{"id":"https://openalex.org/W2592633366","doi":"https://doi.org/10.1007/s11432-016-9001-9","title":"Modeling the impact of process and operation variations on the soft error rate of digital circuits","display_name":"Modeling the impact of process and operation variations on the soft error rate of digital circuits","publication_year":2017,"publication_date":"2017-02-24","ids":{"openalex":"https://openalex.org/W2592633366","doi":"https://doi.org/10.1007/s11432-016-9001-9","mag":"2592633366"},"language":"en","primary_location":{"id":"doi:10.1007/s11432-016-9001-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-016-9001-9","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061502069","display_name":"Ruiqiang Song","orcid":"https://orcid.org/0000-0002-6171-343X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruiqiang Song","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100644317","display_name":"Shuming Chen","orcid":"https://orcid.org/0000-0003-4441-2202"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuming Chen","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032898373","display_name":"Bin Liang","orcid":"https://orcid.org/0000-0003-2655-9024"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liang","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073182850","display_name":"Yaqing Chi","orcid":"https://orcid.org/0000-0001-9299-963X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaqing Chi","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072504836","display_name":"Jianjun Chen","orcid":"https://orcid.org/0000-0003-0734-1660"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianjun Chen","raw_affiliation_strings":["College of Computer, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100644317"],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.5632,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.67589929,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"60","issue":"12","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8402349948883057},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5764679312705994},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5468175411224365},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5117825865745544},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4258255660533905},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4221963584423065},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.42066165804862976},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36599138379096985},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2511688470840454},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23498237133026123},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13193896412849426}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8402349948883057},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5764679312705994},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5468175411224365},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5117825865745544},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4258255660533905},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4221963584423065},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.42066165804862976},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36599138379096985},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2511688470840454},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23498237133026123},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13193896412849426},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11432-016-9001-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-016-9001-9","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1595732923","https://openalex.org/W1974429638","https://openalex.org/W1990742079","https://openalex.org/W1998687178","https://openalex.org/W2102130474","https://openalex.org/W2106229607","https://openalex.org/W2106760465","https://openalex.org/W2116597081","https://openalex.org/W2144160202","https://openalex.org/W2182428120","https://openalex.org/W2188530317","https://openalex.org/W2253565765","https://openalex.org/W2262190486","https://openalex.org/W2262638933"],"related_works":["https://openalex.org/W2090025763","https://openalex.org/W2535854306","https://openalex.org/W2796521923","https://openalex.org/W1996241861","https://openalex.org/W2170534122","https://openalex.org/W2166056129","https://openalex.org/W3179888111","https://openalex.org/W2594131496","https://openalex.org/W3141764359","https://openalex.org/W2041054332"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}