{"id":"https://openalex.org/W4406247228","doi":"https://doi.org/10.1007/s10845-024-02557-2","title":"Switch ON/OFF learning of one-dimensional convolutional neural network and one-dimensional generative adversarial network for fault detection","display_name":"Switch ON/OFF learning of one-dimensional convolutional neural network and one-dimensional generative adversarial network for fault detection","publication_year":2025,"publication_date":"2025-01-10","ids":{"openalex":"https://openalex.org/W4406247228","doi":"https://doi.org/10.1007/s10845-024-02557-2"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-024-02557-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-024-02557-2","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038575120","display_name":"Seunghwan Song","orcid":"https://orcid.org/0000-0002-2497-3785"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seunghwan Song","raw_affiliation_strings":["Department of Industrial and Management Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-2497-3785","affiliations":[{"raw_affiliation_string":"Department of Industrial and Management Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079106943","display_name":"Kyuchang Chang","orcid":"https://orcid.org/0000-0003-1928-9417"},"institutions":[{"id":"https://openalex.org/I83202590","display_name":"Jeju National University","ror":"https://ror.org/05hnb4n85","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyuchang Chang","raw_affiliation_strings":["Department of Artificial Intelligence, College of Software, Jeju National University, 102 Jejudaehak-roo, Jeju-si, 63243, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Artificial Intelligence, College of Software, Jeju National University, 102 Jejudaehak-roo, Jeju-si, 63243, Republic of Korea","institution_ids":["https://openalex.org/I83202590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061146840","display_name":"Cheolsoon Park","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Cheolsoon Park","raw_affiliation_strings":["Department of Industrial and Management Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Management Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021164528","display_name":"Jun\u2010Geol Baek","orcid":"https://orcid.org/0000-0002-7088-1478"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jun-Geol Baek","raw_affiliation_strings":["Department of Industrial and Management Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-7088-1478","affiliations":[{"raw_affiliation_string":"Department of Industrial and Management Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021164528"],"corresponding_institution_ids":["https://openalex.org/I197347611"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":2.9063,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.89662122,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"37","issue":"1","first_page":"525","last_page":"547"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6836493015289307},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.647290825843811},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6121692657470703},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5896332859992981},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5756788849830627},{"id":"https://openalex.org/keywords/constant-false-alarm-rate","display_name":"Constant false alarm rate","score":0.5541570782661438},{"id":"https://openalex.org/keywords/interlock","display_name":"Interlock","score":0.5336352586746216},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5137401819229126},{"id":"https://openalex.org/keywords/false-alarm","display_name":"False alarm","score":0.4822305142879486},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.47135061025619507},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4700654447078705},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.45321977138519287},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4360511302947998},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4324411451816559},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4261653423309326},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.37069112062454224},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32263851165771484}],"concepts":[{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6836493015289307},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.647290825843811},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6121692657470703},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5896332859992981},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5756788849830627},{"id":"https://openalex.org/C77052588","wikidata":"https://www.wikidata.org/wiki/Q644307","display_name":"Constant false alarm rate","level":2,"score":0.5541570782661438},{"id":"https://openalex.org/C99535591","wikidata":"https://www.wikidata.org/wiki/Q1817095","display_name":"Interlock","level":2,"score":0.5336352586746216},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5137401819229126},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.4822305142879486},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.47135061025619507},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4700654447078705},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.45321977138519287},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4360511302947998},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4324411451816559},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4261653423309326},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.37069112062454224},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32263851165771484},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-024-02557-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-024-02557-2","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1926327637","display_name":null,"funder_award_id":"BK\u201021FOUR","funder_id":"https://openalex.org/F4320321408","funder_display_name":"Ministry of Education"},{"id":"https://openalex.org/G2935672843","display_name":null,"funder_award_id":"(IO201210-07929-01)","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"},{"id":"https://openalex.org/G916620320","display_name":null,"funder_award_id":"NRF- 2022R1A2C2004457","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320321408","display_name":"Ministry of Education","ror":"https://ror.org/01p262204"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W1512798931","https://openalex.org/W1857733014","https://openalex.org/W1975904493","https://openalex.org/W1996125472","https://openalex.org/W2099454382","https://openalex.org/W2108598243","https://openalex.org/W2148143831","https://openalex.org/W2342249984","https://openalex.org/W2593414223","https://openalex.org/W2766296277","https://openalex.org/W2945057656","https://openalex.org/W2947464817","https://openalex.org/W2955893982","https://openalex.org/W2962770929","https://openalex.org/W2963981733","https://openalex.org/W2964057425","https://openalex.org/W2964154860","https://openalex.org/W2970971581","https://openalex.org/W3009763662","https://openalex.org/W3027507763","https://openalex.org/W3040508529","https://openalex.org/W3082317190","https://openalex.org/W3090586341","https://openalex.org/W3100777112","https://openalex.org/W3162102340","https://openalex.org/W3167793354","https://openalex.org/W3171622190","https://openalex.org/W3173310499","https://openalex.org/W3174788865","https://openalex.org/W3176594000","https://openalex.org/W3204263062","https://openalex.org/W3208955241","https://openalex.org/W4205893379","https://openalex.org/W4210627858","https://openalex.org/W4213046208","https://openalex.org/W4220992948","https://openalex.org/W4225014918","https://openalex.org/W4242021012","https://openalex.org/W4281556497","https://openalex.org/W4288070332","https://openalex.org/W4308499722","https://openalex.org/W4313421210","https://openalex.org/W4313479596","https://openalex.org/W4320036691","https://openalex.org/W4322503729","https://openalex.org/W4323546132","https://openalex.org/W4379662085","https://openalex.org/W4381741414","https://openalex.org/W4394669348","https://openalex.org/W4394670483","https://openalex.org/W4396773505","https://openalex.org/W4400390736","https://openalex.org/W6675354045","https://openalex.org/W6735913928","https://openalex.org/W6767782324"],"related_works":["https://openalex.org/W1497007238","https://openalex.org/W2789353574","https://openalex.org/W1983393909","https://openalex.org/W2774527540","https://openalex.org/W2040150569","https://openalex.org/W2468095590","https://openalex.org/W2132174924","https://openalex.org/W1911540634","https://openalex.org/W2013909972","https://openalex.org/W1969801928"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}