{"id":"https://openalex.org/W7118261830","doi":"https://doi.org/10.1007/s11554-025-01839-z","title":"A lightweight fabric defect detection method based on improved ShuffleNetV2","display_name":"A lightweight fabric defect detection method based on improved ShuffleNetV2","publication_year":2026,"publication_date":"2026-01-07","ids":{"openalex":"https://openalex.org/W7118261830","doi":"https://doi.org/10.1007/s11554-025-01839-z"},"language":"en","primary_location":{"id":"doi:10.1007/s11554-025-01839-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11554-025-01839-z","pdf_url":null,"source":{"id":"https://openalex.org/S11282291","display_name":"Journal of Real-Time Image Processing","issn_l":"1861-8200","issn":["1861-8200","1861-8219"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Real-Time Image Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100380653","display_name":"Dan Li","orcid":"https://orcid.org/0000-0001-5339-7759"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Li","raw_affiliation_strings":["The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China"],"affiliations":[{"raw_affiliation_string":"The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5122089610","display_name":"Yunpeng Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunpeng Hu","raw_affiliation_strings":["The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China"],"affiliations":[{"raw_affiliation_string":"The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5122238345","display_name":"Wentao Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wentao Cao","raw_affiliation_strings":["The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China"],"affiliations":[{"raw_affiliation_string":"The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102998160","display_name":"Qi Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qi Yang","raw_affiliation_strings":["The School of Innovation and Entrepreneurship, Anhui University of Technology, 243032, Maanshan, China"],"affiliations":[{"raw_affiliation_string":"The School of Innovation and Entrepreneurship, Anhui University of Technology, 243032, Maanshan, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5122086428","display_name":"Yang Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Chen","raw_affiliation_strings":["The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China"],"affiliations":[{"raw_affiliation_string":"The School of Electrical and Information Engineering, Anhui University of Technology, Maanshan, 243032, China","institution_ids":["https://openalex.org/I92178344"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5102998160"],"corresponding_institution_ids":["https://openalex.org/I92178344"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":54.0714,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.98584371,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"23","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9599999785423279,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9599999785423279,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.024900000542402267,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5995000004768372},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.5922999978065491},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.508899986743927},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.501800000667572},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.4074999988079071},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.3901999890804291},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.38670000433921814},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.37860000133514404}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6243000030517578},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5995000004768372},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.5922999978065491},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.508899986743927},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.501800000667572},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45339998602867126},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.4074999988079071},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.3901999890804291},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.38670000433921814},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.37860000133514404},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3776000142097473},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.35519999265670776},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.34389999508857727},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3379000127315521},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.3346000015735626},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.31869998574256897},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3181000053882599},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3116999864578247},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.295199990272522},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.28619998693466187},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2833999991416931},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27639999985694885},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.2703999876976013},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.25099998712539673}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11554-025-01839-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11554-025-01839-z","pdf_url":null,"source":{"id":"https://openalex.org/S11282291","display_name":"Journal of Real-Time Image Processing","issn_l":"1861-8200","issn":["1861-8200","1861-8219"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Real-Time Image Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6649640202522278,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2097117768","https://openalex.org/W2194775991","https://openalex.org/W2752782242","https://openalex.org/W2883780447","https://openalex.org/W2963125010","https://openalex.org/W3013989817","https://openalex.org/W3023224696","https://openalex.org/W3034403122","https://openalex.org/W3034552520","https://openalex.org/W3035414587","https://openalex.org/W3046192653","https://openalex.org/W4382465558","https://openalex.org/W4386047745","https://openalex.org/W4403886130","https://openalex.org/W4405458683","https://openalex.org/W4408746048","https://openalex.org/W4411349284","https://openalex.org/W4411939329","https://openalex.org/W4412076831","https://openalex.org/W4413146328"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-01-08T20:10:11.968330","created_date":"2026-01-08T00:00:00"}