{"id":"https://openalex.org/W3093279149","doi":"https://doi.org/10.1007/s11042-020-09915-1","title":"Deep Segmenter system for recognition of micro cracks in solar cell","display_name":"Deep Segmenter system for recognition of micro cracks in solar cell","publication_year":2020,"publication_date":"2020-10-17","ids":{"openalex":"https://openalex.org/W3093279149","doi":"https://doi.org/10.1007/s11042-020-09915-1","mag":"3093279149"},"language":"en","primary_location":{"id":"doi:10.1007/s11042-020-09915-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11042-020-09915-1","pdf_url":null,"source":{"id":"https://openalex.org/S110206669","display_name":"Multimedia Tools and Applications","issn_l":"1380-7501","issn":["1380-7501","1573-7721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Multimedia Tools and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091658934","display_name":"Om Dev Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I55124831","display_name":"J.C. Bose University of Science & Technology, YMCA","ror":"https://ror.org/014jqnm52","country_code":"IN","type":"education","lineage":["https://openalex.org/I55124831"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Om Dev Singh","raw_affiliation_strings":["J.C. Bose University of Science and Technology, YMCA, Faridabad, India"],"affiliations":[{"raw_affiliation_string":"J.C. Bose University of Science and Technology, YMCA, Faridabad, India","institution_ids":["https://openalex.org/I55124831"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005097447","display_name":"Anjali Malik","orcid":"https://orcid.org/0009-0006-9598-3522"},"institutions":[{"id":"https://openalex.org/I55124831","display_name":"J.C. Bose University of Science & Technology, YMCA","ror":"https://ror.org/014jqnm52","country_code":"IN","type":"education","lineage":["https://openalex.org/I55124831"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anjali Malik","raw_affiliation_strings":["J.C. Bose University of Science and Technology, YMCA, Faridabad, India"],"affiliations":[{"raw_affiliation_string":"J.C. Bose University of Science and Technology, YMCA, Faridabad, India","institution_ids":["https://openalex.org/I55124831"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032980157","display_name":"Vishakha Yadav","orcid":"https://orcid.org/0000-0001-6375-5361"},"institutions":[{"id":"https://openalex.org/I55124831","display_name":"J.C. Bose University of Science & Technology, YMCA","ror":"https://ror.org/014jqnm52","country_code":"IN","type":"education","lineage":["https://openalex.org/I55124831"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vishakha Yadav","raw_affiliation_strings":["J.C. Bose University of Science and Technology, YMCA, Faridabad, India"],"affiliations":[{"raw_affiliation_string":"J.C. Bose University of Science and Technology, YMCA, Faridabad, India","institution_ids":["https://openalex.org/I55124831"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100902117","display_name":"Shailender Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I55124831","display_name":"J.C. Bose University of Science & Technology, YMCA","ror":"https://ror.org/014jqnm52","country_code":"IN","type":"education","lineage":["https://openalex.org/I55124831"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shailender Gupta","raw_affiliation_strings":["J.C. Bose University of Science and Technology, YMCA, Faridabad, India"],"affiliations":[{"raw_affiliation_string":"J.C. Bose University of Science and Technology, YMCA, Faridabad, India","institution_ids":["https://openalex.org/I55124831"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091517700","display_name":"Shirin Dora","orcid":"https://orcid.org/0000-0001-6182-4124"},"institutions":[{"id":"https://openalex.org/I138801177","display_name":"University of Ulster","ror":"https://ror.org/01yp9g959","country_code":"GB","type":"education","lineage":["https://openalex.org/I138801177"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Shirin Dora","raw_affiliation_strings":["MS, Intelligent Systems Research Center, Ulster University (Magee Campus), Londonderry, UK"],"affiliations":[{"raw_affiliation_string":"MS, Intelligent Systems Research Center, Ulster University (Magee Campus), Londonderry, UK","institution_ids":["https://openalex.org/I138801177"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5091658934"],"corresponding_institution_ids":["https://openalex.org/I55124831"],"apc_list":null,"apc_paid":null,"fwci":0.721,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.77737539,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"80","issue":"5","first_page":"6509","last_page":"6533"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7722176313400269},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.687555193901062},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6006731986999512},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.591160237789154},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.5504976511001587},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5262032151222229},{"id":"https://openalex.org/keywords/categorization","display_name":"Categorization","score":0.4401790201663971},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4277323782444},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.4154796004295349},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.38940978050231934},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3554824888706207},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1420847475528717}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7722176313400269},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.687555193901062},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6006731986999512},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.591160237789154},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.5504976511001587},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5262032151222229},{"id":"https://openalex.org/C94124525","wikidata":"https://www.wikidata.org/wiki/Q912550","display_name":"Categorization","level":2,"score":0.4401790201663971},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4277323782444},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.4154796004295349},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.38940978050231934},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3554824888706207},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1420847475528717},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11042-020-09915-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11042-020-09915-1","pdf_url":null,"source":{"id":"https://openalex.org/S110206669","display_name":"Multimedia Tools and Applications","issn_l":"1380-7501","issn":["1380-7501","1573-7721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Multimedia Tools and Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W845365781","https://openalex.org/W1665214252","https://openalex.org/W1964573040","https://openalex.org/W2005603577","https://openalex.org/W2032708514","https://openalex.org/W2054122393","https://openalex.org/W2071905184","https://openalex.org/W2076387959","https://openalex.org/W2091969676","https://openalex.org/W2097221445","https://openalex.org/W2102328597","https://openalex.org/W2106238010","https://openalex.org/W2114867528","https://openalex.org/W2144801789","https://openalex.org/W2158265964","https://openalex.org/W2160408749","https://openalex.org/W2171407258","https://openalex.org/W2539991656","https://openalex.org/W2549620935","https://openalex.org/W2578756457","https://openalex.org/W2809254203","https://openalex.org/W2810004461","https://openalex.org/W2825063406","https://openalex.org/W2883592834","https://openalex.org/W2905163589","https://openalex.org/W2912350898","https://openalex.org/W2914238709","https://openalex.org/W2942900320","https://openalex.org/W2949117887","https://openalex.org/W2962835968","https://openalex.org/W2979496633","https://openalex.org/W2986213148","https://openalex.org/W3012756106","https://openalex.org/W3040786507","https://openalex.org/W6833262898"],"related_works":["https://openalex.org/W2165912799","https://openalex.org/W2735662278","https://openalex.org/W2953058328","https://openalex.org/W2382615723","https://openalex.org/W4311804456","https://openalex.org/W1987484445","https://openalex.org/W2623658258","https://openalex.org/W2143413548","https://openalex.org/W1969219540","https://openalex.org/W1542224353"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}