{"id":"https://openalex.org/W4388206493","doi":"https://doi.org/10.1007/s11760-023-02797-4","title":"MMFF-NET: Multi-layer and multi-scale feature fusion network for low-light infrared image enhancement","display_name":"MMFF-NET: Multi-layer and multi-scale feature fusion network for low-light infrared image enhancement","publication_year":2023,"publication_date":"2023-10-26","ids":{"openalex":"https://openalex.org/W4388206493","doi":"https://doi.org/10.1007/s11760-023-02797-4"},"language":"en","primary_location":{"id":"doi:10.1007/s11760-023-02797-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11760-023-02797-4","pdf_url":null,"source":{"id":"https://openalex.org/S156904493","display_name":"Signal Image and Video Processing","issn_l":"1863-1703","issn":["1863-1703","1863-1711"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Signal, Image and Video Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111027116","display_name":"Ge Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ge Zhu","raw_affiliation_strings":["Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102939438","display_name":"Yuhan Chen","orcid":"https://orcid.org/0009-0008-0837-9779"},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhan Chen","raw_affiliation_strings":["Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076908328","display_name":"Xianquan Wang","orcid":"https://orcid.org/0000-0003-2966-5009"},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xianquan Wang","raw_affiliation_strings":["Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101624432","display_name":"Yiheng Zhang","orcid":"https://orcid.org/0000-0002-1940-6137"},"institutions":[{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiheng Zhang","raw_affiliation_strings":["Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing Key Laboratory of Time Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]},{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China","institution_ids":["https://openalex.org/I50632499"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5076908328"],"corresponding_institution_ids":["https://openalex.org/I50632499"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.7018,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.8692814,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"18","issue":"2","first_page":"1089","last_page":"1097"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6786123514175415},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.6402666568756104},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.5508735179901123},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.5284507274627686},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.5281669497489929},{"id":"https://openalex.org/keywords/net","display_name":"Net (polyhedron)","score":0.5216372609138489},{"id":"https://openalex.org/keywords/image-fusion","display_name":"Image fusion","score":0.5026190280914307},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4450725317001343},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.43875372409820557},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43051695823669434},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39640310406684875},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3806321620941162},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.372275173664093},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.31229788064956665},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20664191246032715},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1413898468017578},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09301218390464783}],"concepts":[{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6786123514175415},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6402666568756104},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5508735179901123},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.5284507274627686},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5281669497489929},{"id":"https://openalex.org/C14166107","wikidata":"https://www.wikidata.org/wiki/Q253829","display_name":"Net (polyhedron)","level":2,"score":0.5216372609138489},{"id":"https://openalex.org/C69744172","wikidata":"https://www.wikidata.org/wiki/Q860822","display_name":"Image fusion","level":3,"score":0.5026190280914307},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4450725317001343},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.43875372409820557},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43051695823669434},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39640310406684875},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3806321620941162},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.372275173664093},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.31229788064956665},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20664191246032715},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1413898468017578},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09301218390464783},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11760-023-02797-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11760-023-02797-4","pdf_url":null,"source":{"id":"https://openalex.org/S156904493","display_name":"Signal Image and Video Processing","issn_l":"1863-1703","issn":["1863-1703","1863-1711"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Signal, Image and Video Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4000000059604645,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1640745651","https://openalex.org/W1901129140","https://openalex.org/W1903029394","https://openalex.org/W2003796051","https://openalex.org/W2005664438","https://openalex.org/W2015148749","https://openalex.org/W2194775991","https://openalex.org/W2254039850","https://openalex.org/W2395611524","https://openalex.org/W2468596194","https://openalex.org/W2560622558","https://openalex.org/W2560923441","https://openalex.org/W2566376500","https://openalex.org/W2607333215","https://openalex.org/W2767009334","https://openalex.org/W2793086013","https://openalex.org/W2886209123","https://openalex.org/W2895598217","https://openalex.org/W2908218113","https://openalex.org/W2948354154","https://openalex.org/W2949187370","https://openalex.org/W2951245411","https://openalex.org/W2962835968","https://openalex.org/W2970862332","https://openalex.org/W3034895805","https://openalex.org/W3035731588","https://openalex.org/W3042993386","https://openalex.org/W3099562471","https://openalex.org/W3121661546","https://openalex.org/W3134649899","https://openalex.org/W3174792937","https://openalex.org/W4226227744","https://openalex.org/W4281662596","https://openalex.org/W4288737371","https://openalex.org/W4296122683","https://openalex.org/W4312249431","https://openalex.org/W6600514347","https://openalex.org/W6977229760"],"related_works":["https://openalex.org/W2788731446","https://openalex.org/W2204403038","https://openalex.org/W3152170969","https://openalex.org/W2379054866","https://openalex.org/W2549658594","https://openalex.org/W2095903272","https://openalex.org/W2370195708","https://openalex.org/W1490651872","https://openalex.org/W2350422455","https://openalex.org/W2139242969"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":5}],"updated_date":"2026-06-13T06:13:01.061226","created_date":"2025-10-10T00:00:00"}