{"id":"https://openalex.org/W1984321854","doi":"https://doi.org/10.1007/s11740-010-0228-3","title":"Nondestructive characterization of the surface integrity of cold surface hardened components","display_name":"Nondestructive characterization of the surface integrity of cold surface hardened components","publication_year":2010,"publication_date":"2010-05-04","ids":{"openalex":"https://openalex.org/W1984321854","doi":"https://doi.org/10.1007/s11740-010-0228-3","mag":"1984321854"},"language":"en","primary_location":{"id":"doi:10.1007/s11740-010-0228-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11740-010-0228-3","pdf_url":null,"source":{"id":"https://openalex.org/S43349511","display_name":"Production Engineering","issn_l":"0944-6524","issn":["0944-6524","1863-7353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Production Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016313778","display_name":"Daniel Meyer","orcid":"https://orcid.org/0000-0003-2747-6589"},"institutions":[{"id":"https://openalex.org/I4210112376","display_name":"Leibniz-Institut f\u00fcr Werkstofforientierte Technologien - IWT","ror":"https://ror.org/01xc6bj88","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I4210112376"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"D. Meyer","raw_affiliation_strings":["Department of Manufacturing Technologies, Foundation Institute of Materials Science (IWT), Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Manufacturing Technologies, Foundation Institute of Materials Science (IWT), Bremen, Germany","institution_ids":["https://openalex.org/I4210112376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041838058","display_name":"Dustin E. Kruse","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Kruse","raw_affiliation_strings":["Bremen Institute For Metrology, Automation and Quality Science (BIMAQ), Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Bremen Institute For Metrology, Automation and Quality Science (BIMAQ), Bremen, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018893669","display_name":"Alexander B\u00f6be","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112376","display_name":"Leibniz-Institut f\u00fcr Werkstofforientierte Technologien - IWT","ror":"https://ror.org/01xc6bj88","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I4210112376"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Bobe","raw_affiliation_strings":["Department of Manufacturing Technologies, Foundation Institute of Materials Science (IWT), Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Manufacturing Technologies, Foundation Institute of Materials Science (IWT), Bremen, Germany","institution_ids":["https://openalex.org/I4210112376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103225980","display_name":"G. Goch","orcid":"https://orcid.org/0000-0003-1040-3033"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Goch","raw_affiliation_strings":["Bremen Institute For Metrology, Automation and Quality Science (BIMAQ), Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Bremen Institute For Metrology, Automation and Quality Science (BIMAQ), Bremen, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013733527","display_name":"E. Brinksmeier","orcid":"https://orcid.org/0000-0001-6223-0651"},"institutions":[{"id":"https://openalex.org/I4210112376","display_name":"Leibniz-Institut f\u00fcr Werkstofforientierte Technologien - IWT","ror":"https://ror.org/01xc6bj88","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I4210112376"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"E. Brinksmeier","raw_affiliation_strings":["Department of Manufacturing Technologies, Foundation Institute of Materials Science (IWT), Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Manufacturing Technologies, Foundation Institute of Materials Science (IWT), Bremen, Germany","institution_ids":["https://openalex.org/I4210112376"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5016313778"],"corresponding_institution_ids":["https://openalex.org/I4210112376"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.806,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.88957026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"4","issue":"5","first_page":"443","last_page":"449"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12106","display_name":"Surface Treatment and Residual Stress","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12106","display_name":"Surface Treatment and Residual Stress","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13129","display_name":"Material Properties and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-integrity","display_name":"Surface integrity","score":0.844965398311615},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.8143758177757263},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6960470676422119},{"id":"https://openalex.org/keywords/residual-stress","display_name":"Residual stress","score":0.6282706260681152},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5599218010902405},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.5334178805351257},{"id":"https://openalex.org/keywords/surface-layer","display_name":"Surface layer","score":0.5103632807731628},{"id":"https://openalex.org/keywords/case-hardening","display_name":"Case hardening","score":0.4639975428581238},{"id":"https://openalex.org/keywords/hardness","display_name":"Hardness","score":0.45961564779281616},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.38989222049713135},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.2415061891078949},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10317236185073853}],"concepts":[{"id":"https://openalex.org/C2776363543","wikidata":"https://www.wikidata.org/wiki/Q7645982","display_name":"Surface integrity","level":3,"score":0.844965398311615},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.8143758177757263},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6960470676422119},{"id":"https://openalex.org/C37292000","wikidata":"https://www.wikidata.org/wiki/Q1257918","display_name":"Residual stress","level":2,"score":0.6282706260681152},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5599218010902405},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.5334178805351257},{"id":"https://openalex.org/C197751951","wikidata":"https://www.wikidata.org/wiki/Q1046363","display_name":"Surface layer","level":3,"score":0.5103632807731628},{"id":"https://openalex.org/C137581009","wikidata":"https://www.wikidata.org/wiki/Q1205902","display_name":"Case hardening","level":3,"score":0.4639975428581238},{"id":"https://openalex.org/C42698342","wikidata":"https://www.wikidata.org/wiki/Q3236003","display_name":"Hardness","level":2,"score":0.45961564779281616},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.38989222049713135},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.2415061891078949},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10317236185073853},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11740-010-0228-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11740-010-0228-3","pdf_url":null,"source":{"id":"https://openalex.org/S43349511","display_name":"Production Engineering","issn_l":"0944-6524","issn":["0944-6524","1863-7353"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Production Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W613420244","https://openalex.org/W1967166580","https://openalex.org/W1968216954","https://openalex.org/W1995630393","https://openalex.org/W1999790884","https://openalex.org/W2008700148","https://openalex.org/W2044318904","https://openalex.org/W2047271413","https://openalex.org/W2050826457","https://openalex.org/W2052251044","https://openalex.org/W2054092459","https://openalex.org/W2060883533","https://openalex.org/W2076400940","https://openalex.org/W2088352012","https://openalex.org/W2090318125","https://openalex.org/W2140183486","https://openalex.org/W2187636587","https://openalex.org/W2188503385","https://openalex.org/W2395280349","https://openalex.org/W2798391485","https://openalex.org/W2940192502","https://openalex.org/W3137432043","https://openalex.org/W3208946275","https://openalex.org/W4301005491","https://openalex.org/W6602714757"],"related_works":["https://openalex.org/W2251179228","https://openalex.org/W2071723612","https://openalex.org/W2246079399","https://openalex.org/W4312461493","https://openalex.org/W2252726720","https://openalex.org/W2369420263","https://openalex.org/W2338713521","https://openalex.org/W4312557193","https://openalex.org/W122654677","https://openalex.org/W2088893685"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}