{"id":"https://openalex.org/W2010997099","doi":"https://doi.org/10.1007/s11265-013-0736-4","title":"Priority Based Error Correction Code (ECC) for the Embedded SRAM Memories in H.264 System","display_name":"Priority Based Error Correction Code (ECC) for the Embedded SRAM Memories in H.264 System","publication_year":2013,"publication_date":"2013-03-12","ids":{"openalex":"https://openalex.org/W2010997099","doi":"https://doi.org/10.1007/s11265-013-0736-4","mag":"2010997099"},"language":"en","primary_location":{"id":"doi:10.1007/s11265-013-0736-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11265-013-0736-4","pdf_url":null,"source":{"id":"https://openalex.org/S11258463","display_name":"Journal of Signal Processing Systems","issn_l":"1939-8018","issn":["1939-8018","1939-8115"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Signal Processing Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069325751","display_name":"In-Soo Lee","orcid":"https://orcid.org/0000-0001-9773-4710"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Insoo Lee","raw_affiliation_strings":["Research & Development, SK Hynix Semiconductor Inc., Gyeonggi-do, Korea"],"affiliations":[{"raw_affiliation_string":"Research & Development, SK Hynix Semiconductor Inc., Gyeonggi-do, Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102153086","display_name":"Jinmo Kwon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131320","display_name":"LG (South Korea)","ror":"https://ror.org/03ddh2c27","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210131320"]},{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Jinmo Kwon","raw_affiliation_strings":["SoC Advanced Technology Group, LG Electronics Corporation, Seoul, Korea","SoC Advanced Technology Group, LG Electronics Corporation, Seoul, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"SoC Advanced Technology Group, LG Electronics Corporation, Seoul, Korea","institution_ids":["https://openalex.org/I4210131320"]},{"raw_affiliation_string":"SoC Advanced Technology Group, LG Electronics Corporation, Seoul, Korea#TAB#","institution_ids":["https://openalex.org/I2818286"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080512264","display_name":"Jangwon Park","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jangwon Park","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, Korea","School of Electrical Eng., Korea University, Seoul, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Eng., Korea University, Seoul, Korea#TAB#","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101839916","display_name":"Jongsun Park","orcid":"https://orcid.org/0000-0003-3251-0024"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongsun Park","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, Korea","School of Electrical Eng., Korea University, Seoul, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Eng., Korea University, Seoul, Korea#TAB#","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5069325751"],"corresponding_institution_ids":["https://openalex.org/I134353371"],"apc_list":{"value":2490,"currency":"EUR","value_usd":3090},"apc_paid":null,"fwci":1.4416,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.83494335,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"73","issue":"2","first_page":"123","last_page":"136"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5980937480926514},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5979201793670654},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.5832193493843079},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5105675458908081},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4337502717971802},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.36936885118484497},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.3575114607810974},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33901315927505493},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.28465700149536133},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22348961234092712},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1440868377685547}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5980937480926514},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5979201793670654},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5832193493843079},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5105675458908081},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4337502717971802},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.36936885118484497},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3575114607810974},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33901315927505493},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.28465700149536133},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22348961234092712},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1440868377685547},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11265-013-0736-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11265-013-0736-4","pdf_url":null,"source":{"id":"https://openalex.org/S11258463","display_name":"Journal of Signal Processing Systems","issn_l":"1939-8018","issn":["1939-8018","1939-8115"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Signal Processing Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1966156115","https://openalex.org/W1994500166","https://openalex.org/W2002612140","https://openalex.org/W2050154044","https://openalex.org/W2059977232","https://openalex.org/W2085898298","https://openalex.org/W2098688943","https://openalex.org/W2105175332","https://openalex.org/W2115547150","https://openalex.org/W2126221193","https://openalex.org/W2127558904","https://openalex.org/W2143137068","https://openalex.org/W2144289559","https://openalex.org/W2159867632","https://openalex.org/W2162211138","https://openalex.org/W2166243422","https://openalex.org/W4234572373","https://openalex.org/W6648947104"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}