{"id":"https://openalex.org/W2510235390","doi":"https://doi.org/10.1007/s11390-016-1670-2","title":"Prioritizing Test Cases for Memory Leaks in Android Applications","display_name":"Prioritizing Test Cases for Memory Leaks in Android Applications","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2510235390","doi":"https://doi.org/10.1007/s11390-016-1670-2","mag":"2510235390"},"language":"en","primary_location":{"id":"doi:10.1007/s11390-016-1670-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11390-016-1670-2","pdf_url":null,"source":{"id":"https://openalex.org/S161516442","display_name":"Journal of Computer Science and Technology","issn_l":"1000-9000","issn":["1000-9000","1860-4749"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computer Science and Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018865533","display_name":"Ju Qian","orcid":"https://orcid.org/0000-0001-8028-7213"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]},{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ju Qian","raw_affiliation_strings":["Collaborative Innovation Center of Novel Software Technology and Industrialization, Nanjing, 210023, China","College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China","State Key Laboratory of Software Engineering, Wuhan University, Wuhan, 430072, China"],"affiliations":[{"raw_affiliation_string":"Collaborative Innovation Center of Novel Software Technology and Industrialization, Nanjing, 210023, China","institution_ids":[]},{"raw_affiliation_string":"College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China","institution_ids":["https://openalex.org/I9842412"]},{"raw_affiliation_string":"State Key Laboratory of Software Engineering, Wuhan University, Wuhan, 430072, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014165895","display_name":"Di Zhou","orcid":"https://orcid.org/0000-0003-3560-7462"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Di Zhou","raw_affiliation_strings":["Collaborative Innovation Center of Novel Software Technology and Industrialization, Nanjing, 210023, China","College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China"],"affiliations":[{"raw_affiliation_string":"Collaborative Innovation Center of Novel Software Technology and Industrialization, Nanjing, 210023, China","institution_ids":[]},{"raw_affiliation_string":"College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China","institution_ids":["https://openalex.org/I9842412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5018865533"],"corresponding_institution_ids":["https://openalex.org/I37461747","https://openalex.org/I9842412"],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":3.473,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.92846271,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"31","issue":"5","first_page":"869","last_page":"882"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8735966682434082},{"id":"https://openalex.org/keywords/memory-leak","display_name":"Memory leak","score":0.855884313583374},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.4702790081501007},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4060654640197754},{"id":"https://openalex.org/keywords/memory-management","display_name":"Memory management","score":0.34546488523483276},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33409130573272705},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3239191174507141},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.3039870262145996},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.20977792143821716},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.165339857339859}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8735966682434082},{"id":"https://openalex.org/C156731835","wikidata":"https://www.wikidata.org/wiki/Q751740","display_name":"Memory leak","level":4,"score":0.855884313583374},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.4702790081501007},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4060654640197754},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.34546488523483276},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33409130573272705},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3239191174507141},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.3039870262145996},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.20977792143821716},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.165339857339859},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11390-016-1670-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11390-016-1670-2","pdf_url":null,"source":{"id":"https://openalex.org/S161516442","display_name":"Journal of Computer Science and Technology","issn_l":"1000-9000","issn":["1000-9000","1860-4749"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computer Science and Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W176206521","https://openalex.org/W1510358061","https://openalex.org/W1537003042","https://openalex.org/W1825733274","https://openalex.org/W1971198057","https://openalex.org/W1973108383","https://openalex.org/W1973702655","https://openalex.org/W1973913856","https://openalex.org/W1992841501","https://openalex.org/W1995295735","https://openalex.org/W1996284269","https://openalex.org/W1996567876","https://openalex.org/W2012886500","https://openalex.org/W2014433051","https://openalex.org/W2038965378","https://openalex.org/W2047221353","https://openalex.org/W2066421240","https://openalex.org/W2072754671","https://openalex.org/W2083318332","https://openalex.org/W2105204977","https://openalex.org/W2119424404","https://openalex.org/W2157579724","https://openalex.org/W2166140339","https://openalex.org/W2290396244","https://openalex.org/W2396077939","https://openalex.org/W3114516458","https://openalex.org/W3148956615","https://openalex.org/W4237256801","https://openalex.org/W4237257431","https://openalex.org/W4238014149","https://openalex.org/W4242643584","https://openalex.org/W4247690037","https://openalex.org/W4249549806","https://openalex.org/W4253882112","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W1527178015","https://openalex.org/W4205389607","https://openalex.org/W3009635326","https://openalex.org/W2369939492","https://openalex.org/W2354523724","https://openalex.org/W3120203352","https://openalex.org/W2103855074","https://openalex.org/W2795338679","https://openalex.org/W2923436575","https://openalex.org/W2389703372"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}