{"id":"https://openalex.org/W4400401799","doi":"https://doi.org/10.1007/s10845-024-02448-6","title":"Two-phase cost-sensitive-learning-based framework on customer-side quality inspection for TFT-LCD industry","display_name":"Two-phase cost-sensitive-learning-based framework on customer-side quality inspection for TFT-LCD industry","publication_year":2024,"publication_date":"2024-07-07","ids":{"openalex":"https://openalex.org/W4400401799","doi":"https://doi.org/10.1007/s10845-024-02448-6"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-024-02448-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-024-02448-6","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114215730","display_name":"Ming-Sung Shih","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Sung Shih","raw_affiliation_strings":["International Intercollegiate Ph.D. Program, National Tsing Hua University, Hsinchu, 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"International Intercollegiate Ph.D. Program, National Tsing Hua University, Hsinchu, 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033695556","display_name":"James C. Chen","orcid":"https://orcid.org/0000-0002-2629-1139"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"James C. Chen","raw_affiliation_strings":["Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074583144","display_name":"Tzu\u2010Li Chen","orcid":"https://orcid.org/0000-0003-2025-8853"},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Tzu-Li Chen","raw_affiliation_strings":["Graduate Institute of Intelligent Manufacturing Technology, National Taiwan University of Science and Technology, Taipei, 106335, Taiwan"],"affiliations":[{"raw_affiliation_string":"Graduate Institute of Intelligent Manufacturing Technology, National Taiwan University of Science and Technology, Taipei, 106335, Taiwan","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110127655","display_name":"Ching-Lan Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Lan Hsu","raw_affiliation_strings":["Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5074583144"],"corresponding_institution_ids":["https://openalex.org/I154864474"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7227,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.7324421,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"36","issue":"6","first_page":"4251","last_page":"4267"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9805999994277954,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6022052764892578},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5687835216522217},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.5589851140975952},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.5165058970451355},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.47044625878334045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43578147888183594},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.40724408626556396},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.40155166387557983},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27957776188850403},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1460869014263153},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.05732974410057068}],"concepts":[{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6022052764892578},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5687835216522217},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5589851140975952},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.5165058970451355},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.47044625878334045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43578147888183594},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.40724408626556396},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.40155166387557983},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27957776188850403},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1460869014263153},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.05732974410057068},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-024-02448-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-024-02448-6","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W405632","https://openalex.org/W1966748751","https://openalex.org/W1969367028","https://openalex.org/W1976193075","https://openalex.org/W1986515506","https://openalex.org/W1992061061","https://openalex.org/W2083327406","https://openalex.org/W2099454382","https://openalex.org/W2104933073","https://openalex.org/W2125927049","https://openalex.org/W2132791018","https://openalex.org/W2142955084","https://openalex.org/W2148143831","https://openalex.org/W2155653793","https://openalex.org/W2317221319","https://openalex.org/W2768348081","https://openalex.org/W2771605104","https://openalex.org/W2789983388","https://openalex.org/W2883525675","https://openalex.org/W2940568479","https://openalex.org/W2947779129","https://openalex.org/W2949676527","https://openalex.org/W2963596856","https://openalex.org/W3000555836","https://openalex.org/W3009384997","https://openalex.org/W3017206470","https://openalex.org/W3024905798","https://openalex.org/W3034143844","https://openalex.org/W3035102496","https://openalex.org/W3151361239","https://openalex.org/W4247993926","https://openalex.org/W4281784047","https://openalex.org/W4319075633","https://openalex.org/W4365421262","https://openalex.org/W4366245308","https://openalex.org/W4388328494","https://openalex.org/W4389636579","https://openalex.org/W6606837198","https://openalex.org/W6606879723"],"related_works":["https://openalex.org/W1976630228","https://openalex.org/W2168051707","https://openalex.org/W2141796872","https://openalex.org/W1995584621","https://openalex.org/W2083881355","https://openalex.org/W1968703405","https://openalex.org/W2353338342","https://openalex.org/W2036852092","https://openalex.org/W2349084057","https://openalex.org/W2102089219"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-01-25T23:04:38.658462","created_date":"2025-10-10T00:00:00"}