{"id":"https://openalex.org/W2472169740","doi":"https://doi.org/10.1007/s13198-016-0502-7","title":"Reliability prediction of smart pressure transmitter for use in NPPs","display_name":"Reliability prediction of smart pressure transmitter for use in NPPs","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2472169740","doi":"https://doi.org/10.1007/s13198-016-0502-7","mag":"2472169740"},"language":"en","primary_location":{"id":"doi:10.1007/s13198-016-0502-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-016-0502-7","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027210356","display_name":"Y. Munindra Reddy","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Y. Munindra Reddy","raw_affiliation_strings":["Electrical Power Systems, Madanapalle Institute of Technology and Science, Madanapalle, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"Electrical Power Systems, Madanapalle Institute of Technology and Science, Madanapalle, Andhra Pradesh, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002928198","display_name":"Rajendraprasad Narne","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Rajendraprasad Narne","raw_affiliation_strings":["Department of EEE, Madanapalle Institute of Technology and Science, Madanapalle, Andhra Pradesh, India"],"affiliations":[{"raw_affiliation_string":"Department of EEE, Madanapalle Institute of Technology and Science, Madanapalle, Andhra Pradesh, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079701885","display_name":"T. Santhosh","orcid":"https://orcid.org/0000-0003-2632-8824"},"institutions":[{"id":"https://openalex.org/I1329621470","display_name":"Bhabha Atomic Research Centre","ror":"https://ror.org/05w6wfp17","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1329621470","https://openalex.org/I2799351866","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"T. V. Santhosh","raw_affiliation_strings":["Reactor Safety Division, Bhabha Atomic Research Centre, Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Reactor Safety Division, Bhabha Atomic Research Centre, Mumbai, India","institution_ids":["https://openalex.org/I1329621470"]}]},{"author_position":"middle","author":{"id":null,"display_name":"V. Gopika","orcid":null},"institutions":[{"id":"https://openalex.org/I1329621470","display_name":"Bhabha Atomic Research Centre","ror":"https://ror.org/05w6wfp17","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1329621470","https://openalex.org/I2799351866","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"V. Gopika","raw_affiliation_strings":["Reactor Safety Division, Bhabha Atomic Research Centre, Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Reactor Safety Division, Bhabha Atomic Research Centre, Mumbai, India","institution_ids":["https://openalex.org/I1329621470"]}]},{"author_position":"last","author":{"id":null,"display_name":"N. B. Shreshta","orcid":null},"institutions":[{"id":"https://openalex.org/I1329621470","display_name":"Bhabha Atomic Research Centre","ror":"https://ror.org/05w6wfp17","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1329621470","https://openalex.org/I2799351866","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"N. B. Shreshta","raw_affiliation_strings":["Reactor Safety Division, Bhabha Atomic Research Centre, Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Reactor Safety Division, Bhabha Atomic Research Centre, Mumbai, India","institution_ids":["https://openalex.org/I1329621470"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5027210356"],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2699,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.5841603,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"8","issue":"S2","first_page":"656","last_page":"662"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.947700023651123,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.947700023651123,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.9248788356781006},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8072760105133057},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7307503819465637},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.606690526008606},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5794698596000671},{"id":"https://openalex.org/keywords/pressure-sensor","display_name":"Pressure sensor","score":0.5211398601531982},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.44165608286857605},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40414959192276},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.374307245016098},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.29571810364723206},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.17588448524475098}],"concepts":[{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.9248788356781006},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8072760105133057},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7307503819465637},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.606690526008606},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5794698596000671},{"id":"https://openalex.org/C41325743","wikidata":"https://www.wikidata.org/wiki/Q1261040","display_name":"Pressure sensor","level":2,"score":0.5211398601531982},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.44165608286857605},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40414959192276},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.374307245016098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.29571810364723206},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.17588448524475098},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s13198-016-0502-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-016-0502-7","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:ijsaem:v:8:y:2017:i:2:d:10.1007_s13198-016-0502-7","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s13198-016-0502-7","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334966","display_name":"Bhabha Atomic Research Centre","ror":"https://ror.org/05w6wfp17"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2046437403","https://openalex.org/W2116388056"],"related_works":["https://openalex.org/W2372318178","https://openalex.org/W3209466718","https://openalex.org/W2021328790","https://openalex.org/W2337334590","https://openalex.org/W2524718329","https://openalex.org/W3216201951","https://openalex.org/W1530507059","https://openalex.org/W2355543518","https://openalex.org/W2267274201","https://openalex.org/W2889865234"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}