{"id":"https://openalex.org/W4400725573","doi":"https://doi.org/10.1007/s10845-024-02466-4","title":"Correction: Detecting and classifying hidden defects in additively manufactured parts using deep learning and X-ray computed tomography","display_name":"Correction: Detecting and classifying hidden defects in additively manufactured parts using deep learning and X-ray computed tomography","publication_year":2024,"publication_date":"2024-07-17","ids":{"openalex":"https://openalex.org/W4400725573","doi":"https://doi.org/10.1007/s10845-024-02466-4"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-024-02466-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-024-02466-4","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"erratum","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028995471","display_name":"Miles V. Bimrose","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miles V. Bimrose","raw_affiliation_strings":["Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109722387","display_name":"Tianxiang Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210158570","display_name":"Zhejiang University-University of Edinburgh Institute","ror":"https://ror.org/04jth1r26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210158570","https://openalex.org/I76130692","https://openalex.org/I98677209"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianxiang Hu","raw_affiliation_strings":["ZJU-UIUC Institute, Zhejiang University, Haining, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ZJU-UIUC Institute, Zhejiang University, Haining, Zhejiang, China","institution_ids":["https://openalex.org/I4210158570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019836971","display_name":"Davis J. McGregor","orcid":"https://orcid.org/0000-0001-6857-8528"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Davis J. McGregor","raw_affiliation_strings":["Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113227779","display_name":"Jiongxin Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210158570","display_name":"Zhejiang University-University of Edinburgh Institute","ror":"https://ror.org/04jth1r26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210158570","https://openalex.org/I76130692","https://openalex.org/I98677209"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiongxin Wang","raw_affiliation_strings":["ZJU-UIUC Institute, Zhejiang University, Haining, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ZJU-UIUC Institute, Zhejiang University, Haining, Zhejiang, China","institution_ids":["https://openalex.org/I4210158570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036247243","display_name":"Sameh Tawfick","orcid":"https://orcid.org/0000-0003-3645-527X"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sameh Tawfick","raw_affiliation_strings":["Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059084183","display_name":"Chenhui Shao","orcid":"https://orcid.org/0000-0002-3299-2222"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chenhui Shao","raw_affiliation_strings":["Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024343415","display_name":"Zuozhu Liu","orcid":"https://orcid.org/0000-0002-7816-502X"},"institutions":[{"id":"https://openalex.org/I4210158570","display_name":"Zhejiang University-University of Edinburgh Institute","ror":"https://ror.org/04jth1r26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210158570","https://openalex.org/I76130692","https://openalex.org/I98677209"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zuozhu Liu","raw_affiliation_strings":["ZJU-UIUC Institute, Zhejiang University, Haining, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ZJU-UIUC Institute, Zhejiang University, Haining, Zhejiang, China","institution_ids":["https://openalex.org/I4210158570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065601087","display_name":"William P. King","orcid":"https://orcid.org/0000-0001-8606-1290"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William P. King","raw_affiliation_strings":["Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA"],"raw_orcid":"https://orcid.org/0000-0001-8606-1290","affiliations":[{"raw_affiliation_string":"Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"36","issue":"5","first_page":"3481","last_page":"3481"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.9383000135421753,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.9383000135421753,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9276000261306763,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computed-tomography","display_name":"Computed tomography","score":0.5714305639266968},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5352092385292053},{"id":"https://openalex.org/keywords/x-ray","display_name":"X-ray","score":0.5080580711364746},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4768889248371124},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41271740198135376},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35830482840538025},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3436318635940552},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.32786354422569275},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17769074440002441},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15787935256958008},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.13516327738761902},{"id":"https://openalex.org/keywords/radiology","display_name":"Radiology","score":0.10219749808311462}],"concepts":[{"id":"https://openalex.org/C544519230","wikidata":"https://www.wikidata.org/wiki/Q32566","display_name":"Computed tomography","level":2,"score":0.5714305639266968},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5352092385292053},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.5080580711364746},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4768889248371124},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41271740198135376},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35830482840538025},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3436318635940552},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.32786354422569275},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17769074440002441},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15787935256958008},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.13516327738761902},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.10219749808311462}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10845-024-02466-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-024-02466-4","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:36:y:2025:i:5:d:10.1007_s10845-024-02466-4","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-024-02466-4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Quality Education","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W3215138031","https://openalex.org/W3009238340","https://openalex.org/W4321369474","https://openalex.org/W4360585206","https://openalex.org/W4285208911","https://openalex.org/W3082895349","https://openalex.org/W4213079790","https://openalex.org/W2248239756","https://openalex.org/W4323565446"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}