{"id":"https://openalex.org/W2767503441","doi":"https://doi.org/10.1007/s11432-017-9254-2","title":"High energy proton and heavy ion induced single event transient in 65-nm CMOS technology","display_name":"High energy proton and heavy ion induced single event transient in 65-nm CMOS technology","publication_year":2017,"publication_date":"2017-11-06","ids":{"openalex":"https://openalex.org/W2767503441","doi":"https://doi.org/10.1007/s11432-017-9254-2","mag":"2767503441"},"language":"en","primary_location":{"id":"doi:10.1007/s11432-017-9254-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-017-9254-2","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100390375","display_name":"Jiaqi Liu","orcid":"https://orcid.org/0000-0003-1147-356X"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiaqi Liu","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030647669","display_name":"Yuanfu Zhao","orcid":"https://orcid.org/0000-0002-6786-6293"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]},{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanfu Zhao","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China","School of Astronautics, Harbin Institute of Technology, Harbin, 150001, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"School of Astronautics, Harbin Institute of Technology, Harbin, 150001, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100712623","display_name":"Liang Wang","orcid":"https://orcid.org/0000-0002-0061-5502"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100411794","display_name":"Dan Wang","orcid":"https://orcid.org/0000-0002-0921-2726"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112327073","display_name":"Hongchao Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongchao Zheng","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024414302","display_name":"Maoxin Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Maoxin Chen","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007723627","display_name":"Lei Shu","orcid":"https://orcid.org/0000-0002-6700-9347"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Shu","raw_affiliation_strings":["School of Astronautics, Harbin Institute of Technology, Harbin, 150001, China"],"affiliations":[{"raw_affiliation_string":"School of Astronautics, Harbin Institute of Technology, Harbin, 150001, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030683307","display_name":"Tongde Li","orcid":"https://orcid.org/0000-0002-8961-1531"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tongde Li","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049489861","display_name":"Dongqiang Li","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongqiang Li","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021035442","display_name":"Wei Guo","orcid":"https://orcid.org/0000-0001-9893-348X"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Guo","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing, 100076, China"],"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing, 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5100390375"],"corresponding_institution_ids":["https://openalex.org/I4210089056"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52414714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"60","issue":"12","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heavy-ion","display_name":"Heavy ion","score":0.8103402853012085},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7245740294456482},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7044008374214172},{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.6195616126060486},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5427501201629639},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5332037806510925},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4494568407535553},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.4354787766933441},{"id":"https://openalex.org/keywords/high-energy","display_name":"High energy","score":0.41807451844215393},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.36798083782196045},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3413183093070984},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.31102293729782104},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2556954324245453},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2445601224899292},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.23910218477249146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.21257424354553223},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19560861587524414},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14756488800048828},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.07431665062904358}],"concepts":[{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.8103402853012085},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7245740294456482},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7044008374214172},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.6195616126060486},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5427501201629639},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5332037806510925},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4494568407535553},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.4354787766933441},{"id":"https://openalex.org/C2985973956","wikidata":"https://www.wikidata.org/wiki/Q1617745","display_name":"High energy","level":2,"score":0.41807451844215393},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36798083782196045},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3413183093070984},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.31102293729782104},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2556954324245453},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2445601224899292},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.23910218477249146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21257424354553223},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19560861587524414},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14756488800048828},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.07431665062904358},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11432-017-9254-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-017-9254-2","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8199999928474426}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327480","display_name":"China Institute of Atomic Energy","ror":"https://ror.org/00v5gqm66"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2011116165","https://openalex.org/W2131796616","https://openalex.org/W2132620026","https://openalex.org/W2169173665","https://openalex.org/W2290255624","https://openalex.org/W2317806215","https://openalex.org/W2334937613"],"related_works":["https://openalex.org/W2393840644","https://openalex.org/W1490775144","https://openalex.org/W2058215919","https://openalex.org/W3122495436","https://openalex.org/W46044113","https://openalex.org/W2906063286","https://openalex.org/W4324351594","https://openalex.org/W2791280321","https://openalex.org/W607073267","https://openalex.org/W4236791600"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}