{"id":"https://openalex.org/W4410443615","doi":"https://doi.org/10.1007/s11432-024-4429-7","title":"Enhanced memory window and reliability of \u03b1-IGZO FeFET enabled by atomic-layer-deposited HfO2 interfacial layer","display_name":"Enhanced memory window and reliability of \u03b1-IGZO FeFET enabled by atomic-layer-deposited HfO2 interfacial layer","publication_year":2025,"publication_date":"2025-05-15","ids":{"openalex":"https://openalex.org/W4410443615","doi":"https://doi.org/10.1007/s11432-024-4429-7"},"language":"en","primary_location":{"id":"doi:10.1007/s11432-024-4429-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-024-4429-7","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004704480","display_name":"Yinchi Liu","orcid":"https://orcid.org/0009-0007-8361-2879"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinchi Liu","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China","Shaoxin Laboratory, Shaoxing, 312000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]},{"raw_affiliation_string":"Shaoxin Laboratory, Shaoxing, 312000, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100898230","display_name":"Xun Lu","orcid":"https://orcid.org/0009-0008-4873-8625"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xun Lu","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115580411","display_name":"Shiyu Li","orcid":"https://orcid.org/0000-0003-2235-7601"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiyu Li","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100396965","display_name":"Hao Zhang","orcid":"https://orcid.org/0000-0002-8201-3272"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Zhang","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101257124","display_name":"Jining Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jining Yang","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101114721","display_name":"Yeye Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yeye Guo","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062175295","display_name":"\u0414. \u0410. \u0413\u043e\u043b\u043e\u0441\u043e\u0432","orcid":"https://orcid.org/0000-0002-1482-4620"},"institutions":[{"id":"https://openalex.org/I7452641","display_name":"Belarusian State University of Informatics and Radioelectronics","ror":"https://ror.org/02sehzp52","country_code":"BY","type":"education","lineage":["https://openalex.org/I7452641"]}],"countries":["BY"],"is_corresponding":false,"raw_author_name":"Dmitriy Anatolyevich Golosov","raw_affiliation_strings":["Belarusian State University of Informatics and Radioelectronics, Minsk, 220013, Belarus"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Belarusian State University of Informatics and Radioelectronics, Minsk, 220013, Belarus","institution_ids":["https://openalex.org/I7452641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088326953","display_name":"Chenjie Gu","orcid":"https://orcid.org/0000-0002-1339-4534"},"institutions":[{"id":"https://openalex.org/I109935558","display_name":"Ningbo University","ror":"https://ror.org/03et85d35","country_code":"CN","type":"education","lineage":["https://openalex.org/I109935558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenjie Gu","raw_affiliation_strings":["School of Physical Science and Technology, Ningbo University, Ningbo, 315211, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physical Science and Technology, Ningbo University, Ningbo, 315211, China","institution_ids":["https://openalex.org/I109935558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004151688","display_name":"Hong-Liang L\u00fc","orcid":"https://orcid.org/0000-0003-2398-720X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongliang Lu","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058083493","display_name":"Zhigang Ji","orcid":"https://orcid.org/0000-0003-1138-804X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhigang Ji","raw_affiliation_strings":["National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiao Tong University, Shanghai, 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiao Tong University, Shanghai, 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031360796","display_name":"Shijin Ding","orcid":"https://orcid.org/0000-0001-7556-161X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shijin Ding","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100380194","display_name":"Wen-Jun Liu","orcid":"https://orcid.org/0000-0003-4217-8838"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenjun Liu","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, 200433, China","Shaoxin Laboratory, Shaoxing, 312000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, 200433, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]},{"raw_affiliation_string":"Shaoxin Laboratory, Shaoxing, 312000, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5058083493","https://openalex.org/A5100380194"],"corresponding_institution_ids":["https://openalex.org/I183067930","https://openalex.org/I24943067","https://openalex.org/I4210132426"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.9602,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.86087538,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"68","issue":"6","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.8002207279205322},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6636272072792053},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6284083127975464},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.6228344440460205},{"id":"https://openalex.org/keywords/atomic-layer-deposition","display_name":"Atomic layer deposition","score":0.5386919975280762},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5178523659706116},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5051417946815491},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3414739966392517},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3188727796077728},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07631522417068481},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06811803579330444}],"concepts":[{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.8002207279205322},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6636272072792053},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6284083127975464},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.6228344440460205},{"id":"https://openalex.org/C69544855","wikidata":"https://www.wikidata.org/wiki/Q757625","display_name":"Atomic layer deposition","level":3,"score":0.5386919975280762},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5178523659706116},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5051417946815491},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3414739966392517},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3188727796077728},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07631522417068481},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06811803579330444},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s11432-024-4429-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-024-4429-7","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},{"id":"pmh:oai:libeldoc.bsuir.by:123456789/62773","is_oa":false,"landing_page_url":"https://libeldoc.bsuir.by/handle/123456789/62773","pdf_url":null,"source":{"id":"https://openalex.org/S4406923062","display_name":"\u0420\u0435\u043f\u043e\u0437\u0438\u0442\u043e\u0440\u0438\u0439 \u0411\u0413\u0423\u0418\u0420 (BSUIR Repository)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2800070060","https://openalex.org/W2808007855","https://openalex.org/W3043741482","https://openalex.org/W3136117125","https://openalex.org/W3164346087","https://openalex.org/W4221025951","https://openalex.org/W4313503504","https://openalex.org/W4317815262","https://openalex.org/W4318189590","https://openalex.org/W4321488279","https://openalex.org/W4323668527","https://openalex.org/W4367313712","https://openalex.org/W4385515755","https://openalex.org/W4386807500","https://openalex.org/W4390970381"],"related_works":["https://openalex.org/W2017189043","https://openalex.org/W2045648267","https://openalex.org/W4248115860","https://openalex.org/W4304136734","https://openalex.org/W1998534931","https://openalex.org/W1969537910","https://openalex.org/W2314095797","https://openalex.org/W1994690009","https://openalex.org/W4382765865","https://openalex.org/W2949072884"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}