{"id":"https://openalex.org/W1999069798","doi":"https://doi.org/10.1007/s11219-005-6214-x","title":"The Efficiency of Critical Slicing in Fault Localization","display_name":"The Efficiency of Critical Slicing in Fault Localization","publication_year":2005,"publication_date":"2005-04-19","ids":{"openalex":"https://openalex.org/W1999069798","doi":"https://doi.org/10.1007/s11219-005-6214-x","mag":"1999069798"},"language":"en","primary_location":{"id":"doi:10.1007/s11219-005-6214-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11219-005-6214-x","pdf_url":null,"source":{"id":"https://openalex.org/S7504070","display_name":"Software Quality Journal","issn_l":"0963-9314","issn":["0963-9314","1573-1367"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Software Quality Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048391431","display_name":"Zuhoor Al-Khanjari","orcid":"https://orcid.org/0000-0002-3960-2784"},"institutions":[{"id":"https://openalex.org/I47818738","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47","country_code":"OM","type":"education","lineage":["https://openalex.org/I47818738"]}],"countries":["OM"],"is_corresponding":true,"raw_author_name":"Z. A. Al-Khanjari","raw_affiliation_strings":["Computer Science Department, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123, Sultanate of Oman","Computer Science Department, Sultan Qaboos University, Sultanate of Oman#TAB#"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123, Sultanate of Oman","institution_ids":["https://openalex.org/I47818738"]},{"raw_affiliation_string":"Computer Science Department, Sultan Qaboos University, Sultanate of Oman#TAB#","institution_ids":["https://openalex.org/I47818738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112242034","display_name":"Martin R. Woodward","orcid":null},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"M. R. Woodward","raw_affiliation_strings":["Department of Computer Science, University of Liverpool, Chadwick Building, Peach Street, Liverpool, L69 7ZF, UK","Department of Computer Science, University of Liverpool, Chadwick Building, Liverpool, UK L69 7ZF"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Liverpool, Chadwick Building, Peach Street, Liverpool, L69 7ZF, UK","institution_ids":["https://openalex.org/I146655781"]},{"raw_affiliation_string":"Department of Computer Science, University of Liverpool, Chadwick Building, Liverpool, UK L69 7ZF","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109959782","display_name":"Haider Ali Ramadhan","orcid":null},"institutions":[{"id":"https://openalex.org/I47818738","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47","country_code":"OM","type":"education","lineage":["https://openalex.org/I47818738"]}],"countries":["OM"],"is_corresponding":false,"raw_author_name":"Haider Ali Ramadhan","raw_affiliation_strings":["Computer Science Department, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123, Sultanate of Oman","Computer Science Department, Sultan Qaboos University, Sultanate of Oman#TAB#"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123, Sultanate of Oman","institution_ids":["https://openalex.org/I47818738"]},{"raw_affiliation_string":"Computer Science Department, Sultan Qaboos University, Sultanate of Oman#TAB#","institution_ids":["https://openalex.org/I47818738"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055594225","display_name":"Narayana Swamy Kutti","orcid":null},"institutions":[{"id":"https://openalex.org/I47818738","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47","country_code":"OM","type":"education","lineage":["https://openalex.org/I47818738"]}],"countries":["OM"],"is_corresponding":false,"raw_author_name":"N. S. Kutti","raw_affiliation_strings":["Computer Science Department, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123, Sultanate of Oman","Computer Science Department, Sultan Qaboos University, Sultanate of Oman#TAB#"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123, Sultanate of Oman","institution_ids":["https://openalex.org/I47818738"]},{"raw_affiliation_string":"Computer Science Department, Sultan Qaboos University, Sultanate of Oman#TAB#","institution_ids":["https://openalex.org/I47818738"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5048391431"],"corresponding_institution_ids":["https://openalex.org/I47818738"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.18223419,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"13","issue":"2","first_page":"129","last_page":"153"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/program-slicing","display_name":"Program slicing","score":0.8762486577033997},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7501413226127625},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6947299838066101},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.581451416015625},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.534899115562439},{"id":"https://openalex.org/keywords/slicing","display_name":"Slicing","score":0.5179792642593384},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.5159950256347656},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.5013942718505859},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4906820058822632},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.4901503026485443},{"id":"https://openalex.org/keywords/mutation-testing","display_name":"Mutation