{"id":"https://openalex.org/W2913863212","doi":"https://doi.org/10.1007/s11219-019-9440-3","title":"Fault model-driven testing from FSM with symbolic inputs","display_name":"Fault model-driven testing from FSM with symbolic inputs","publication_year":2019,"publication_date":"2019-01-29","ids":{"openalex":"https://openalex.org/W2913863212","doi":"https://doi.org/10.1007/s11219-019-9440-3","mag":"2913863212"},"language":"en","primary_location":{"id":"doi:10.1007/s11219-019-9440-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11219-019-9440-3","pdf_url":null,"source":{"id":"https://openalex.org/S7504070","display_name":"Software Quality Journal","issn_l":"0963-9314","issn":["0963-9314","1573-1367"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Software Quality Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050633462","display_name":"Omer Nguena Timo","orcid":"https://orcid.org/0000-0002-8336-6600"},"institutions":[{"id":"https://openalex.org/I4210111842","display_name":"Computer Research Institute of Montr\u00e9al","ror":"https://ror.org/0279d5115","country_code":"CA","type":"nonprofit","lineage":["https://openalex.org/I4210111842"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Omer Nguena Timo","raw_affiliation_strings":["Computer Research Institute of Montreal - CRIM, 405 Avenue Ogilvy Suite 101, H3N 1M3, QC, Montreal, Canada"],"affiliations":[{"raw_affiliation_string":"Computer Research Institute of Montreal - CRIM, 405 Avenue Ogilvy Suite 101, H3N 1M3, QC, Montreal, Canada","institution_ids":["https://openalex.org/I4210111842"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079848365","display_name":"Alexandre Petrenko","orcid":"https://orcid.org/0000-0002-2938-1666"},"institutions":[{"id":"https://openalex.org/I4210111842","display_name":"Computer Research Institute of Montr\u00e9al","ror":"https://ror.org/0279d5115","country_code":"CA","type":"nonprofit","lineage":["https://openalex.org/I4210111842"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Alexandre Petrenko","raw_affiliation_strings":["Computer Research Institute of Montreal - CRIM, 405 Avenue Ogilvy Suite 101, H3N 1M3, QC, Montreal, Canada"],"affiliations":[{"raw_affiliation_string":"Computer Research Institute of Montreal - CRIM, 405 Avenue Ogilvy Suite 101, H3N 1M3, QC, Montreal, Canada","institution_ids":["https://openalex.org/I4210111842"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081333705","display_name":"S. Ramesh","orcid":"https://orcid.org/0000-0003-1361-8224"},"institutions":[{"id":"https://openalex.org/I4210113932","display_name":"Materials Systems (United States)","ror":"https://ror.org/027smmx64","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113932"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Ramesh","raw_affiliation_strings":["GM Global R&D, Warren, MI, 48092, USA"],"affiliations":[{"raw_affiliation_string":"GM Global R&D, Warren, MI, 48092, USA","institution_ids":["https://openalex.org/I4210113932"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5050633462"],"corresponding_institution_ids":["https://openalex.org/I4210111842"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.3346,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6132016,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"27","issue":"2","first_page":"501","last_page":"527"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-state-machine","display_name":"Finite-state machine","score":0.6573079228401184},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.6321794986724854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6195977926254272},{"id":"https://openalex.org/keywords/symbolic-execution","display_name":"Symbolic execution","score":0.5881909728050232},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.5435312986373901},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4968290627002716},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.47417986392974854},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47228723764419556},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.46341508626937866},{"id":"https://openalex.org/keywords/model-based-testing","display_name":"Model-based testing","score":0.4519186317920685},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.4369589388370514},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4338020384311676},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4254096448421478},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.4122796654701233},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.410831093788147},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.4089277982711792},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.39082977175712585},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.23796311020851135},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20892348885536194},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.12302631139755249}],"concepts":[{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.6573079228401184},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.6321794986724854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6195977926254272},{"id":"https://openalex.org/C2779639559","wikidata":"https://www.wikidata.org/wiki/Q7661178","display_name":"Symbolic execution","level":3,"score":0.5881909728050232},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.5435312986373901},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4968290627002716},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.47417986392974854},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47228723764419556},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.46341508626937866},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.4519186317920685},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.4369589388370514},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4338020384311676},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4254096448421478},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.4122796654701233},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.410831093788147},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.4089277982711792},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.39082977175712585},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.23796311020851135},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20892348885536194},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.12302631139755249},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11219-019-9440-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11219-019-9440-3","pdf_url":null,"source":{"id":"https://openalex.org/S7504070","display_name":"Software Quality Journal","issn_l":"0963-9314","issn":["0963-9314","1573-1367"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Software Quality Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W197240239","https://openalex.org/W1480909796","https://openalex.org/W1499058580","https://openalex.org/W1517875420","https://openalex.org/W1518705996","https://openalex.org/W1593785926","https://openalex.org/W1602045049","https://openalex.org/W1865015270","https://openalex.org/W1975214745","https://openalex.org/W2031525781","https://openalex.org/W2049695835","https://openalex.org/W2070633450","https://openalex.org/W2082172430","https://openalex.org/W2101623441","https://openalex.org/W2119296494","https://openalex.org/W2128475506","https://openalex.org/W2132069557","https://openalex.org/W2135841285","https://openalex.org/W2169593191","https://openalex.org/W2170064878","https://openalex.org/W2174629870","https://openalex.org/W2177749723","https://openalex.org/W2294578573","https://openalex.org/W2330945886","https://openalex.org/W2399876608","https://openalex.org/W2460620709","https://openalex.org/W2505782975","https://openalex.org/W2528313862","https://openalex.org/W2549482734","https://openalex.org/W2606562016","https://openalex.org/W2754069136","https://openalex.org/W2755546362","https://openalex.org/W2763952729","https://openalex.org/W6629807975","https://openalex.org/W6635474541","https://openalex.org/W6744015411"],"related_works":["https://openalex.org/W2009637593","https://openalex.org/W4242148730","https://openalex.org/W2127350021","https://openalex.org/W2018145554","https://openalex.org/W1480521623","https://openalex.org/W2061183036","https://openalex.org/W207264427","https://openalex.org/W1600260729","https://openalex.org/W2133869707","https://openalex.org/W52853052"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
