{"id":"https://openalex.org/W7130952327","doi":"https://doi.org/10.1007/s11227-026-08335-6","title":"A low-complexity and lightweight detection network for surface defects on liquid crystal display","display_name":"A low-complexity and lightweight detection network for surface defects on liquid crystal display","publication_year":2026,"publication_date":"2026-02-22","ids":{"openalex":"https://openalex.org/W7130952327","doi":"https://doi.org/10.1007/s11227-026-08335-6"},"language":"en","primary_location":{"id":"doi:10.1007/s11227-026-08335-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11227-026-08335-6","pdf_url":null,"source":{"id":"https://openalex.org/S32326811","display_name":"The Journal of Supercomputing","issn_l":"0920-8542","issn":["0920-8542","1573-0484"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Supercomputing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021834925","display_name":"Guanqiang Ruan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guanqiang Ruan","raw_affiliation_strings":["College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126566201","display_name":"Zewei Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zewei Liao","raw_affiliation_strings":["College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074239347","display_name":"Honggang Shan","orcid":"https://orcid.org/0000-0001-7256-7952"},"institutions":[{"id":"https://openalex.org/I4210102827","display_name":"Shanghai Customs College","ror":"https://ror.org/01agvej60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210102827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honggang Shan","raw_affiliation_strings":["Technical Center for Mechanical and Electrical Product Inspection and Testing of Shanghai Customs District, Shanghai, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical Center for Mechanical and Electrical Product Inspection and Testing of Shanghai Customs District, Shanghai, 201210, China","institution_ids":["https://openalex.org/I4210102827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055094886","display_name":"Yilin Ni","orcid":"https://orcid.org/0009-0002-0473-9219"},"institutions":[{"id":"https://openalex.org/I4210102827","display_name":"Shanghai Customs College","ror":"https://ror.org/01agvej60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210102827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yilin Ni","raw_affiliation_strings":["Technical Center for Mechanical and Electrical Product Inspection and Testing of Shanghai Customs District, Shanghai, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical Center for Mechanical and Electrical Product Inspection and Testing of Shanghai Customs District, Shanghai, 201210, China","institution_ids":["https://openalex.org/I4210102827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126563815","display_name":"Long Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Chen","raw_affiliation_strings":["College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126567715","display_name":"Xiangdong Kong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangdong Kong","raw_affiliation_strings":["College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033524819","display_name":"Kuo Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kuo Yang","raw_affiliation_strings":["College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering, Shanghai Dianji University, Shanghai, 201306, China","institution_ids":["https://openalex.org/I4210156189"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5126566201"],"corresponding_institution_ids":["https://openalex.org/I4210156189"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.171517,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"82","issue":"4","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.5116000175476074,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.5116000175476074,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.4361000061035156,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.009499999694526196,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.6428999900817871},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.6407999992370605},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6237999796867371},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.6139000058174133},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.590499997138977},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.48809999227523804},{"id":"https://openalex.org/keywords/shared-resource","display_name":"Shared resource","score":0.3865000009536743},{"id":"https://openalex.org/keywords/low-latency","display_name":"Low latency (capital markets)","score":0.35670000314712524}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8531000018119812},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.6428999900817871},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.6407999992370605},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6237999796867371},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.6139000058174133},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.590499997138977},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.48809999227523804},{"id":"https://openalex.org/C51332947","wikidata":"https://www.wikidata.org/wiki/Q1172305","display_name":"Shared resource","level":2,"score":0.3865000009536743},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3750999867916107},{"id":"https://openalex.org/C46637626","wikidata":"https://www.wikidata.org/wiki/Q6693015","display_name":"Low latency (capital markets)","level":2,"score":0.35670000314712524},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3472000062465668},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.334199994802475},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3257000148296356},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.31029999256134033},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3066999912261963},{"id":"https://openalex.org/C2778915421","wikidata":"https://www.wikidata.org/wiki/Q3643177","display_name":"Performance improvement","level":2,"score":0.30160000920295715},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.29899999499320984},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29170000553131104},{"id":"https://openalex.org/C3018263672","wikidata":"https://www.wikidata.org/wiki/Q1296251","display_name":"Efficient algorithm","level":2,"score":0.28690001368522644},{"id":"https://openalex.org/C106515295","wikidata":"https://www.wikidata.org/wiki/Q26806595","display_name":"Parallel processing","level":2,"score":0.2847000062465668},{"id":"https://openalex.org/C206345919","wikidata":"https://www.wikidata.org/wiki/Q20380951","display_name":"Resource (disambiguation)","level":2,"score":0.2816999852657318},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.2660999894142151},{"id":"https://openalex.org/C19012869","wikidata":"https://www.wikidata.org/wiki/Q578372","display_name":"Response time","level":2,"score":0.2596000134944916},{"id":"https://openalex.org/C2989134064","wikidata":"https://www.wikidata.org/wiki/Q288510","display_name":"Execution time","level":2,"score":0.25780001282691956},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.251800000667572}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11227-026-08335-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11227-026-08335-6","pdf_url":null,"source":{"id":"https://openalex.org/S32326811","display_name":"The Journal of Supercomputing","issn_l":"0920-8542","issn":["0920-8542","1573-0484"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Journal of Supercomputing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.42398837208747864,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1884395441","https://openalex.org/W2115403315","https://openalex.org/W2193145675","https://openalex.org/W2531409750","https://openalex.org/W2904559969","https://openalex.org/W2917743137","https://openalex.org/W2963037989","https://openalex.org/W2963163009","https://openalex.org/W3003509762","https://openalex.org/W3012374719","https://openalex.org/W3032016692","https://openalex.org/W3034971973","https://openalex.org/W3087751617","https://openalex.org/W3152576252","https://openalex.org/W3164104137","https://openalex.org/W3176482836","https://openalex.org/W4225321635","https://openalex.org/W4237315170","https://openalex.org/W4307705289","https://openalex.org/W4321062407","https://openalex.org/W4322733148","https://openalex.org/W4360838197","https://openalex.org/W4385521700","https://openalex.org/W4386076325","https://openalex.org/W4386076539","https://openalex.org/W4387653441","https://openalex.org/W4388995920","https://openalex.org/W4391002640","https://openalex.org/W4392511248","https://openalex.org/W4396545724","https://openalex.org/W4399102931","https://openalex.org/W4399358334","https://openalex.org/W4399572614","https://openalex.org/W4399946473","https://openalex.org/W4402727675","https://openalex.org/W4402754006","https://openalex.org/W4403770406","https://openalex.org/W4404199198","https://openalex.org/W4404594535","https://openalex.org/W4406207672","https://openalex.org/W4411090683","https://openalex.org/W4412371319","https://openalex.org/W4413147183","https://openalex.org/W4415118302","https://openalex.org/W4415622589"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-02-23T06:24:36.507609","created_date":"2026-02-23T00:00:00"}