testing","score":0.46393659710884094},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.4340510368347168},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43191033601760864},{"id":"https://openalex.org/keywords/mutation","display_name":"Mutation","score":0.4291936159133911},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.4266390800476074},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.4128398895263672},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.41064804792404175},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.40188631415367126},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.40001899003982544},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.32626640796661377},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.3064587712287903},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2658512592315674},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.2503838539123535},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.20816731452941895},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16963636875152588},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11799672245979309}],"concepts":[{"id":"https://openalex.org/C91071405","wikidata":"https://www.wikidata.org/wiki/Q1413145","display_name":"Program slicing","level":3,"score":0.8762486577033997},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7501413226127625},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6947299838066101},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.581451416015625},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.534899115562439},{"id":"https://openalex.org/C2776190703","wikidata":"https://www.wikidata.org/wiki/Q488148","display_name":"Slicing","level":2,"score":0.5179792642593384},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.5159950256347656},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.5013942718505859},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4906820058822632},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.4901503026485443},{"id":"https://openalex.org/C163565370","wikidata":"https://www.wikidata.org/wiki/Q4308623","display_name":"Mutation testing","level":4,"score":0.46393659710884094},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.4340510368347168},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43191033601760864},{"id":"https://openalex.org/C501734568","wikidata":"https://www.wikidata.org/wiki/Q42918","display_name":"Mutation","level":3,"score":0.4291936159133911},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.4266390800476074},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.4128398895263672},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.41064804792404175},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.40188631415367126},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.40001899003982544},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.32626640796661377},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.3064587712287903},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2658512592315674},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.2503838539123535},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.20816731452941895},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16963636875152588},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11799672245979309},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11219-005-6214-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11219-005-6214-x","pdf_url":null,"source":{"id":"https://openalex.org/S7504070","display_name":"Software Quality Journal","issn_l":"0963-9314","issn":["0963-9314","1573-1367"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Software Quality Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","score":0.4099999964237213,"display_name":"Partnerships for the goals"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W53653091","https://openalex.org/W150374354","https://openalex.org/W163636822","https://openalex.org/W303139982","https://openalex.org/W1526416044","https://openalex.org/W1527392356","https://openalex.org/W1964060567","https://openalex.org/W1966145429","https://openalex.org/W1974858479","https://openalex.org/W1975807602","https://openalex.org/W1998440693","https://openalex.org/W2005835674","https://openalex.org/W2027320771","https://openalex.org/W2049695835","https://openalex.org/W2056038097","https://openalex.org/W2057992103","https://openalex.org/W2063001732","https://openalex.org/W2064625489","https://openalex.org/W2088140535","https://openalex.org/W2092239677","https://openalex.org/W2092483417","https://openalex.org/W2101609988","https://openalex.org/W2108557864","https://openalex.org/W2110066339","https://openalex.org/W2112025128","https://openalex.org/W2112537911","https://openalex.org/W2120552859","https://openalex.org/W2121213139","https://openalex.org/W2124228276","https://openalex.org/W2126723155","https://openalex.org/W2127851059","https://openalex.org/W2140963262","https://openalex.org/W2141109493","https://openalex.org/W2147088720","https://openalex.org/W2147140044","https://openalex.org/W2157755550","https://openalex.org/W2162046779","https://openalex.org/W2162310108","https://openalex.org/W2168028877","https://openalex.org/W2293624369","https://openalex.org/W2914201442","https://openalex.org/W3010856131","https://openalex.org/W4238847937","https://openalex.org/W4240343303","https://openalex.org/W4241211222"],"related_works":["https://openalex.org/W1542826186","https://openalex.org/W2141501487","https://openalex.org/W2348519857","https://openalex.org/W2042229417","https://openalex.org/W1966410431","https://openalex.org/W2107296284","https://openalex.org/W1996517887","https://openalex.org/W3023029839","https://openalex.org/W2182909433","https://openalex.org/W1999069798"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}