{"id":"https://openalex.org/W4395009192","doi":"https://doi.org/10.1007/s11432-023-3902-6","title":"Mitigating set-stuck failure in 3D phase change memory: substituting square pulses with surge pulses","display_name":"Mitigating set-stuck failure in 3D phase change memory: substituting square pulses with surge pulses","publication_year":2024,"publication_date":"2024-04-19","ids":{"openalex":"https://openalex.org/W4395009192","doi":"https://doi.org/10.1007/s11432-023-3902-6"},"language":"en","primary_location":{"id":"doi:10.1007/s11432-023-3902-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-023-3902-6","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104284958","display_name":"Ninghua Li","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ninghua Li","raw_affiliation_strings":["Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China"],"affiliations":[{"raw_affiliation_string":"Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100742975","display_name":"Cai Wang","orcid":"https://orcid.org/0009-0001-8286-9687"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Cai","raw_affiliation_strings":["Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China"],"affiliations":[{"raw_affiliation_string":"Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002009991","display_name":"Jun Xiang","orcid":"https://orcid.org/0000-0002-0627-1528"},"institutions":[{"id":"https://openalex.org/I4210105460","display_name":"Shanghai Institute of Measurement and Testing Technology","ror":"https://ror.org/00zcefp03","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210105460"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Xiang","raw_affiliation_strings":["Hubei Institute of Measurement and Testing Technology, Wuhan, 430205, China"],"affiliations":[{"raw_affiliation_string":"Hubei Institute of Measurement and Testing Technology, Wuhan, 430205, China","institution_ids":["https://openalex.org/I4210105460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079369270","display_name":"Hao Tong","orcid":"https://orcid.org/0000-0002-8379-543X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Tong","raw_affiliation_strings":["Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China"],"affiliations":[{"raw_affiliation_string":"Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087300057","display_name":"Weiming Cheng","orcid":"https://orcid.org/0000-0003-1580-4979"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiming Cheng","raw_affiliation_strings":["Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China"],"affiliations":[{"raw_affiliation_string":"Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100607861","display_name":"Xiangshui Miao","orcid":"https://orcid.org/0000-0002-5621-5495"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangshui Miao","raw_affiliation_strings":["Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China"],"affiliations":[{"raw_affiliation_string":"Hubei Yangtze Memory Laboratories, Wuhan, 430205, China","institution_ids":[]},{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5104284958"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2429,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4698672,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"67","issue":"5","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10306","display_name":"Liquid Crystal Research Advancements","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surge","display_name":"Surge","score":0.7646270990371704},{"id":"https://openalex.org/keywords/square","display_name":"Square (algebra)","score":0.7293177843093872},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.6041072607040405},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5426557064056396},{"id":"https://openalex.org/keywords/phase-change-memory","display_name":"Phase-change memory","score":0.5059449076652527},{"id":"https://openalex.org/keywords/phase-change","display_name":"Phase change","score":0.4053312838077545},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3637983202934265},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2734934985637665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18735501170158386},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16390550136566162},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14281681180000305},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13405588269233704},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.1094648540019989},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.0687015950679779}],"concepts":[{"id":"https://openalex.org/C154108245","wikidata":"https://www.wikidata.org/wiki/Q287381","display_name":"Surge","level":2,"score":0.7646270990371704},{"id":"https://openalex.org/C135692309","wikidata":"https://www.wikidata.org/wiki/Q111124","display_name":"Square (algebra)","level":2,"score":0.7293177843093872},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.6041072607040405},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5426557064056396},{"id":"https://openalex.org/C64142963","wikidata":"https://www.wikidata.org/wiki/Q1153902","display_name":"Phase-change memory","level":3,"score":0.5059449076652527},{"id":"https://openalex.org/C133256868","wikidata":"https://www.wikidata.org/wiki/Q7180940","display_name":"Phase change","level":2,"score":0.4053312838077545},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3637983202934265},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2734934985637665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18735501170158386},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16390550136566162},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14281681180000305},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13405588269233704},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.1094648540019989},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0687015950679779},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11432-023-3902-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-023-3902-6","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1937359183","https://openalex.org/W1972975856","https://openalex.org/W1992388464","https://openalex.org/W2051220390","https://openalex.org/W2065298753","https://openalex.org/W2081642146","https://openalex.org/W2109153216","https://openalex.org/W2119668988","https://openalex.org/W2149272185","https://openalex.org/W2526202524","https://openalex.org/W2540697258","https://openalex.org/W2750096999","https://openalex.org/W2785455522","https://openalex.org/W2899318630","https://openalex.org/W2912478339","https://openalex.org/W2946641467","https://openalex.org/W2949799827","https://openalex.org/W2950214027","https://openalex.org/W2965527147","https://openalex.org/W2968049758","https://openalex.org/W2971886410","https://openalex.org/W3000418784","https://openalex.org/W3005039133","https://openalex.org/W3134868369","https://openalex.org/W3135826815","https://openalex.org/W4302763879","https://openalex.org/W4308338901","https://openalex.org/W4316661315","https://openalex.org/W6650340375"],"related_works":["https://openalex.org/W2104335563","https://openalex.org/W2791399427","https://openalex.org/W2317775939","https://openalex.org/W2746127745","https://openalex.org/W2956935485","https://openalex.org/W2089145438","https://openalex.org/W2029580196","https://openalex.org/W2003932139","https://openalex.org/W2163661908","https://openalex.org/W3144682259"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}