{"id":"https://openalex.org/W7152023380","doi":"https://doi.org/10.1007/s11227-026-08373-0","title":"Dependability analysis and hardening of vision transformers against soft errors","display_name":"Dependability analysis and hardening of vision transformers against soft errors","publication_year":2026,"publication_date":"2026-04-08","ids":{"openalex":"https://openalex.org/W7152023380","doi":"https://doi.org/10.1007/s11227-026-08373-0"},"language":"en","primary_location":{"id":"doi:10.1007/s11227-026-08373-0","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s11227-026-08373-0","pdf_url":null,"source":{"id":"https://openalex.org/S32326811","display_name":"The Journal of Supercomputing","issn_l":"0920-8542","issn":["0920-8542","1573-0484"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Supercomputing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1007/s11227-026-08373-0","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116075052","display_name":"Lester Frias-Dominguez","orcid":null},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Lester Frias-Dominguez","raw_affiliation_strings":["Depto. de Tecnolog\u00eda Electr\u00f3nica, Universidad Carlos III de Madrid, Avda Universidad, 30, 28911, Legan\u00e9s, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Depto. de Tecnolog\u00eda Electr\u00f3nica, Universidad Carlos III de Madrid, Avda Universidad, 30, 28911, Legan\u00e9s, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124734953","display_name":"Jos\u00e9 M. Bad\u00eda","orcid":null},"institutions":[{"id":"https://openalex.org/I10902133","display_name":"Universitat Jaume I","ror":"https://ror.org/02ws1xc11","country_code":"ES","type":"education","lineage":["https://openalex.org/I10902133"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jose M. Badia","raw_affiliation_strings":["Depto. de Ingenier\u00eda y Ciencia de Computadores, Universitat Jaume I de Castell\u00f3n, Avda. Sos Baynat, s/n, 12071, Castell\u00f3n de la Plana, Castell\u00f3n, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Depto. de Ingenier\u00eda y Ciencia de Computadores, Universitat Jaume I de Castell\u00f3n, Avda. Sos Baynat, s/n, 12071, Castell\u00f3n de la Plana, Castell\u00f3n, Spain","institution_ids":["https://openalex.org/I10902133"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124695757","display_name":"Germ\u00e1n Le\u00f3n","orcid":null},"institutions":[{"id":"https://openalex.org/I10902133","display_name":"Universitat Jaume I","ror":"https://ror.org/02ws1xc11","country_code":"ES","type":"education","lineage":["https://openalex.org/I10902133"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"German Leon","raw_affiliation_strings":["Depto. de Ingenier\u00eda y Ciencia de Computadores, Universitat Jaume I de Castell\u00f3n, Avda. Sos Baynat, s/n, 12071, Castell\u00f3n de la Plana, Castell\u00f3n, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Depto. de Ingenier\u00eda y Ciencia de Computadores, Universitat Jaume I de Castell\u00f3n, Avda. Sos Baynat, s/n, 12071, Castell\u00f3n de la Plana, Castell\u00f3n, Spain","institution_ids":["https://openalex.org/I10902133"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034535240","display_name":"Adri\u00e1n Amor-Mart\u00edn","orcid":"https://orcid.org/0000-0002-6123-4324"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Adrian Amor-Martin","raw_affiliation_strings":["Depto. Teor\u00eda de la Se\u00f1al y Comunicaciones, Universidad Carlos III de Madrid, Avda Universidad 30, 28911, Legan\u00e9s, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Depto. Teor\u00eda de la Se\u00f1al y Comunicaciones, Universidad Carlos III de Madrid, Avda Universidad 30, 28911, Legan\u00e9s, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056031998","display_name":"Jose A. Belloch","orcid":"https://orcid.org/0000-0002-2595-1828"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jose A. Belloch","raw_affiliation_strings":["Depto. de Tecnolog\u00eda Electr\u00f3nica, Universidad Carlos III de Madrid, Avda Universidad, 30, 28911, Legan\u00e9s, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Depto. de Tecnolog\u00eda Electr\u00f3nica, Universidad Carlos III de Madrid, Avda Universidad, 30, 28911, Legan\u00e9s, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5124695757"],"corresponding_institution_ids":["https://openalex.org/I10902133"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.57840898,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"82","issue":"5","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.8892999887466431,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.8892999887466431,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.03709999844431877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.008100000210106373,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7491000294685364},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5776000022888184},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5253000259399414},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4404999911785126},{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization (sociology)","score":0.4300999939441681},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.40209999680519104},{"id":"https://openalex.org/keywords/soft-computing","display_name":"Soft computing","score":0.3596999943256378},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.3481999933719635}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8282999992370605},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7491000294685364},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5776000022888184},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5253000259399414},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5026000142097473},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4404999911785126},{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.4300999939441681},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.40209999680519104},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3675999939441681},{"id":"https://openalex.org/C140073362","wikidata":"https://www.wikidata.org/wiki/Q738759","display_name":"Soft