukhdev College of Business Studies, University of Delhi, Delhi, India"],"raw_orcid":"https://orcid.org/0000-0002-9694-5716","affiliations":[{"raw_affiliation_string":"Shaheed Sukhdev College of Business Studies, University of Delhi, Delhi, India","institution_ids":["https://openalex.org/I110166357"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013827274","display_name":"P. K. Kapur","orcid":"https://orcid.org/0000-0001-8006-5952"},"institutions":[{"id":"https://openalex.org/I191972202","display_name":"Amity University","ror":"https://ror.org/02n9z0v62","country_code":"IN","type":"education","lineage":["https://openalex.org/I191972202"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P. K. Kapur","raw_affiliation_strings":["Amity Center for Interdisciplinary Research, Amity University, Noida, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Amity Center for Interdisciplinary Research, Amity University, Noida, India","institution_ids":["https://openalex.org/I191972202"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041713395","display_name":"Anu G. Aggarwal","orcid":"https://orcid.org/0000-0001-5448-9540"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anu G. Aggarwal","raw_affiliation_strings":["Department of Operational Research, University of Delhi, Delhi, 110007, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Operational Research, University of Delhi, Delhi, 110007, India","institution_ids":["https://openalex.org/I110166357"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5020140410"],"corresponding_institution_ids":["https://openalex.org/I110166357"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":8.3025,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.97966102,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"13","issue":"5","first_page":"2429","last_page":"2441"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7175029516220093},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.47819188237190247},{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.46998560428619385},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.46519267559051514},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4466809332370758},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43673160672187805},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42539262771606445},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3933040201663971},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3326420783996582},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.23700907826423645},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1806747317314148},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.142412930727005}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7175029516220093},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.47819188237190247},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.46998560428619385},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.46519267559051514},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4466809332370758},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43673160672187805},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42539262771606445},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3933040201663971},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3326420783996582},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.23700907826423645},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1806747317314148},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.142412930727005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s13198-022-01653-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-022-01653-x","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:ijsaem:v:13:y:2022:i:5:d:10.1007_s13198-022-01653-x","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s13198-022-01653-x","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.4000000059604645}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":56,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W130666128","https://openalex.org/W145568977","https://openalex.org/W1481308262","https://openalex.org/W1482796962","https://openalex.org/W1516836710","https://openalex.org/W1966017250","https://openalex.org/W1968903302","https://openalex.org/W1969899658","https://openalex.org/W1980539682","https://openalex.org/W1998064952","https://openalex.org/W1999450895","https://openalex.org/W2017319947","https://openalex.org/W2025037675","https://openalex.org/W2034667241","https://openalex.org/W2039444758","https://openalex.org/W2047164750","https://openalex.org/W2051851902","https://openalex.org/W2057928588","https://openalex.org/W2061099020","https://openalex.org/W2064669814","https://openalex.org/W2084695493","https://openalex.org/W2085039951","https://openalex.org/W2106624542","https://openalex.org/W2120197740","https://openalex.org/W2139059901","https://openalex.org/W2142341014","https://openalex.org/W2142943295","https://openalex.org/W2156751558","https://openalex.org/W2169813250","https://openalex.org/W2171242934","https://openalex.org/W2327443554","https://openalex.org/W2430636772","https://openalex.org/W2610810288","https://openalex.org/W2679888106","https://openalex.org/W2736320365","https://openalex.org/W2739670818","https://openalex.org/W2740745653","https://openalex.org/W2773505999","https://openalex.org/W2775980144","https://openalex.org/W2780489677","https://openalex.org/W2791892807","https://openalex.org/W2800981130","https://openalex.org/W2905373303","https://openalex.org/W2973615824","https://openalex.org/W2982397570","https://openalex.org/W2998193678","https://openalex.org/W3009870161","https://openalex.org/W3020179442","https://openalex.org/W3031823217","https://openalex.org/W3137958584","https://openalex.org/W3187096168","https://openalex.org/W3216353125","https://openalex.org/W4238386252","https://openalex.org/W4239778931","https://openalex.org/W4243331801"],"related_works":["https://openalex.org/W3083898685","https://openalex.org/W1973754976","https://openalex.org/W189075692","https://openalex.org/W2009404102","https://openalex.org/W4360908782","https://openalex.org/W82714704","https://openalex.org/W1519020487","https://openalex.org/W2382583096","https://openalex.org/W147463599","https://openalex.org/W1835076629"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":1}],"updated_date":"2026-05-20T08:49:12.498775","created_date":"2025-10-10T00:00:00"}