{"id":"https://openalex.org/W4404069717","doi":"https://doi.org/10.1007/s13042-024-02438-3","title":"Bicrack: a bilateral network for real-time crack detection","display_name":"Bicrack: a bilateral network for real-time crack detection","publication_year":2024,"publication_date":"2024-11-05","ids":{"openalex":"https://openalex.org/W4404069717","doi":"https://doi.org/10.1007/s13042-024-02438-3"},"language":"en","primary_location":{"id":"doi:10.1007/s13042-024-02438-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13042-024-02438-3","pdf_url":null,"source":{"id":"https://openalex.org/S2764999920","display_name":"International Journal of Machine Learning and Cybernetics","issn_l":"1868-8071","issn":["1868-8071","1868-808X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Machine Learning and Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043879443","display_name":"Sailei Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Sailei Wang","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China"],"affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072805393","display_name":"Rongsheng Lu","orcid":"https://orcid.org/0000-0002-9794-9428"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rongsheng Lu","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China"],"affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033887624","display_name":"Bingtao Hu","orcid":"https://orcid.org/0000-0002-4939-8115"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bingtao Hu","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China"],"affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016876525","display_name":"Dahang Wan","orcid":"https://orcid.org/0000-0002-7442-5752"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dahang Wan","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China"],"affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103004043","display_name":"Mengjie Fang","orcid":"https://orcid.org/0000-0003-3027-3977"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingtao Fang","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China"],"affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei, 230009, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5043879443"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":{"value":2790,"currency":"EUR","value_usd":3590},"apc_paid":null,"fwci":0.2699,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57217281,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"16","issue":"5-6","first_page":"3097","last_page":"3112"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computational-intelligence","display_name":"Computational intelligence","score":0.7844251990318298},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6029255986213684},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4276730716228485}],"concepts":[{"id":"https://openalex.org/C139502532","wikidata":"https://www.wikidata.org/wiki/Q1122090","display_name":"Computational intelligence","level":2,"score":0.7844251990318298},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6029255986213684},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4276730716228485}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s13042-024-02438-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s13042-024-02438-3","pdf_url":null,"source":{"id":"https://openalex.org/S2764999920","display_name":"International Journal of Machine Learning and Cybernetics","issn_l":"1868-8071","issn":["1868-8071","1868-808X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Machine Learning and Cybernetics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5400000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1513670756","https://openalex.org/W1901129140","https://openalex.org/W1969393996","https://openalex.org/W1971100300","https://openalex.org/W2058988978","https://openalex.org/W2071905184","https://openalex.org/W2084524982","https://openalex.org/W2090409217","https://openalex.org/W2144801789","https://openalex.org/W2154805199","https://openalex.org/W2194775991","https://openalex.org/W2412782625","https://openalex.org/W2560023338","https://openalex.org/W2752782242","https://openalex.org/W2766159031","https://openalex.org/W2884585870","https://openalex.org/W2899242765","https://openalex.org/W2912350898","https://openalex.org/W2963881378","https://openalex.org/W2964308596","https://openalex.org/W2970332685","https://openalex.org/W2979396152","https://openalex.org/W2983902176","https://openalex.org/W2998844675","https://openalex.org/W3018816704","https://openalex.org/W3038091703","https://openalex.org/W3039785376","https://openalex.org/W3080613661","https://openalex.org/W3093870111","https://openalex.org/W3094897602","https://openalex.org/W3105421998","https://openalex.org/W3112139896","https://openalex.org/W3117123720","https://openalex.org/W3127550792","https://openalex.org/W3148211242","https://openalex.org/W3196904463","https://openalex.org/W3198911825","https://openalex.org/W4206296868","https://openalex.org/W4210629389","https://openalex.org/W4220780913","https://openalex.org/W4229051684","https://openalex.org/W4284958772","https://openalex.org/W4309047390","https://openalex.org/W4312523764","https://openalex.org/W4319978435","https://openalex.org/W4379390491","https://openalex.org/W4382489210","https://openalex.org/W4383988908","https://openalex.org/W4387421509","https://openalex.org/W6600424091","https://openalex.org/W6601897980"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}