computing","level":3,"score":0.3596999943256378},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.3481999933719635},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.3416999876499176},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.3352999985218048},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.31929999589920044},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.3192000091075897},{"id":"https://openalex.org/C2776848632","wikidata":"https://www.wikidata.org/wiki/Q853463","display_name":"Clipping (morphology)","level":2,"score":0.3181999921798706},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.3012000024318695},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.30090001225471497},{"id":"https://openalex.org/C167063184","wikidata":"https://www.wikidata.org/wiki/Q1400839","display_name":"Vulnerability assessment","level":3,"score":0.288100004196167},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.2678999900817871},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2628999948501587},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2508000135421753}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11227-026-08373-0","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s11227-026-08373-0","pdf_url":null,"source":{"id":"https://openalex.org/S32326811","display_name":"The Journal of Supercomputing","issn_l":"0920-8542","issn":["0920-8542","1573-0484"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Supercomputing","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s11227-026-08373-0","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s11227-026-08373-0","pdf_url":null,"source":{"id":"https://openalex.org/S32326811","display_name":"The Journal of Supercomputing","issn_l":"0920-8542","issn":["0920-8542","1573-0484"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Supercomputing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2475792070","display_name":null,"funder_award_id":"PID2022-137048OA-C43","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"}],"funders":[{"id":"https://openalex.org/F4320322930","display_name":"Ministerio de Ciencia e Innovaci\u00f3n","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1559826639","https://openalex.org/W2099569658","https://openalex.org/W2108598243","https://openalex.org/W2748528844","https://openalex.org/W2766252899","https://openalex.org/W2767260595","https://openalex.org/W2800017313","https://openalex.org/W2889973014","https://openalex.org/W2901848761","https://openalex.org/W2907882680","https://openalex.org/W2927956055","https://openalex.org/W2946794439","https://openalex.org/W2967483844","https://openalex.org/W2989569745","https://openalex.org/W3012167292","https://openalex.org/W3096295711","https://openalex.org/W3128592650","https://openalex.org/W3135074210","https://openalex.org/W3175306798","https://openalex.org/W4206706211","https://openalex.org/W4312311617","https://openalex.org/W4387385773","https://openalex.org/W4390145134","https://openalex.org/W4390576801","https://openalex.org/W4392278819","https://openalex.org/W4392467945","https://openalex.org/W4397124197","https://openalex.org/W4399120293","https://openalex.org/W4402157906","https://openalex.org/W4403664145","https://openalex.org/W4404955136","https://openalex.org/W4406949264","https://openalex.org/W4411055125","https://openalex.org/W4411651461"],"related_works":[],"abstract_inverted_index":{"Abstract":[0],"The":[1,154],"deployment":[2],"of":[3,14,35,67,103,151],"Vision":[4],"Transformers":[5],"(ViTs)":[6],"in":[7],"safety-critical":[8],"domains":[9],"needs":[10],"a":[11,32,44,88,91],"clear":[12],"understanding":[13],"their":[15,21],"resilience":[16],"to":[17,77,112,135],"soft":[18,41,113],"errors,":[19],"since":[20],"specific":[22],"layer-level":[23],"vulnerabilities":[24],"are":[25],"currently":[26],"insufficiently":[27],"characterized.":[28],"This":[29],"work":[30,120],"presents":[31],"dependability":[33],"analysis":[34],"the":[36,54,61,68,74,101,119],"ViT-Base":[37],"architecture":[38],"against":[39],"injection-induced":[40],"errors.":[42,114],"Using":[43],"high-fidelity,":[45],"software-level":[46],"fault":[47],"injection":[48],"methodology":[49],"with":[50],"custom":[51],"CUDA":[52],"kernels,":[53],"study":[55],"injects":[56],"random":[57],"bit-flips":[58],"directly":[59],"into":[60],"IEEE":[62],"754":[63],"binary32":[64],"floating-point":[65],"representation":[66],"intermediate":[69],"data":[70],"tensors":[71],"resulting":[72],"from":[73],"Transformer":[75],"modules":[76],"quantify":[78],"model":[79,164],"accuracy":[80],"degradation":[81],"across":[82,94],"increasing":[83],"bit":[84],"error":[85],"rates.":[86],"As":[87],"primary":[89],"result,":[90],"vulnerability":[92],"map":[93],"ViT":[95],"layers":[96,108],"is":[97],"presented,":[98],"confirming":[99],"that":[100,157],"results":[102],"normalization":[104],"and":[105,133,149],"fully":[106],"connected":[107],"exhibit":[109],"critical":[110],"sensitivity":[111],"To":[115],"address":[116],"these":[117,158],"vulnerabilities,":[118],"evaluates":[121],"targeted":[122],"hardening":[123],"strategies.":[124],"These":[125],"include":[126],"Fault-Aware":[127],"Training":[128],"(FAT),":[129],"applied":[130],"both":[131],"globally":[132],"selectively":[134],"linear":[136],"layers,":[137],"as":[138,140,145],"well":[139],"practical":[141],"runtime":[142],"mitigations":[143],"such":[144],"range-based":[146],"value":[147],"clipping":[148],"filtering":[150],"non-numeric":[152],"values.":[153],"findings":[155],"demonstrate":[156],"software-only":[159],"approaches":[160],"can":[161],"significantly":[162],"protect":[163],"accuracy.":[165]},"counts_by_year":[],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2026-04-09T00:00:00"}