{"id":"https://openalex.org/W1972974936","doi":"https://doi.org/10.1007/s11432-011-4396-3","title":"Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs","display_name":"Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs","publication_year":2011,"publication_date":"2011-10-17","ids":{"openalex":"https://openalex.org/W1972974936","doi":"https://doi.org/10.1007/s11432-011-4396-3","mag":"1972974936"},"language":"en","primary_location":{"id":"doi:10.1007/s11432-011-4396-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-011-4396-3","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101907824","display_name":"Zhongming Wang","orcid":"https://orcid.org/0000-0001-7243-4893"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210151975","display_name":"Northwest Institute of Nuclear Technology","ror":"https://ror.org/04svrh266","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151975"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"ZhongMing Wang","raw_affiliation_strings":["Department of Engineering Physics, Tsinghua University, Beijing, 100084, China","Northwest Institute of Nuclear Technology, Xi\u2019an, 710024, China"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Physics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Northwest Institute of Nuclear Technology, Xi\u2019an, 710024, China","institution_ids":["https://openalex.org/I4210151975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103832517","display_name":"Zhibin Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210151975","display_name":"Northwest Institute of Nuclear Technology","ror":"https://ror.org/04svrh266","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151975"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"ZhiBin Yao","raw_affiliation_strings":["Northwest Institute of Nuclear Technology, Xi\u2019an, 710024, China"],"affiliations":[{"raw_affiliation_string":"Northwest Institute of Nuclear Technology, Xi\u2019an, 710024, China","institution_ids":["https://openalex.org/I4210151975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100538365","display_name":"Hongxia Guo","orcid":"https://orcid.org/0009-0006-9164-5868"},"institutions":[{"id":"https://openalex.org/I4210151975","display_name":"Northwest Institute of Nuclear Technology","ror":"https://ror.org/04svrh266","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151975"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"HongXia Guo","raw_affiliation_strings":["Northwest Institute of Nuclear Technology, Xi\u2019an, 710024, China"],"affiliations":[{"raw_affiliation_string":"Northwest Institute of Nuclear Technology, Xi\u2019an, 710024, China","institution_ids":["https://openalex.org/I4210151975"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101706102","display_name":"Min Lv","orcid":"https://orcid.org/0000-0003-3475-3628"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Lv","raw_affiliation_strings":["Department of Engineering Physics, Tsinghua University, Beijing, 100084, China"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Physics, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101907824"],"corresponding_institution_ids":["https://openalex.org/I4210151975","https://openalex.org/I99065089"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.5388,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.68809274,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"55","issue":"4","first_page":"971","last_page":"982"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bitstream","display_name":"Bitstream","score":0.9246407747268677},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7906086444854736},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7241602540016174},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.6931054592132568},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6272778511047363},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5761796236038208},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.570722758769989},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.45334526896476746},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4345044195652008},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.38972729444503784},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1351642608642578},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09681788086891174},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.08880338072776794}],"concepts":[{"id":"https://openalex.org/C136695289","wikidata":"https://www.wikidata.org/wiki/Q415568","display_name":"Bitstream","level":3,"score":0.9246407747268677},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7906086444854736},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7241602540016174},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.6931054592132568},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6272778511047363},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5761796236038208},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.570722758769989},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.45334526896476746},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4345044195652008},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.38972729444503784},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1351642608642578},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09681788086891174},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.08880338072776794}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11432-011-4396-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11432-011-4396-3","pdf_url":null,"source":{"id":"https://openalex.org/S4210218743","display_name":"Science China Information Sciences","issn_l":"1674-733X","issn":["1674-733X","1869-1919"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science China Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W261177573","https://openalex.org/W2021705882","https://openalex.org/W2061783171","https://openalex.org/W2104538659","https://openalex.org/W2107406097","https://openalex.org/W2126240789","https://openalex.org/W2127871209","https://openalex.org/W2134743663","https://openalex.org/W2153066308","https://openalex.org/W2164363068","https://openalex.org/W2275083152","https://openalex.org/W2599428882","https://openalex.org/W4207082007"],"related_works":["https://openalex.org/W1491404489","https://openalex.org/W3009852985","https://openalex.org/W2171823768","https://openalex.org/W3217774925","https://openalex.org/W2146311933","https://openalex.org/W1530804449","https://openalex.org/W2093752973","https://openalex.org/W3006277082","https://openalex.org/W3016958173","https://openalex.org/W1972974936"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}