{"id":"https://openalex.org/W2169243876","doi":"https://doi.org/10.1007/s11390-007-9089-4","title":"Low Cost Scan Test by Test Correlation Utilization","display_name":"Low Cost Scan Test by Test Correlation Utilization","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W2169243876","doi":"https://doi.org/10.1007/s11390-007-9089-4","mag":"2169243876"},"language":"en","primary_location":{"id":"doi:10.1007/s11390-007-9089-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11390-007-9089-4","pdf_url":null,"source":{"id":"https://openalex.org/S161516442","display_name":"Journal of Computer Science and Technology","issn_l":"1000-9000","issn":["1000-9000","1860-4749"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computer Science and Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":true,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["Mathematics and Computer Science Department, Kuwait University, Safat, Kuwait"],"affiliations":[{"raw_affiliation_string":"Mathematics and Computer Science Department, Kuwait University, Safat, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5059987567"],"corresponding_institution_ids":["https://openalex.org/I36721946"],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":0.3249,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.66760291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"5","first_page":"681","last_page":"694"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.8605262041091919},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8182420134544373},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7768650054931641},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.707529604434967},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5666359663009644},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5336065888404846},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4627106189727783},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.38059818744659424},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.307535320520401},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.26049232482910156},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2140050232410431},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08550432324409485}],"concepts":[{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.8605262041091919},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8182420134544373},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7768650054931641},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.707529604434967},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5666359663009644},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5336065888404846},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4627106189727783},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.38059818744659424},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.307535320520401},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.26049232482910156},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2140050232410431},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08550432324409485},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11390-007-9089-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11390-007-9089-4","pdf_url":null,"source":{"id":"https://openalex.org/S161516442","display_name":"Journal of Computer Science and Technology","issn_l":"1000-9000","issn":["1000-9000","1860-4749"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computer Science and Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1557475698","https://openalex.org/W1763985980","https://openalex.org/W2011039300","https://openalex.org/W2080510479","https://openalex.org/W2099814124","https://openalex.org/W2107800433","https://openalex.org/W2122955150","https://openalex.org/W2126641963","https://openalex.org/W2126693329","https://openalex.org/W2148192475","https://openalex.org/W2150860197","https://openalex.org/W2152406824","https://openalex.org/W2164719222","https://openalex.org/W2167571917","https://openalex.org/W2587271961"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2075356617","https://openalex.org/W1974621628","https://openalex.org/W2074302528","https://openalex.org/W2092894550","https://openalex.org/W3088373974","https://openalex.org/W2157212570"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}