{"id":"https://openalex.org/W2045446182","doi":"https://doi.org/10.1007/s13198-011-0055-8","title":"Imperfect preventive maintenance policies for two-process cumulative damage model of degradation and random shocks","display_name":"Imperfect preventive maintenance policies for two-process cumulative damage model of degradation and random shocks","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2045446182","doi":"https://doi.org/10.1007/s13198-011-0055-8","mag":"2045446182"},"language":"en","primary_location":{"id":"doi:10.1007/s13198-011-0055-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-011-0055-8","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100455023","display_name":"Yaping Wang","orcid":"https://orcid.org/0000-0002-8432-2124"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yaping Wang","raw_affiliation_strings":["Department of Industrial and Systems Engineering, Rutgers University, New Brunswick, NJ, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, Rutgers University, New Brunswick, NJ, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067875509","display_name":"Hoang Pham","orcid":"https://orcid.org/0000-0002-8019-7522"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hoang Pham","raw_affiliation_strings":["Department of Industrial and Systems Engineering, Rutgers University, New Brunswick, NJ, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, Rutgers University, New Brunswick, NJ, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5067875509"],"corresponding_institution_ids":["https://openalex.org/I102322142"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":4.4185,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.93883412,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"2","issue":"1","first_page":"66","last_page":"77"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiplicative-function","display_name":"Multiplicative function","score":0.7144123315811157},{"id":"https://openalex.org/keywords/preventive-maintenance","display_name":"Preventive maintenance","score":0.704357385635376},{"id":"https://openalex.org/keywords/gamma-process","display_name":"Gamma process","score":0.6964637637138367},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6241331100463867},{"id":"https://openalex.org/keywords/imperfect","display_name":"Imperfect","score":0.607327938079834},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.560814380645752},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5393524169921875},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5283587574958801},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5176737308502197},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.514376699924469},{"id":"https://openalex.org/keywords/optimal-maintenance","display_name":"Optimal maintenance","score":0.5079024434089661},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.4881625771522522},{"id":"https://openalex.org/keywords/cumulative-distribution-function","display_name":"Cumulative distribution function","score":0.4528556168079376},{"id":"https://openalex.org/keywords/random-effects-model","display_name":"Random effects model","score":0.42492997646331787},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.424286425113678},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28023210167884827},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27396178245544434},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.2513121962547302},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.23456260561943054}],"concepts":[{"id":"https://openalex.org/C42747912","wikidata":"https://www.wikidata.org/wiki/Q1048447","display_name":"Multiplicative function","level":2,"score":0.7144123315811157},{"id":"https://openalex.org/C24090081","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Preventive maintenance","level":2,"score":0.704357385635376},{"id":"https://openalex.org/C79495835","wikidata":"https://www.wikidata.org/wiki/Q5520315","display_name":"Gamma process","level":2,"score":0.6964637637138367},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6241331100463867},{"id":"https://openalex.org/C2780310539","wikidata":"https://www.wikidata.org/wiki/Q12547192","display_name":"Imperfect","level":2,"score":0.607327938079834},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.560814380645752},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5393524169921875},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5283587574958801},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5176737308502197},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.514376699924469},{"id":"https://openalex.org/C2776671899","wikidata":"https://www.wikidata.org/wiki/Q7098945","display_name":"Optimal maintenance","level":2,"score":0.5079024434089661},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4881625771522522},{"id":"https://openalex.org/C103784038","wikidata":"https://www.wikidata.org/wiki/Q386228","display_name":"Cumulative distribution function","level":3,"score":0.4528556168079376},{"id":"https://openalex.org/C168743327","wikidata":"https://www.wikidata.org/wiki/Q1826427","display_name":"Random effects model","level":3,"score":0.42492997646331787},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.424286425113678},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28023210167884827},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27396178245544434},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.2513121962547302},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23456260561943054},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C95190672","wikidata":"https://www.wikidata.org/wiki/Q815382","display_name":"Meta-analysis","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s13198-011-0055-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13198-011-0055-8","pdf_url":null,"source":{"id":"https://openalex.org/S40280859","display_name":"International Journal of Systems Assurance Engineering and Management","issn_l":"0975-6809","issn":["0975-6809","0976-4348"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of System Assurance Engineering and Management","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W92954098","https://openalex.org/W591839974","https://openalex.org/W606463773","https://openalex.org/W1591642914","https://openalex.org/W1973617983","https://openalex.org/W1975482785","https://openalex.org/W1976089264","https://openalex.org/W1984987698","https://openalex.org/W1993547940","https://openalex.org/W2006335781","https://openalex.org/W2024771569","https://openalex.org/W2043883726","https://openalex.org/W2044127045","https://openalex.org/W2048082785","https://openalex.org/W2048825482","https://openalex.org/W2069007351","https://openalex.org/W2071796076","https://openalex.org/W2080324467","https://openalex.org/W2081478325","https://openalex.org/W2090749763","https://openalex.org/W2096964395","https://openalex.org/W2103717306","https://openalex.org/W2104702266","https://openalex.org/W2106315576","https://openalex.org/W2119777027","https://openalex.org/W2132049856","https://openalex.org/W2133238844","https://openalex.org/W2134300411","https://openalex.org/W2134759928","https://openalex.org/W2136362079","https://openalex.org/W2151176860","https://openalex.org/W2160118356","https://openalex.org/W2160198307","https://openalex.org/W2914170357","https://openalex.org/W4239218596","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2377532696","https://openalex.org/W4366278346","https://openalex.org/W2096817349","https://openalex.org/W2389299234","https://openalex.org/W2052364065","https://openalex.org/W2069611285","https://openalex.org/W2004237406","https://openalex.org/W2368318383","https://openalex.org/W3179623636","https://openalex.org/W3091978896"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}