{"id":"https://openalex.org/W4414427270","doi":"https://doi.org/10.1007/s13042-025-02798-4","title":"Adte: defect detection and location based on adaptive multi-branch residual denosing and triple SE","display_name":"Adte: defect detection and location based on adaptive multi-branch residual denosing and triple SE","publication_year":2025,"publication_date":"2025-09-22","ids":{"openalex":"https://openalex.org/W4414427270","doi":"https://doi.org/10.1007/s13042-025-02798-4"},"language":"en","primary_location":{"id":"doi:10.1007/s13042-025-02798-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13042-025-02798-4","pdf_url":null,"source":{"id":"https://openalex.org/S2764999920","display_name":"International Journal of Machine Learning and Cybernetics","issn_l":"1868-8071","issn":["1868-8071","1868-808X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Machine Learning and Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102648071","display_name":"Jinke Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I97009856","display_name":"Bohai University","ror":"https://ror.org/01kdzej58","country_code":"CN","type":"education","lineage":["https://openalex.org/I97009856"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinke Liu","raw_affiliation_strings":["College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People\u2019s Republic of China","College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People\u2019s Republic of China","institution_ids":["https://openalex.org/I97009856"]},{"raw_affiliation_string":"College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People's Republic of China","institution_ids":["https://openalex.org/I97009856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115806553","display_name":"Jian Wang","orcid":"https://orcid.org/0000-0001-9729-6052"},"institutions":[{"id":"https://openalex.org/I97009856","display_name":"Bohai University","ror":"https://ror.org/01kdzej58","country_code":"CN","type":"education","lineage":["https://openalex.org/I97009856"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jian Wang","raw_affiliation_strings":["College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People\u2019s Republic of China","College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People\u2019s Republic of China","institution_ids":["https://openalex.org/I97009856"]},{"raw_affiliation_string":"College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People's Republic of China","institution_ids":["https://openalex.org/I97009856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101868913","display_name":"Zhiyan Han","orcid":"https://orcid.org/0000-0002-7724-6792"},"institutions":[{"id":"https://openalex.org/I97009856","display_name":"Bohai University","ror":"https://ror.org/01kdzej58","country_code":"CN","type":"education","lineage":["https://openalex.org/I97009856"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyan Han","raw_affiliation_strings":["College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People\u2019s Republic of China","College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People\u2019s Republic of China","institution_ids":["https://openalex.org/I97009856"]},{"raw_affiliation_string":"College of Control Science and Engineering, Bohai University, No. 19, Keji Road, Jinzhou, 121000, Liaoning, People's Republic of China","institution_ids":["https://openalex.org/I97009856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5115806553"],"corresponding_institution_ids":["https://openalex.org/I97009856"],"apc_list":{"value":2790,"currency":"EUR","value_usd":3590},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.32037382,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":"12","first_page":"10751","last_page":"10770"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.7753000259399414},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.7465999722480774},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6069999933242798},{"id":"https://openalex.org/keywords/anomaly","display_name":"Anomaly (physics)","score":0.5188000202178955},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.48190000653266907},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.4578000009059906},{"id":"https://openalex.org/keywords/computational-intelligence","display_name":"Computational intelligence","score":0.45329999923706055},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4207000136375427}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.7753000259399414},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.7465999722480774},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6851999759674072},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6592000126838684},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6069999933242798},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.5188000202178955},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.48190000653266907},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4578000009059906},{"id":"https://openalex.org/C139502532","wikidata":"https://www.wikidata.org/wiki/Q1122090","display_name":"Computational intelligence","level":2,"score":0.45329999923706055},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4207000136375427},{"id":"https://openalex.org/C8038995","wikidata":"https://www.wikidata.org/wiki/Q1152135","display_name":"Unsupervised learning","level":2,"score":0.3434000015258789},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3391999900341034},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3327000141143799},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.32989999651908875},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.32109999656677246},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.31310001015663147},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.3084999918937683},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.3059999942779541},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.2980000078678131},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.2840000092983246},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2800000011920929},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2775999903678894},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.2614000141620636},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.2606000006198883}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s13042-025-02798-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13042-025-02798-4","pdf_url":null,"source":{"id":"https://openalex.org/S2764999920","display_name":"International Journal of Machine Learning and Cybernetics","issn_l":"1868-8071","issn":["1868-8071","1868-808X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Machine Learning and Cybernetics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G50846620","display_name":null,"funder_award_id":"61503038","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6790860268","display_name":null,"funder_award_id":"61403042","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W2108598243","https://openalex.org/W2194775991","https://openalex.org/W2340896621","https://openalex.org/W2752782242","https://openalex.org/W2781233062","https://openalex.org/W2884585870","https://openalex.org/W2948982773","https://openalex.org/W3034314048","https://openalex.org/W3092704883","https://openalex.org/W3106848223","https://openalex.org/W3109771882","https://openalex.org/W3147184966","https://openalex.org/W3166166117","https://openalex.org/W3169077988","https://openalex.org/W3169651898","https://openalex.org/W4206551889","https://openalex.org/W4213114108","https://openalex.org/W4214694907","https://openalex.org/W4285147180","https://openalex.org/W4290964450","https://openalex.org/W4293525130","https://openalex.org/W4297798723","https://openalex.org/W4312605624","https://openalex.org/W4312772600","https://openalex.org/W4319299981","https://openalex.org/W4365395996","https://openalex.org/W4376626035","https://openalex.org/W4384436171","https://openalex.org/W4385195017","https://openalex.org/W4385743393","https://openalex.org/W4386065385","https://openalex.org/W4386065608","https://openalex.org/W4386113288","https://openalex.org/W4390875033","https://openalex.org/W4392308281","https://openalex.org/W4393147759","https://openalex.org/W4409366757","https://openalex.org/W4413145783"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-13T06:13:01.061226","created_date":"2025-10-10T00:00:00"}