{"id":"https://openalex.org/W2007258849","doi":"https://doi.org/10.1007/s11432-013-4950-2","title":"Nanoscale triple-gate FinFET design considerations based on an analytical model of short-channel effects","display_name":"Nanoscale triple-gate FinFET design considerations based on an analytical model of short-channel effects","publication_year":2014,"publication_date":"2014-01-02","ids":{"openalex":"https://openalex.org/W2007258849","doi":"https://doi.org/10.1007/s11432-013-4950-2","mag":"2007258849"},"language":"en","primary_location":{"id":"doi:10.1007/s11432-013-4950-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-013-4950-2","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082326455","display_name":"Qian Xie","orcid":"https://orcid.org/0000-0002-5232-0298"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qian Xie","raw_affiliation_strings":["Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","Tsinghua University"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Tsinghua University","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088704824","display_name":"Renrong Liang","orcid":"https://orcid.org/0000-0002-0161-1802"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"RenRong Liang","raw_affiliation_strings":["Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","Tsinghua University"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Tsinghua University","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100378515","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0002-4364-264X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","Tsinghua University"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Tsinghua University","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100644189","display_name":"Libin Liu","orcid":"https://orcid.org/0000-0002-3777-1883"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"LiBin Liu","raw_affiliation_strings":["Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","Tsinghua University"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Tsinghua University","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062913047","display_name":"Jun Xu","orcid":"https://orcid.org/0000-0003-2345-0541"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Xu","raw_affiliation_strings":["Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","Tsinghua University"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information, Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Tsinghua University","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082326455"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6381,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72934614,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"57","issue":"4","first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanoscopic-scale","display_name":"Nanoscopic scale","score":0.704635500907898},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.6731815934181213},{"id":"https://openalex.org/keywords/fin","display_name":"Fin","score":0.49939489364624023},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4425085186958313},{"id":"https://openalex.org/keywords/boundary-value-problem","display_name":"Boundary value problem","score":0.41027650237083435},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3936583995819092},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3860952854156494},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37597963213920593},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.358553946018219},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3407704830169678},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.2850453555583954},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2584168016910553},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.24893319606781006},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.17095640301704407},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15493252873420715},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.06822696328163147}],"concepts":[{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.704635500907898},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.6731815934181213},{"id":"https://openalex.org/C91721477","wikidata":"https://www.wikidata.org/wiki/Q778612","display_name":"Fin","level":2,"score":0.49939489364624023},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4425085186958313},{"id":"https://openalex.org/C182310444","wikidata":"https://www.wikidata.org/wiki/Q1332643","display_name":"Boundary value problem","level":2,"score":0.41027650237083435},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3936583995819092},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3860952854156494},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37597963213920593},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.358553946018219},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3407704830169678},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.2850453555583954},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2584168016910553},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.24893319606781006},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.17095640301704407},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15493252873420715},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.06822696328163147},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11432-013-4950-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-013-4950-2","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1973421655","https://openalex.org/W1994102158","https://openalex.org/W2033591438","https://openalex.org/W2034669073","https://openalex.org/W2045025396","https://openalex.org/W2064484730","https://openalex.org/W2069286052","https://openalex.org/W2081493756","https://openalex.org/W2119327444","https://openalex.org/W2128626389","https://openalex.org/W2130194598","https://openalex.org/W2133747703","https://openalex.org/W2141137685","https://openalex.org/W2164880587"],"related_works":["https://openalex.org/W2092177242","https://openalex.org/W2019513361","https://openalex.org/W4295791167","https://openalex.org/W2000473227","https://openalex.org/W2389541158","https://openalex.org/W2965295431","https://openalex.org/W3155023655","https://openalex.org/W4280504320","https://openalex.org/W2382897531","https://openalex.org/W2891625659"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}